IP Library Granted Patent US 9,899,595
Granted Patent B2
US 9,899,595 · App. 15/197,847 · Granted Feb 20, 2018

Implementing deposition growth method for magnetic memory

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,899,595
App. No.
15/197,847
Granted
Feb 20, 2018
Kind
B2
Abstract

A magnetic memory array and a method for implementing the magnetic memory array for use in Solid-State Drives (SSDs) are provided. A plurality of magnetic pillar memory cells is formed using a deposition and/or growth process to produce a magnetic memory array substantially avoiding milling of magnetic materials.

Claims (28)

1. A method for implementing a magnetic memory array comprising:

forming a plurality of magnetic pillar memory cells includes a first conductor M 1 being formed of a magnetic material, and a second conductor M 2 being more electrically conductive than said conductor M 1 including:

growing said second conductor M 2 ;

coating said second conductor M 2 with a non-magnetic spacer layer;

growing said first magnetic conductor M 1 over said coated second conductor M 2 ;

depositing an oxide barrier over said grown first magnetic conductor M 1 forming magnetic pillar memory cells; and

depositing an interlayer dielectric (IDL) stack of word planes separated by a respective IDL on the first magnetic conductor M 1 , wherein the word planes have a magnetization state anti-parallel to a magnetization state of the second conductor M 2 ; wherein the first conductor M 1 is programmable to a parallel and anti-parallel magnetization state.

2. The method as recited in claim 1 wherein growing said second conductor M 2 includes forming said second conductor M 2 of a magnetic material.

3. The method as recited in claim 1 wherein growing said second conductor M 2 includes forming said second conductor M 2 of a non-magnetic material.

4. The method are recited in claim 1 includes sharing a bit line only by said magnetic pillar memory cells inside said respective pillar holes.

5. The method as recited in claim 1 wherein forming said magnetic pillar memory cells includes providing a complementary metal oxide semiconductor (CMOS) wafer having a CMOS defined pad pattern, and growing said magnetic pillar memory cells on said CMOS defined pad pattern.

6. The method as recited in claim 5 includes treating said CMOS defined pad pattern for providing a source of growth for said plurality of magnetic pillar memory cells.

7. The method as recited in claim 1 including forming vias in said IDL stack, and forming other conductive electrical connections.

8. The method as recited in claim 1 wherein growing said second conductor M 2 and growing said first conductor M 1 includes each said first conductor M 1 and said second conductor M 2 not being patterned.

9. A method for implementing a magnetic memory array comprising:

forming a plurality of magnetic pillar memory cells includes a first conductor M 1 being formed of a magnetic material, and a second conductor M 2 being more electrically conductive than said conductor M 1 including:

growing said second conductor M 2 ;

coating said second conductor M 2 with a non-magnetic spacer layer;

growing said first magnetic conductor M 1 over said coated second conductor M 2 ;

depositing an oxide barrier over said grown first magnetic conductor M 1 forming magnetic pillar memory cells; and

depositing an interlayer dielectric (IDL) stack of word planes separated by a respective IDL wherein growing said first conductor M 1 includes forming said first conductor M 1 of said magnetic material having a metallic granularity enabling independent programming of each said magnetic pillar memory cell.

10. A method for implementing a magnetic memory array comprising:

forming a plurality of magnetic pillar memory cells includes a first conductor M 1 being formed of a magnetic material, and a second conductor M 2 being more electrically conductive than said conductor M 1 including:

growing said second conductor M 2 ;

coating said second conductor M 2 with a non-magnetic spacer layer;

growing said first magnetic conductor M 1 over said coated second conductor M 2 ;

depositing an oxide barrier over said grown first magnetic conductor M 1 forming magnetic pillar memory cells; and

depositing an interlayer dielectric (IDL) stack of word planes separated by a respective IDL includes sharing each said respective word plane by all magnetic pillar memory cells in a respective plane level.

Assignments (11)
SECURITY AGREEMENT (SUPPLEMENTAL) Recorded Nov 14, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 069411/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2024
From: SANDISK TECHNOLOGIES, INC.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 069168/0273 →
PATENT COLLATERAL AGREEMENT Recorded Aug 23, 2024
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS THE AGENT
Reel/Frame 068762/0494 →
CHANGE OF NAME Recorded Jun 27, 2024
From: SANDISK TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067982/0032 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2024
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 067567/0682 →
PATENT COLLATERAL AGREEMENT - DDTL LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 067045/0156 →
PATENT COLLATERAL AGREEMENT - A&R LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064715/0001 →
RELEASE OF SECURITY INTEREST AT REEL 052915 FRAME 0566 Recorded Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 059127/0001 →
SECURITY INTEREST Recorded Feb 6, 2020
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS AGENT
Reel/Frame 052915/0566 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT SERIAL NO 15/025,946 PREVIOUSLY RECORDED AT REEL: 040831 FRAME: 0265. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 15, 2017
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 043973/0762 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040831/0265 →