IP Library Granted Patent US 10,347,614
Granted Patent B2
US 10,347,614 · App. 15/342,495 · Granted Jul 9, 2019

Solid state transducers with state detection, and associated systems and methods

Inventors: Martin F. Schubert (Boise, ID); Vladimir Odnoblyudov (Eagle, ID)
Assignee: Micron Technology, Inc.
H01L25/167H01L27/0255H01L33/06H01L33/32H01L33/62H05B33/0893H05B37/0227H01L27/0248H01L33/00H01L2924/0002Y02B20/341
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Quick Facts
Patent No.
US 10,347,614
App. No.
15/342,495
Granted
Jul 9, 2019
Kind
B2
Abstract

Solid state transducers with state detection, and associated systems and methods are disclosed. A solid state transducer system in accordance with a particular embodiment includes a support substrate and a solid state emitter carried by the support substrate. The solid state emitter can include a first semiconductor component, a second semiconductor component, and an active region between the first and second semiconductor components. The system can further include a state device carried by the support substrate and positioned to detect a state of the solid state emitter and/or an electrical path of which the solid state emitter forms a part. The state device can be formed from at least one state-sensing component having a composition different than that of the first semiconductor component, the second semiconductor component, and the active region. The state device and the solid state emitter can be stacked along a common axis. In further particular embodiments, the state-sensing component can include an electrostatic discharge protection device, a thermal sensor, or a photosensor.

Claims (34)

1. A solid state transducer system, comprising:

a support substrate having a first side and a second side;

a solid state emitter carried by the support substrate over the first side of the support substrate, the solid state emitter comprising a first semiconductor component, a second semiconductor component, and an active region between the first and second semiconductor components;

a state device carried by the support substrate over the first side of the support substrate and positioned to detect a state of the solid state emitter, wherein—

the state device is formed from at least one state-sensing component having a composition different than that of the first semiconductor component, the second semiconductor component, and the active region,

the state device and the solid state emitter are stacked along a common axis,

the state device includes a photosensor positioned to receive radiation emitted by the solid state emitter, and

the signal corresponds to a characteristic of the radiation;

a first via extending through the substrate to the first semiconductor component of the solid state emitter, the first via having an electrically conductive material that defines a first emitter contact at the second side of the substrate;

a second via extending through the substrate to the second semiconductor component of the solid state emitter, the second via having an electrically conductive material that defines a second emitter contact at the second side of the substrate; and

a controller operatively coupled to the solid state emitter and the state device to receive a signal from the state device and control the solid state emitter based at least in part on the signal received from the state device.

2. The system of claim 1 , further comprising a power source, and wherein:

the power source is electrically coupled to and provides electric power to the solid state emitter,

the characteristic of the radiation is a radiation output level,

the controller is operatively coupled to the power source and the controller is configured to increase the power provided to the solid state emitter when the signal indicates that the radiation output level of the solid state emitter is below a first level and decrease the power provided to the solid state emitter when the signal indicates that the radiation output level is above a second level, and

the second level is greater than the first level.

3. The system of claim 1 , further comprising a power source, wherein the power source is electrically coupled to and provides electric power to the solid state emitter, wherein the controller is operatively coupled to the power source, and wherein the controller is configured to control the solid state emitter at least in part by controlling the power source to control the power provided to the solid state emitter.

4. The system of claim 1 wherein the solid state emitter, the state device, and the support substrate form a single die, and wherein the support substrate is the only support substrate of the die.

5. The system of claim 1 wherein the state device is formed from a plurality of materials disposed conformally and sequentially on the solid state emitter.

6. The system of claim 1 , further comprising an external surface through which radiation emitted by the active region passes, and wherein the state device is positioned off an optical axis between the active region and the external surface.

7. The system of claim 1 , further comprising:

first and second state device contacts connected to the state device, the first and second emitter contacts being addressable separately from the state device contacts.

8. The system of claim 1 , further comprising:

a third via extending through the substrate and having an electrically conductive material electrically coupled to the state device and defining a first state device contact at the second side of the substrate; and

a fourth via extending through the substrate and having an electrically conductive material electrically coupled to the state device and defining a second state device contact at the second side of the substrate.

9. A solid state transducer system, comprising:

a support substrate having a first side and a second side;

a solid state emitter carried by the support substrate over the first side of the support substrate, the solid state emitter comprising a first semiconductor component, a second semiconductor component, and an active region between the first and second semiconductor components;

a state device carried by the support substrate over the first side of the support substrate and positioned to detect a state of the solid state emitter, wherein the state device is formed from at least one state-sensing component having a composition different than that of the first semiconductor component, the second semiconductor component, and the active region, wherein the state device and the solid state emitter are stacked along a common axis, and wherein the state device includes a photosensor;

a reflective material positioned between the solid state emitter and the photosensor to reflect radiation emitted by the solid state emitter, wherein the reflective material includes an aperture positioned between the active region and the photosensor to pass radiation from the active region to the photosensor;

a first via extending through the substrate to the first semiconductor component of the solid state emitter, the first via having an electrically conductive material that defines a first emitter contact at the second side of the substrate;

a second via extending through the substrate to the second semiconductor component of the solid state emitter, the second via having an electrically conductive material that defines a second emitter contact at the second side of the substrate; and

a controller operatively coupled to the solid state emitter and the state device to receive a signal from the state device and control the solid state emitter based at least in part on the signal received from the state device.

10. The system of claim 9 wherein the reflective material is conductive.

Assignments (5)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050702/0451 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2017
From: SCHUBERT, MARTIN F.; ODNOBLYUDOV, VLADIMIR
To: MICRON TECHNOLOGY, INC.
Reel/Frame 043273/0268 →
SUPPLEMENT NO. 4 TO PATENT SECURITY AGREEMENT Recorded May 4, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042405/0909 →
Continuity (2)
Continuation 13223136 · Aug 31, 2011
Related Publication 20170125390A1 · May 4, 2017