Circuit for dynamically adaptive bit-leveling by incremental sampling, jitter detection, and exception handling
View Patent ↗A circuit and method for implementing an adaptive bit-leveling function in an integrated circuit interface is disclosed. During a calibration operation, a pre-loaded data bit pattern is continuously sent from a sending device and is continuously read from an external bus by a receiving device. A programmable delay line both advances and delays each individual data bit relative to a sampling point in time, and delay counts relative to a reference point in time are recorded for different sampled data bit values, enabling a delay to be determined that best samples a data bit at its midpoint. During the advancing and delaying of a data bit, jitter on the data bit signal may cause an ambiguity in the determination of the midpoint, and solutions are disclosed for detecting jitter and for resolving a midpoint for sampling a data bit even in the presence of the jitter.
1. A bit-leveling circuit for performing bit-leveling for a data interface including operating first and second calibration processes, the circuit comprising at least:
a circuit for providing a data strobe signal;
a circuit for receiving a data bit signal, including a programmable delay line for delaying the received data bit signal to provide a delayed data bit signal;
at least one flip-flop for sampling the delayed data bit signal;
a bit-leveling controller circuit responsive to the sampled delayed data bit signal and for controlling the delay of the programmable delay line;
wherein the bit leveling circuit:
receives a known pattern of 1's and 0's on the data bit signal, and
strobes the delayed data bit signal with the data strobe signal to produce the sampled delayed data bit signal, wherein strobing the delayed data bit signal is synchronized with the known pattern of 1's and 0's;
wherein operation of the bit leveling circuit includes performing the first calibration process comprising:
incrementally increasing the delay line delay, until a value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at an initial delay line delay setting as value Ta;
incrementally decreasing the delay line delay, until a value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the initial delay line delay setting as value Tb; and
determining a sum of Ta and Tb;
wherein if the sum of Ta and Tb is less than a pre-determined jitter detection threshold value, the bit leveling circuit performs the second calibration process comprising:
setting the delay line delay to the initial setting value plus a jitter correction offset delay value to create a revised initial delay line delay setting;
from the revised initial delay line delay setting, incrementally increasing the delay line delay until a value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the revised initial delay line delay setting as value Ta;
from the revised initial delay line delay setting, incrementally decreasing the delay line delay until a value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the revised initial delay line delay setting as value Tb; and
as a function of Ta and Tb, adjusting the delay line setting to advance or delay the data bit signal, such that the delayed data bit signal is sampled at the midpoint of a half-cycle of the delayed data bit signal.
2. The circuit of claim 1 wherein the known pattern of 1's and 0's on the data bit signal comprises an alternating pattern of 1's and 0's.
3. The circuit of claim 1 , wherein operation of the bit leveling circuit further comprises:
comparing Ta and Tb, and wherein if Ta is greater than Tb, setting the delay line delay to a value equal to the initial delay line delay with an addition of an averaging factor wherein the averaging factor is (Ta−Tb)/2.
4. The circuit of claim 1 , wherein operation of the bit leveling circuit further comprises:
comparing Ta and Tb, and wherein if Ta is less than Tb, setting the delay line delay to a value equal to the initial delay line delay decremented by an averaging factor wherein the averaging factor is (Tb−Ta)/2.
5. The circuit of claim 1 wherein incrementally increasing and decreasing the delay line delay comprises changing the delay line delay by time increments that are each less than a period of the known pattern of 1's and 0's.
