Word line dependent pass voltages in non-volatile memory
Sensing in non-volatile memory is performed using bias conditions that are dependent on the position of a selected memory cell within a group of non-volatile memory cells. During sensing, a selected memory cell receives a reference voltage while the remaining memory cells receive a read or verify pass voltage. For at least a subset of the unselected memory cells, the pass voltage that is applied is dependent upon the position of the selected memory cell in the group. As programming progresses from a memory cell at a first end of a NAND string toward a memory cell at a second end of the NAND string, for example, the pass voltage for at least a subset of the unselected memory cells that have already been subjected to programming may be increased. This technique may reduce the effects of an increased channel resistance that occurs as more memory cells are programmed.
1. An apparatus, comprising:
a group of memory cells connected in series coupled to a select gate;
a program circuit configured to program a first memory cell of the group before programming a second memory cell of the group; and
a sense circuit configured to sense the first memory cell by applying a first pass voltage to two or more memory cells positioned between the select gate and the first memory cell, the sense circuit configured to sense the second memory cell by applying a second pass voltage to the two or more memory cells, the second pass voltage is different from the first pass voltage.
2. The apparatus of claim 1 , wherein:
the second pass voltage is higher than the first pass voltage;
the sense circuit is configured to sense the first memory cell as part of a program verification operation by applying a verify voltage to the first memory cell and applying the first pass voltage to the two or more memory cells; and
the sense circuit is configured to sense the second memory cell as part of a program verification operation by applying the verify voltage to the second memory cell and applying the second pass voltage to the two or more memory cells.
3. The apparatus of claim 2 , wherein:
the sense circuit verifies that the first memory cell is programmed by applying a third pass voltage to two memory cells adjacent to the first memory cell and applying the first pass voltage to the two or more memory cells;
the sense circuit verifies that the second memory cell is programmed by applying the third pass voltage to two memory cells adjacent to the second memory cell and applying the second pass voltage to the two or more memory cells; and
the third pass voltage is higher than the second pass voltage.
4. The apparatus of claim 3 , wherein:
the select gate is a source select gate coupled between the group of memory cells and a source line;
the first memory cell is positioned between the second memory cell and the source select gate; and
the two or more memory cells receiving the first pass voltage are two or more memory cells that are subjected to programming after erase and prior to programming the first memory cell;
the sense circuit is configured to apply the first pass voltage to each other memory cell of the group that is positioned between the first memory cell and the source select gate and that has been subjected to programming after erase and prior to programming the first memory cell.
5. The apparatus of claim 4 , wherein:
the sense circuit applies a third pass voltage to two or more unprogrammed memory cells positioned between the first memory cell and a drain select gate while applying the first pass voltage to the two or more previously programmed memory cells, the third pass voltage is less than the first pass voltage; and
the verification circuit applies the third pass voltage to the two or more unprogrammed memory cells while applying the second pass voltage to the two or more previously programmed memory cells.
6. The apparatus of claim 1 , wherein:
the first pass voltage is higher than the second pass voltage;
the sense circuit is configured to sense the first memory cell as part of a read operation by applying a read reference voltage to the first memory cell and applying the first pass voltage to the two or more memory cells; and
the sense circuit is configured to sense the second memory cell as part of a read operation by applying the read reference voltage to the second memory cell and applying the second pass voltage to the two or more memory cells.
7. The apparatus of claim 1 , further comprising:
a plurality of word lines each coupled to a corresponding one of the memory cells, whereby the sense circuit applies the first pass voltage and the second pass voltage to the two or more memory cells.
8. The apparatus of claim 7 , wherein the group of memory cells are part of a first NAND string and the apparatus further includes one or more additional NAND strings coupled to the plurality of word lines.
9. The apparatus of claim 1 , wherein the sense circuit includes a sense amp, the apparatus further comprising:
a bit line whereby the group of memory cells is connected to the sense amp.
10. The apparatus of claim 1 , wherein the group of memory cells is part of a non-volatile memory array, and the non-volatile memory array is arranged in a three dimensional structure.