Patent Assignment
Reel/Frame 046530/0323
Assignment of Assignor's Interest
Recorded: 2018-08-01
Pages: 6
Assignor
ZETA INSTRUMENTS, INC.
Executed: 2018-08-01
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties
(33)
3D Microscope and Methods of Measuring Patterned Substrates
PCT:
PCT/US2011/044045 ↗
3D Microscope Including Insertable Components to Provide Multiple Imaging and Measurement Capabilities
PCT:
PCT/US2011/067044 ↗
Surface Inspection System
3-D Optical Microscope
Illuminator for a 3-D Optical Microscope
3-D Optical Microscope
3-D Optical Microscope
3D Microscope And Methods Of Measuring Patterned Substrates
Multi-Surface Optical 3D Microscope
3D Microscope Including Insertable Components to Provide Multiple Imaging and Measurement Capabilities
System And Method For Monitoring LED Chip Surface Roughening Process
Optical Inspector
Optical Inspector
Multi-Surface Optical Inspector
Patent:
8,830,457 →
Application:
13/861,378 →
Optical Inspector with Selective Scattered Radiation Blocker
Patent:
8,836,935 →
Application:
13/861,382 →
Multi-Surface Scattered Radiation Differentiation
Method and Apparatus to Optically Detect Defects in Transparent Solids
Multi-Surface Optical 3D Microscope
Multi-Surface Optical 3D Microscope
3D Microscope and Methods of Measuring Patterned Substrates
3D Microscope And Methods Of Measuring Patterned Substrates
Application:
15/150,411 →
Publication:
US 2016/0252714
Method of Detecting Defect Location Using Multi-Surface Specular Reflection
Multi-Surface Specular Reflection Inspector
Dual Mode Inspector
Automated 3-D Measurement
Application:
15/233,812 →
Publication:
US 2018/0045937
Optical Measurement of Opening Dimensions in a Wafer
Optical Measurement of Step Size and Plated Metal Thickness
Optical Measurement of Bump Hieght
Method and Apparatus to Detect Defects in Transparent Solids
3D Microscope And Methods Of Measuring Patterned Substrates
Application:
61/367,352 →
Multi-Surface Optical 3D Microscope
Application:
61/378,794 →
3D Imaging And Metrology System
Application:
61/430,937 →
System And Method Of Monitoring LED Chip Surface Roughening Process
Application:
61/501,696 →
Related Assignments
(16)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 12, 2010
From: XU, JAMES JIANGUO; LEE, KEN KINSUN
To: ZETA INSTRUMENTS, INC.
Reel/Frame 024220/0095 →
Assignment of Assignor's Interest
Dec 15, 2010
From: XU, JAMES J.; LEE, KEN K.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 025507/0956 →
Assignment of Assignor's Interest
Jan 26, 2011
From: XU, JAMES J.; LEE, KEN K.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 025701/0429 →
Assignment of Assignor's Interest
Jun 29, 2011
From: HOU, ZHEN; XU, JAMES JIANGUO; LEE, KEN KINSUN; STAINTON, JAMES NELSON
To: ZETA INSTRUMENTS, INC.
Reel/Frame 026524/0238 →
Assignment of Assignor's Interest
Aug 29, 2011
From: LEE, KEN KINSUN; SOETARMAN, RONNY; HOU, ZHEN; XU, JAMES JIANGUO
To: ZETA INSTRUMENTS, INC.
Reel/Frame 026824/0542 →
Assignment of Assignor's Interest
Dec 21, 2011
From: XU, JAMES JIANGUO; LEE, KEN KINSUN; KUDINAR, RUSMIN; SOETARMAN, RONNY
To: ZETA INSTRUMENTS, INC.
Reel/Frame 027430/0148 →
Assignment of Assignor's Interest
Jun 12, 2012
From: XU, JAMES JIANGUO; LEE, KEN KINSUN; KUDINAR, RUSMIN; SOETARMAN, RONNY
To: ZETA INSTRUMENTS, INC.
Reel/Frame 028363/0877 →
Assignment of Assignor's Interest
Feb 1, 2013
From: MEEKS, STEVEN W.; KUDINAR, RUSMIN; NGUYEN, HUNG P.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 029741/0096 →
Assignment of Assignor's Interest
Feb 1, 2013
From: MEEKS, STEVEN W.; KUDINAR, RUSMIN; NGUYEN, HUNG P.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 029740/0863 →
Assignment of Assignor's Interest
Apr 12, 2013
From: MEEKS, STEVEN W.; KUDINAR, RUSMIN; NGUYEN, HUNG P.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 030201/0538 →
Assignment of Assignor's Interest
Apr 12, 2013
From: MEEKS, STEVEN W.; KUDINAR, RUSMIN; NGUYEN, HUNG P.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 030201/0528 →
Assignment of Assignor's Interest
Apr 12, 2013
From: MEEKS, STEVEN W.; KUDINAR, RUSMIN; NGUYEN, HUNG P.
To: ZETA INSTRUMENTS, INC.
Reel/Frame 030201/0540 →
Assignment of Assignor's Interest
Jul 31, 2014
From: MEEKS, STEVEN W.; SOETARMAN, RONNY
To: ZETA INSTRUMENTS, INC.
Reel/Frame 033440/0196 →
Assignment of Assignor's Interest
Apr 27, 2015
From: LEE, KEN KINSUN; SOETARMAN, RONNY; HOU, ZHEN; XU, JAMES JIANGUO
To: ZETA INSTRUMENTS, INC.
Reel/Frame 035508/0285 →
Assignment of Assignor's Interest
Apr 27, 2015
From: LEE, KEN KINSUN; SOETARMAN, RONNY; HOU, ZHEN; XU, JAMES JIANGUO
To: ZETA INSTRUMENTS, INC.
Reel/Frame 035508/0199 →
Assignment of Assignor's Interest
Aug 9, 2018
From: ZETA INSTRUMENTS, INC.
To: KLA-TENCOR CORPORATION
Reel/Frame 046608/0666 →