IP Library › Granted Patent US 10,087,521
Granted Patent B2
US 10,087,521 · App. 14/970,015 · Granted Oct 2, 2018

Silicon-nitride-containing thermal chemical vapor deposition coating

Inventors: Min Yuan (State College, PA); James B. Mattzela (Port Matilda, PA); David A. Smith (Bellefonte, PA)
Assignee: SILCOTEK CORP.
C23C16/345C23C16/045C23C16/308C23C16/45523C23C16/45557C23C16/56
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Quick Facts
Patent No.
US 10,087,521
App. No.
14/970,015
Granted
Oct 2, 2018
Kind
B2
Abstract

Surfaces, articles, and processes having silicon-nitride-containing thermal chemical vapor deposition coating are disclosed. A process includes producing a silicon-nitride-containing thermal chemical vapor deposition coating on a surface within a chamber. Flow into and from the chamber is restricted or halted during the producing of the silicon-nitride-containing thermal chemical vapor deposition coating on the surface. A surface includes a silicon-nitride-containing thermal chemical vapor deposition coating. The surface has at least a concealed portion that is obstructed from view. An article includes a silicon-nitride-containing thermal chemical vapor deposition coating on a surface within a chamber. The surface has at least a concealed portion that is obstructed from view.

Claims (21)

1. A process, comprising:

producing a silicon-nitride-containing thermal chemical vapor deposition coating on a surface within a chamber;

wherein flow into and from the chamber is restricted or halted during the producing of the silicon-nitride-containing thermal chemical vapor deposition coating on the surface;

wherein the producing includes introducing trisilylamine to the chamber;

wherein the introducing of the trisilylamine includes opening a flow control device connected to a vessel containing the trisilylamine while the chamber is at a first pressure and closing the flow control device when the pressure within the chamber is at a second pressure, the first pressure differing from the second pressure.

2. The process of claim 1 , wherein the producing further includes introducing ammonia to the chamber concurrent with introducing of the trisilylamine.

3. The process of claim 1 , wherein the producing further includes introducing ammonia to the chamber prior to the introducing of the trisilylamine.

4. The process of claim 1 , wherein the producing further includes introducing ammonia to the chamber after the introducing of the trisilylamine.

5. The process of claim 1 , wherein the producing is at a temperature of at least 325° C.

6. The process of claim 1 , wherein the producing includes oxidizing, the oxidizing being at a temperature of at least 300° C.

7. The process of claim 1 , wherein the silicon-nitride-containing thermal chemical vapor deposition coating is pure or substantially pure silicon nitride.

8. The process of claim 1 , wherein the silicon-nitride-containing thermal chemical vapor deposition coating includes silicon oxynitride.

9. The process of claim 1 , wherein the silicon-nitride-containing thermal chemical vapor deposition coating is functionalized.

10. The process of claim 1 , further comprising producing an additional silicon-nitride-containing thermal chemical vapor deposition coating on the silicon-nitride-containing thermal chemical vapor deposition coating.

11. The process of claim 10 , wherein the additional silicon-nitride-containing thermal chemical vapor deposition coating has a first thickness and the silicon-nitride-containing thermal chemical vapor deposition coating has a second thickness, the first thickness differing from the second thickness.

12. The process of claim 1 , wherein the surface is a metal or metallic.

13. The surface produced by the process of claim 1 .

14. A process, comprising:

producing a silicon-nitride-containing thermal chemical vapor deposition coating on a surface within a chamber;

wherein flow into and from the chamber is restricted or halted during the producing of the silicon-nitride-containing thermal chemical vapor deposition coating on the surface;

wherein the surface has at least a concealed portion that is obstructed from view.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2015
From: YUAN, MIN; MATTZELA, JAMES B.; SMITH, DAVID A.
To: SILCOTEK CORP.
Reel/Frame 037331/0317 →
Continuity (1)
Related Publication 20170167015A1 · Jun 15, 2017
Cited By (3)
US 12,291,778 US 12,473,635 US 12,522,732