IP Library Granted Patent US 10,497,511
Granted Patent B2
US 10,497,511 · App. 15/461,860 · Granted Dec 3, 2019

Multilayer build processes and devices thereof

Inventor: David Sherrer (Cary, NC)
Assignee: CUBIC CORPORATION
H01F41/042C25D5/02C25D5/022H01F27/2804H01F41/14C25D5/12C25D5/18Y10T156/10Y10T428/24802
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Quick Facts
Patent No.
US 10,497,511
App. No.
15/461,860
Granted
Dec 3, 2019
Kind
B2
Abstract

A process to form devices may include forming a seed layer on and/or over a substrate, modifying a seed layer selectively, forming an image-wise mold layer on and/or over a substrate and/or electrodepositing a first material on and/or over an exposed conductive area. A process may include selectively applying a temporary patterned passivation layer on a conductive substrate, selectively forming an image-wise mold layer on and/or over a substrate, forming a first material on and/or over at least one of the exposed conductive areas and/or removing a temporary patterned passivation layer. A process may include forming a sacrificial image-wise mold layer on a substrate layer, selectively placing one or more first materials in one or more exposed portions of a substrate layer, forming one or more second materials on and/or over a substrate layer and/or removing a portion of a sacrificial image-wise mold layer.

Claims (23)

1. A method of forming a three-dimensional multilayer electromagnetic microdevice by a sequential build process, comprising:

depositing a plurality of layers over a substrate, wherein the layers comprise one or more of a conductive material and a sacrificial material thereby forming a multilayer microstructure above the substrate, the microstructure having one or more walls comprised of a plurality of layers of the conductive material, the walls defining at least one cavity in a top layer of the multilayer microstructure furthest from the substrate, the at least one cavity having the sacrificial disposed therein;

removing the sacrificial material from the at least one cavity and thereafter providing a magnetic microstructural element comprising a magnetic material within the at least one cavity; and thereafter

continuing the build process by depositing a plurality of layers of the conductive and sacrificial materials over the top layer and the magnetic material to provide the multilayer electromagnetic microdevice.

2. The method of forming a three-dimensional microstructure according to claim 1 , wherein the at least one cavity in the top layer includes a plurality of cavities in the top layer, and wherein a selected cavity includes a material different from the magnetic material.

3. The method of forming a three-dimensional microstructure according to claim 2 , wherein material in the selected cavity comprises a metal.

4. The method of forming a three-dimensional microstructure according to claim 1 , wherein the sacrificial material comprises a dielectric material.

5. The method of forming a three-dimensional microstructure according to claim 1 , wherein the sacrificial material comprises an insulative material.

6. The method of forming a three-dimensional microstructure according to claim 1 , wherein the walls comprise windings.

7. The method of forming a three-dimensional microstructure according to claim 1 , wherein the magnetic material comprises one or more of nickel iron and cobalt iron.

8. The method of forming a three-dimensional microstructure according to claim 1 , wherein the multilayer electromagnetic microdevice comprises a multi-turn inductor.

9. The method of forming a three-dimensional microstructure according to claim 1 , wherein the multilayer electromagnetic microdevice comprises a double multi-turn inductor.

10. The method of forming a three-dimensional microstructure according to claim 1 , wherein the step of disposing a plurality of layers comprises providing a seed layer and selectively applying a patterned passivation layer over the seed layer to expose a first portion of the seed layer and to block a second portion of the seed layer.

11. The method of forming a three-dimensional microstructure according to claim 10 , comprising selectively removing the exposed first portion of the seed layer.

12. The method of forming a three-dimensional microstructure according to claim 1 , wherein for a selected layer strata, the layers of sacrificial and conductive materials within the strata have the same height in a direction normal to the selected layer.

13. The method of forming a three-dimensional microstructure according to claim 1 , wherein the magnetic material comprises a ferrite.

14. The method of forming a three-dimensional microstructure according to claim 1 , wherein the walls comprise a plurality of windings disposed in spaced apart relation to define a winding cavity, and wherein the magnetic material comprises a magnetic core that extends through the winding cavity.

15. The method of forming a three-dimensional microstructure according to claim 1 , wherein a selected layer comprises a metal, a magnetic material, and a non-magnetic material.

16. The method of forming a three-dimensional microstructure according to claim 1 , wherein a selected layer comprises at least a portion of the cavity and two or more different conductive materials.

17. The method of forming a three-dimensional microstructure according to claim 1 , comprising removing the sacrificial material after the step of continuing the build process.

18. The method of forming a three-dimensional microstructure according to claim 1 , wherein the multilayer electromagnetic microdevice comprises a non-reciprocal microwave device.

19. The method of forming a three-dimensional microstructure according to claim 18 , wherein the non-reciprocal microwave device is one or more of a circulator, an isolator, and a phase shifter.

20. The method of forming a three-dimensional microstructure according to claim 1 , comprising providing on the substrate an active device operably connected to the multilayer electromagnetic microdevice.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Jul 30, 2025
From: ALTER DOMUS (US) LLC
To: CUBIC CORPORATION; CUBIC DIGITAL SOLUTIONS LLC; NUVOTRONICS, INC.
Reel/Frame 072281/0176 →
RELEASE OF SECURITY INTEREST AT REEL/FRAME 056393/0281 Recorded Jul 28, 2025
From: BARCLAYS BANK PLC, AS ADMINISTRATIVE AGENT
To: CUBIC CORPORATION; CUBIC DEFENSE APPLICATIONS, INC.; CUBIC DIGITAL SOLUTIONS LLC (FORMERLY PIXIA CORP.)
Reel/Frame 072282/0124 →
FIRST LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: BARCLAYS BANK PLC
Reel/Frame 056393/0281 →
SECOND LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: ALTER DOMUS (US) LLC
Reel/Frame 056393/0314 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE INSIDE THE ASSIGNMENT DOCUMENTATION PREVIOUSLY RECORDED AT REEL: 048698 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 10, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048843/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048698/0301 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2018
From: SHERRER, DAVID W
To: NUVOTRONICS, INC
Reel/Frame 046264/0158 →
Continuity (5)
Continuation 15003985 · Jan 22, 2016
Continuation 13965524 · Aug 13, 2013
Continuation 12953393 · Nov 23, 2010
Provisional Application 61263777 · Nov 23, 2009
Related Publication 20170338036A1 · Nov 23, 2017