6. A bit-leveling circuit for performing bit-leveling for a data interface including operating at least first and second calibration processes, the circuit comprising at least:
a circuit for providing a data strobe signal;
a circuit for receiving a data bit signal, including a programmable delay line for delaying the received data bit signal to provide a delayed data bit signal;
at least one flip-flop for sampling the delayed data bit signal;
a bit-leveling controller circuit responsive to the sampled delayed data bit signal and for controlling the delay of the programmable delay line;
wherein the bit leveling circuit:
receives a known pattern of 1's and 0's on the data bit signal, and
samples the delayed data bit signal with the data strobe signal to produce the sampled delayed data bit signal, wherein strobing the data bit signal is synchronized with the known pattern of 1's and 0's;
wherein if the sampled delayed data bit signal does not differ from an expected value when first sampled from the known pattern of 1's and 0's, then the bit-leveling circuit proceeds with the first calibration process, comprising:
from an initial delay line delay setting, incrementally increasing the delay line delay until the value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the initial delay line delay setting as value Tc;
from the initial delay line delay setting, incrementally decreasing the delay line delay until the value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the initial delay line delay setting as value Td;
summing Tc and Td;
if (Tc+Td) is less than a pre-determined jitter detection threshold value, the bit-leveling circuit performs the second calibration process comprising:
setting the delay line delay to the initial setting value plus a jitter correction offset delay value to create a revised initial delay line delay setting;
from the revised initial delay line delay setting, incrementally increasing the delay line delay until the value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the revised initial delay line delay setting as value Ta;
from the revised initial delay line delay setting, incrementally decreasing the delay line delay until the value of the sampled delayed data bit signal changes, and storing a number of increments necessary to reach a point where the sampled delayed data bit signal changed relative to its value at the revised initial delay line delay setting as value Tb; and
as a function of Ta and Tb, adjusting the delay line setting to advance or delay the data bit signal, such that the delayed data bit signal is sampled at a midpoint of a half-cycle of the delayed data bit signal.
7. The circuit of claim 6 wherein the known pattern of 1's and 0's on the data bit signal comprises an alternating pattern of 1's and 0's.
8. The circuit of claim 6 , wherein if the sampled delayed data bit signal when first sampled differs from an expected value of 0, the bit-leveling circuit executes a third calibration process comprising the sequential steps of:
comparing the values of Tc and Td, wherein if the value Tc is greater than Td, incrementally changing the delay line delay to advance the delayed data bit signal from the initial point until a 0 is detected, the increment for the detected 0 having been previously recorded as Td, and then further advancing the delayed data bit signal until a 1 is detected, whereby the delay line delay is recorded as Te; and
setting the delay line delay to advance the delayed data bit signal from the initial point by a value equal to (Td+Te)/2.
9. The circuit of claim 6 , wherein if the sampled delayed data bit signal when first sampled differs from an expected value of 0, the bit-leveling circuit continues with a third calibration process comprising the sequential steps of:
comparing the values of Tc and Td, wherein if the value Tc is less than Td, incrementally changing the delay line delay to delay the delayed data bit signal from the initial point until a 0 is detected, the increment for the detected 0 having been previously recorded as Tc, and then further delaying the delayed data bit signal until a 1 is detected, whereby the delay line delay is recorded as Tf; and
setting the delay line delay to delay the delayed data bit signal from the initial point by a value equal to (Tc+Tf)/2.
10. The circuit of claim 6 , wherein if the sampled delayed data bit signal when first sampled differs from an expected value of 1, the bit-leveling circuit continues with a third calibration process comprising the sequential steps of:
comparing the values of Tc and Td, wherein if the value Tc is greater than Td, incrementally changing the delay line delay to advance the delayed data bit signal from the initial point until a 1 is detected, the increment for the detected 1 having been previously recorded as Td, and then further advancing the delayed data bit signal until a 0 is detected, whereby the delay line delay is recorded as Te; and
setting the delay line delay to advance the delayed data bit signal from the initial point by a value equal to (Td+Te)/2.
11. The circuit of claim 6 , wherein if the sampled delayed data bit signal when first sampled differs from an expected value of 1, the bit-levelling circuit continues with a third calibration process comprising the sequential steps of:
comparing the values of Tc and Td, wherein if the value Tc is less than Td, incrementally changing the delay line delay to delay the delayed data bit signal from the initial point until a 1 is detected, the increment for the detected 1 having been previously recorded as Tc, and then further delaying the delayed data bit signal until a 0 is detected, whereby the delay line delay is recorded as Tf; and
setting the delay line delay to delay the delayed data bit signal from the initial point by a value equal to (Tc+Tf)/2.
12. The circuit of claim 6 wherein incrementally increasing and decreasing the delay line delay comprises changing the delay line delay by time increments that are each less than a period of the known pattern of 1's and 0's.