Method and apparatus for adjustment of current through a magnetoresistive tunnel junction (MTJ) based on temperature fluctuations
View Patent ↗A non-volatile memory system includes a first circuit and a second circuit both coupled to a magnetoresistance tunnel junction (MTJ) cell to substantially reduce the level of current flowing through the MTJ with rise in temperature, as experienced by the MTJ. The first circuit is operable to adjust a slope of a curve representing current as a function of temperature and the second circuit is operable to adjust a value of the current level through the MTJ to maintain current constant or to reduce current when the temperature increases. This way sufficient current is provided for the MTJ at different temperatures, to prevent write failure, over programming, MTJ damage and waste of current.
1. A circuit comprising:
a first device operable to measure a temperature of an MTJ;
a second device coupled to the first device and operable to generate a write current according to the temperature of the MTJ, the write current being used to program the MTJ,
wherein the first device is a diode circuit located on a chip onto which the MTJ is formed.
2. The circuit of claim 1 , wherein the second device is a current source controlled by the first device.
3. The circuit of claim 2 , wherein the current source is operable to determine a slope defined by a change in the write current through the MTJ versus a change in the temperature of the MTJ, the current source further operable to use the slope to adjust the write current.
4. The circuit of claim 2 , wherein the current source is operable to measure a change in a level of the write current and to adjust the write current accordingly.
5. The circuit of claim 1 , wherein the second device is a current generator.
6. A circuit comprising:
a first device operable to measure a temperature of an MTJ;
a second device coupled to the first device and operable to generate a write current according to the temperature of the MTJ, the write current being used to program the MTJ,
wherein the first device is a temperature sensitive resistor located on a chip onto which the MTJ is formed.
7. The circuit of claim 6 , wherein the second device is a current generator.
8. The circuit of claim 6 , wherein the second device is a current source controlled by the first device.
9. The circuit of claim 8 , wherein the current source is operable to measure a change in a level of the write current and to adjust the write current accordingly.
10. A circuit comprising:
a first device operable to measure a temperature of an MTJ;
a second device coupled to the first device and operable to generate a write current according to the temperature of the MTJ, the write current being used to program the MTJ,
wherein the second device is coupled to the MTJ, the first device is a temperature sensor located on a chip onto which the MTJ is formed and the circuit further includes an analog-to-digital converter.
11. The circuit of claim 10 , wherein the second device is a current generator.
12. The circuit of claim 10 , wherein the second device is a current source controlled by the first device.
13. The circuit of claim 12 , wherein the current source is operable to measure a change in a level of the write current and to adjust the write current accordingly.
14. A method of controlling current through an MTJ comprising:
measuring a voltage at a node between a resistor and a diode;
detecting a voltage change at the node, the voltage change being based on a change in temperature at the node;
upon detecting the voltage change, digitizing the voltage at the node;
converting the digitized voltage to a current; and
controlling an MTJ using the current,
wherein during a rise in temperature of the MTJ, the current through the MTJ is reduced accordingly.
15. The method of controlling current per claim 14 , wherein the current flows through the MTJ and wherein the controlling step includes controlling a level of the current through the MTJ using a switch circuit and a current mirror circuit.
16. The method of controlling current per claim 15 , wherein the controlling step further includes controlling a slope of a change in the current through the MTJ as a function of a change in the temperature.