Methods for calibrating a read data path for a memory interface
View Patent ↗A method for calibrating a read data path for a DDR memory interface circuit from time to time in conjunction with functional operation of a memory circuit is described. The method uses the steps of issuing a sequence of read commands so that a delayed dqs signal toggles continuously. Next, delaying a core clock signal originating within the DDR memory interface circuit to produce a capture clock signal. The capture clock signal is delayed from the core clock by a capture clock delay value. Next, determining an optimum capture clock delay value. The output of the read data path is clocked by the core clock. The timing for the read data path with respect to data propagation is responsive to at least the capture clock.
1. A method for calibrating a read data path for a DDR memory interface circuit from time to time in conjunction with functional operation of a memory circuit comprising the steps of:
issuing a sequence of read commands so that a delayed dqs signal toggles continuously;
delaying a core clock signal originating within the DDR memory interface circuit to produce a capture clock signal, wherein the capture clock signal is delayed from the core clock by a capture clock delay value;
determining an optimum capture clock delay value;
wherein the output of the read data path is clocked by the core clock; and
wherein timing for the read data path with respect to data propagation is responsive to at least the capture clock.
2. The method of claim 1 , further comprising:
delaying the core clock signal to sample the delayed dqs signal at different delay increments until a 1 to 0 transition is detected on the delayed dqs signal, whereby this core clock delay is recorded as A;
delaying the core clock signal to sample the core clock signal at different delay increments until a 0 to 1 transition is detected on the core clock signal, whereby this core clock delay is recorded as B; and
computing an optimum delay value.
3. The method of claim 2 wherein the delayed dqs signal is continuously sampled in a flip-flop wherein said flip-flop is clocked by a delay element that delays the core clock signal.
4. The method of claim 2 wherein the optimum delay value is determined by comparing the value of A with the value of B.
5. The method of claim 4 wherein the optimum delay value is set to the average of A and B if A subtracted from B is greater than A; otherwise the optimum delay value is set to half of A.
6. The method of claim 5 wherein said average and half value is computed to within a closest delay line increment.
7. The method of claim 1 , wherein the method is performed independently and in parallel for each of a plurality of byte lanes.
8. A method for calibrating a DDR memory interface circuit from time to time in conjunction with functional operation of a DDR memory circuit including determining optimum latency compensation, comprising the steps of:
setting a delay for a core clock signal to a value that produces an optimum capture clock signal, wherein the core clock signal originates within the DDR memory interface circuit;
controlling timing for a read data path within the memory interface circuit in response to the capture clock signal;
reading a known data pattern by way of the read data path;
iteratively capturing read data by way of the read data path at different latency compensation values;
when the captured read data matches an expected data value at a specific latency compensation value, recording the specific latency compensation value as an optimum latency compensation value; and
programming control settings within the DDR memory interface circuit consistent with the optimum latency compensation value.
9. The method of claim 8 wherein determining the optimum latency compensation value further comprises:
operating data paths through flip-flops controlled at least in part by counters, the flip flops in turn feeding data comparators.
10. The method of claim 9 , wherein the data comparators compare delayed read data with an expected data value.
11. The method of claim 10 , wherein the expected data value is stored within a host device containing the DDR memory interface circuit.
12. The method of claim 8 , wherein iteratively capturing read data at different latency compensation values, comprises altering latency from a minimum to a maximum latency compensation value.
13. The method of claim 8 , wherein the method is performed independently and in parallel for each of a plurality of byte lanes.
14. A method for calibrating a DDR memory interface circuit from time to time in conjunction with operation of a memory circuit, comprising the steps of:
issuing a sequence of read commands so that a delayed dqs signal toggles continuously;
delaying a core clock signal using a core clock delay element, and using the delayed core clock signal to sample the delayed dqs signal at different core clock delay increments while recording a number of delay increments corresponding to each of a plurality of transitions on the sampled delayed dqs signal; and
computing an optimum delay value for the core clock delay element to produce an optimum capture clock signal;
utilizing the capture clock signal for controlling timing for a read data path within the memory interface circuit, wherein read data from the memory circuit is captured within the memory interface circuit.
15. The method of claim 14 wherein an output of the read data path is clocked by the core clock.
16. The method of claim 14 , further comprising:
delaying the core clock signal to sample the delayed dqs signal at different delay increments until a 1 to 0 transition is detected on the delayed dqs signal, whereby this core clock delay is recorded as “A”;
delaying the core clock signal to sample the core clock signal at different delay increments until a 0 to 1 transition is detected on the core clock signal, whereby this core clock delay is recorded as “B”; and
computing, as a function of “A” and “B”, an optimum delay value for the core clock delay element to produce an optimum capture clock signal.
17. The method of claim 14 , wherein the method is performed independently and in parallel for each of a plurality of byte lanes.
18. The method of claim 16 , wherein the method is performed independently and in parallel for each of a plurality of byte lanes.
19. A method for controlling a read data path within a DDR memory interface circuit comprising the steps of:
delaying a core clock signal originating within the DDR memory interface circuit to produce a capture clock signal, wherein the capture clock signal is delayed from the core clock by a capture clock delay value that is optimized during a calibration procedure performed from time to time;
clocking the output of the read data path utilizing the core clock; and
wherein timing for the read data path is responsive to at least the capture clock signal.
20. The method of claim 19 , wherein the method is performed independently and in parallel for each of a plurality of byte lanes.