Apparatuses and operation methods associated with resistive memory cell arrays with separate select lines
The present disclosure includes methods and apparatuses that include resistive memory. A number of embodiments include a first memory cell coupled to a data line and including a first resistive storage element and a first access device, a second memory cell coupled to the data line and including a second resistive storage element and a second access device, an isolation device formed between the first access device and the second access device, a first select line coupled to the first resistive storage element, and a second select line coupled to the second resistive storage element, wherein the second select line is separate from the first select line.
1. An apparatus, comprising:
a controller; and
an array of resistive memory cells coupled to the controller;
wherein the array of resistive memory cells includes adjacent memory cells selectively electrically separated by a respective isolation device; and
wherein the adjacent memory cells are coupled to a common data line and are formed between two adjacent data line contacts.
2. The apparatus of claim 1 , wherein one memory cell of the adjacent memory cells is configured to receive a signal from a first select line and another memory cell of the adjacent memory cells is configured to receive a signal from a second select line.
3. The apparatus of claim 1 , wherein the array of memory cells includes a number of planar access devices.
4. The apparatus of claim 1 , wherein the array of memory cells includes a number of recessed access devices.
5. The apparatus of claim 1 , wherein the array of memory cells includes a number of fin field effect transistor (FinFET) access devices.
6. An apparatus, comprising:
a controller; and
an array of resistive memory cells coupled to the controller;
wherein the array of resistive memory cells includes a first memory cell selectively electrically separated from a second memory cell by an isolation device; and wherein the first memory cell and second memory cell are coupled to a data line and are formed between a first data line contact and a second data line contact.
7. The apparatus of claim 6 , wherein the second memory cell is coupled to a second select line.
8. The apparatus of claim 6 , wherein the first memory cell is coupled to a first select line.
9. The apparatus of claim 6 , wherein the first memory cell is between the isolation device and a first access device and the second memory cell is between the isolation device and a second access device.
10. The apparatus of claim 6 , wherein an isolation line is coupled to the isolation device.
11. The apparatus of claim 10 , wherein the isolation line is between a storage element of first memory cell and a storage element of the second memory cell.
12. The apparatus of claim 6 , wherein a first word line is between a storage element of the first memory cell and a first data line contact.
13. The apparatus of claim 6 , wherein a second word line is between a storage element of the second memory cell and a second data line contact.
14. An apparatus, comprising:
a controller; and
an array of resistive memory cells coupled to the controller;
wherein the array of resistive memory cells includes a first memory cell selectively electrically separated from a second memory cell by a first isolation device and a third memory cell selectively electrically separated from a fourth memory cell by a second isolation device; and wherein a first data line contact is formed between the second memory cell and the third memory cell.
15. The apparatus of claim 14 , wherein the first, second, third and fourth memory cells are coupled to a data line.
16. The apparatus of claim 14 , wherein the first and third memory cells are coupled to a first select line.
17. The apparatus of claim 14 , wherein the second and fourth memory cells are coupled to a second select line.
18. The apparatus of claim 14 , wherein a first isolation line is between a storage element of first memory cell and a storage element of the second memory cell.
19. The apparatus of claim 14 , wherein a second isolation line is between a storage element of third memory cell and a storage element of the fourth memory cell.
20. The apparatus of claim 14 , wherein the first and second memory cells are formed between the first data contact line and a second data contact line and wherein the third and fourth memory cells are formed between the first data contact line and a third data contact line.