Pick-and remove system and method for emissive display repair
A system and method are provided for repairing an emissive display. Following assembly, the emissive substrate is inspected to determine defective array sites, and defect items are removed using a pick-and-remove process. In one aspect, the emissive substrate includes an array of wells, with emissive elements located in the wells, but not electrically connected to the emissive substrate. If the emissive elements are light emitting diodes (LEDs), then the emissive substrate is exposed to ultraviolet illumination to photoexcite the array of LED, so that LED illumination can be measured to determine defective array sites. The defect items may be determined to be misaligned, mis-located, or non-functional emissive elements, or debris. Subsequent to determining these defect items, the robotic pick-and-remove process is used to remove them. The pick-and-remove process can also be repurposed to populate empty wells with replacement emissive elements.
1. An emissive display repair system, the system comprising:
an inspection subsystem for inspecting an emissive substrate and determining defective array sites;
a pick-and-remove subsystem for removing defect items from the emissive substrate;
wherein the emissive substrate comprises an array of wells, each well configured with a solderable electrical interface and populated with an emissive element, each emissive element configured with a solderable electrical interface that is not solder connected to the well solderable electrical interface;
wherein the emissive elements are light emitting diodes (LEDs);
wherein inspection subsystem comprises:
an illuminator, independent of and overlying the emissive substrate, for irradiating the emissive substrate with ultraviolet (UV) spectrum light and photoexciting the LEDs; and,
a dual-mode image sensor for measuring visual contrast and edge detection in a first mode, and wavelength-specific filtration in a second mode to identify functional LEDs.
2. The system of claim 1 wherein the inspection subsystem determines a defect item selected from the group consisting of misaligned emissive elements, mis-located emissive elements, non-functional emissive elements, or debris; and,
wherein the pick-and-remove subsystem uses a robotic pick-and-remove device to remove the defect item.
3. The system of claim 2 wherein the robotic pick-and-remove device uses a mechanical holding mechanism.
4. The system of claim 3 wherein the mechanical pick-and-remove device includes:
a thermal transfer head;
a liquid phase polymer coating overlying the thermal transfer head; and,
wherein the thermal transfer head, subsequent to contacting a defect item, is cooled to convert the liquid phase polymer to a solid phase attached to the defect item.
5. The system of claim 4 wherein the thermal transfer head is cleaned of the polymer to remove the defect item, and recoated with a liquid phase polymer for subsequent use.
6. The system of claim 4 wherein the thermal transfer head is disposed of with the attached defect item.
7. The system of claim 4 wherein the thermal transfer head is a heatable metal tip.
8. The system of claim 5 further comprising:
a cleaner selected from the group consisting of a solvent bath and a solvent sprayer to remove the defect item and clean polymer from the thermal transfer head.
9. The system of claim 1 wherein the sensor measures a characteristic selected from the group consisting of photoluminescence intensity and photoluminescence wavelengths.
10. The system of claim 1 wherein the sensor measures red-green-blue (RGB) color mapping.
11. The system of claim 1 wherein the sensor is selected from a group consisting of a spectroscope, charge-coupled device (CCD), and CMOS sensor.
12. An emissive display repair system, the system comprising:
an inspection subsystem for inspecting an emissive substrate and determining defective array sites;
wherein the emissive substrate comprises an array of wells, each well configured with a solderable electrical interface and populated with an emissive element, each emissive element configured with a solderable electrical interface that is not solder connected to the well solderable electrical interface;
a mechanical pick-and-remove subsystem for removing defect items from the emissive substrate, the mechanical pick-and-remove device comprising:
a thermal transfer head;
a liquid phase polymer coating overlying the thermal transfer head; and,
wherein the thermal transfer head, subsequent to contacting a defect item, is cooled to convert the liquid phase polymer to a solid phase attached to the defect item.
13. The system of claim 12 wherein the emissive elements are LEDs;
wherein inspection subsystem comprises:
an illuminator for photoexciting the LEDs; and,
a sensor for measuring photoluminescence.
14. The system of claim 12 wherein the inspection subsystem determines defect items selected from a group consisting of missing emissive elements, misaligned emissive elements, mis-located emissive elements, non-functional emissive elements, and debris.
15. The system of claim 12 wherein the thermal transfer head is cleaned of the polymer to remove the defect item, and recoated with a liquid phase polymer for subsequent use.
16. The system of claim 12 wherein the thermal transfer head is disposed of with the attached defect item.
17. The system of claim 12 further comprising:
a cleaner selected from the group consisting of a solvent bath and a solvent sprayer to remove the defect item and clean polymer from the thermal transfer head.
18. An emissive display repair system, the system comprising:
an inspection subsystem for inspecting an emissive substrate and determining defective array sites;
a pick-and-remove subsystem for removing defect items from the emissive substrate;
wherein the emissive substrate comprises an array of wells, each well configured with a solderable electrical interface and populated with a light emitting diode, each light emitting diode configured with a solderable electrical interface that is not solder connected to the well solderable electrical interface;
wherein inspection subsystem comprises:
an illuminator, independent of and overlying the emissive substrate, for photoexciting the LEDs; and,
a sensor for measuring photoluminescence.