IP Library Granted Patent US 10,199,568
Granted Patent B2
US 10,199,568 · App. 15/261,619 · Granted Feb 5, 2019

Magnetic storage device and manufacturing method of magnetic storage device

Inventors: Makoto Nagamine (Seoul, KR); Young Min Eeh (Seongnam-si, KR); Daisuke Watanabe (Seoul, KR); Kazuya Sawada (Seoul, KR); Toshihiko Nagase (Seoul, KR)
Assignee: TOSHIBA MEMORY CORPORATION
H01L43/08H01L27/228H01L43/12
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Quick Facts
Patent No.
US 10,199,568
App. No.
15/261,619
Granted
Feb 5, 2019
Kind
B2
Abstract

According to one embodiment, a magnetic storage device includes a substrate, a dummy contact disposed on a top surface of the substrate, extending linearly in a direction substantially perpendicular to the top surface of the substrate, and floating electrically, and a magnetoresistive effect element included in a layer and insulated from the dummy contact, wherein the layer is disposed on the top surface of the dummy contact.

Claims (17)

1. A magnetic storage device comprising:

a substrate;

a dummy contact disposed on a top surface of the substrate, extending linearly in a direction substantially perpendicular to the top surface of the substrate, and floating electrically;

a magnetoresistive effect element included in a layer and insulated from the dummy contact, wherein the layer is disposed on a top surface of the dummy contact;

a lower electrode disposed on a bottom surface of the magnetoresistive effect element; and

an insulating layer disposed between the top surface of the substrate and a bottom surface of the lower electrode,

wherein the magnetoresistive effect element is laterally displaced from the dummy contact, and

wherein the following relationship is satisfied:

d 2/ d 1≤TC_MTJ/TC_IL

where:

d 2 is a lateral distance between the lower electrode and a portion of the dummy contact disposed in a position closest to the magnetoresistive effect element,

d 1 is a shortest vertical distance from the lower electrode to the semiconductor substrate,

TC_MTJ is a first thermal conductivity of the magnetoresistive effect element, and

TC_IL is a second thermal conductivity of the insulating layer.

2. The device of claim 1 , wherein the substrate includes an element insulating area that insulates an area electrically connected to the dummy contact from an area electrically connected to the magnetoresistive effect element.

3. The device of claim 1 , further comprising:

a dummy magnetoresistive effect element disposed in a same layer as the magnetoresistive effect element and insulated from the magnetoresistive effect element.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0382 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2016
From: NAGAMINE, MAKOTO; EEH, YOUNG MIN; WATANABE, DAISUKE; SAWADA, KAZUYA; NAGASE, TOSHIHIKO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 039986/0959 →
Continuity (2)
Provisional Application 62306346 · Mar 10, 2016
Related Publication 20170263855A1 · Sep 14, 2017
Cited By (5)
US 12,284,811 US 12,310,251 US 12,329,038 US 12,356,866 US 12,501,837