Method and apparatus for adjustment of current through a magnetoresistive tunnel junction (MTJ) based on temperature fluctuations
View Patent ↗A non-volatile memory system includes a first circuit and a second circuit both coupled to a magnetoresistance tunnel junction (MTJ) cell to substantially reduce the level of current flowing through the MTJ with rise in temperature, as experienced by the MTJ. The first circuit is operable to adjust a slope of a curve representing current as a function of temperature and the second circuit is operable to adjust a value of the current level through the MTJ to maintain current constant or to reduce current when the temperature increases. This way sufficient current is provided for the MTJ at different temperatures to prevent write failure, over programming, MTJ damage and waste of current.
1. A circuit comprising:
an MTJ formed on a chip;
a diode circuit located on said chip and operable to measure a temperature of said chip; and
a device coupled to said diode circuit and operable to generate a write current for programming said MTJ according to said temperature,
wherein said write current passes through said MTJ, wherein said device is operable to determine a slope defined by a change in said write current through said MTJ versus a change in said temperature, said device further operable to use said slope to adjust said write current.
2. The circuit of claim 1 , wherein said device is a current source controlled by said diode circuit.
3. The circuit of claim 2 , wherein said current source is operable to measure a change in a level of said write current and to adjust said write current accordingly.
4. The circuit of claim 1 , wherein said device is a current generator.
5. A circuit comprising:
an MTJ formed on a chip;
a temperature-sensitive resistor located on said chip and operable to measure a temperature of said chip; and
a device coupled to said temperature-sensitive resistor and operable to generate a write current for programming said MTJ according to said temperature,
wherein said write current passes through said MTJ, wherein said device is operable to determine a slope defined by a change in said write current through said MTJ versus a change in said temperature, said device further operable to use said slope to adjust said write current.
6. The circuit of claim 5 , wherein said device is a current source.
7. The circuit of claim 6 , wherein said current source is operable to measure a change in a level of said write current and to adjust said write current accordingly.
8. The circuit of claim 5 , wherein said device is a current generator.