IP Library Granted Patent US 10,332,873
Granted Patent B2
US 10,332,873 · App. 15/619,811 · Granted Jun 25, 2019

Apparatus comprising antifuse cells

Inventors: Toshinao Ishii (Tokyo, JP); Yasuhiko Tanuma (Kanagawa, JP)
Assignee: Micron Technology, Inc.
H01L27/0617H01L23/5252
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,332,873
App. No.
15/619,811
Granted
Jun 25, 2019
Kind
B2
Abstract

An apparatus comprises an antifuse cell comprising first and second nodes, an antifuse element, and a transistor. The antifuse element and the transistor are coupled in series between the first and second nodes. The antifuse element comprises an antifuse gate. The transistor comprises a transistor gate comprising a substantially-annular structure substantially surrounding the antifuse gate.

Claims (16)

1. An apparatus comprising an antifuse cell, the antifuse cell comprising:

first and second nodes;

an antifuse element and a transistor, the antifuse element and the transistor being coupled in series between the first and second nodes;

the antifuse element comprising an antifuse gate;

the transistor comprising a transistor gate, the transistor gate comprising a substantially-annular structure substantially surrounding the antifuse gate;

the transistor comprising a first source/drain diffusion region inside the substantially-annular structure of the transistor gate and a second source/drain diffusion region outside the substantially-annular structure of the transistor gate; and

at least a part of the antifuse gate overlapping at least a part of the first source/drain diffusion region with an intervention of gate insulator material.

2. The apparatus of claim 1 wherein all of the antifuse gate overlaps at least a part of the first source/drain diffusion region.

3. The apparatus of claim 1 further comprising:

a first control line coupled to the transistor gate;

a second control line coupled to the second node; and

a third control line coupled to the first node, the first node being coupled to the antifuse gate.

4. An apparatus comprising an antifuse cell, the antifuse cell comprising:

an antifuse element comprising a first antifuse electrode and a second antifuse electrode;

a pass transistor comprising a first source/drain region, a second source/drain region, a channel region between the first source/drain region and the second source/drain region, and a pass gate operably proximate the channel region; and

the pass gate being on both of opposite lateral sides of the first antifuse electrode in both straight-line vertical cross-section and straight-line horizontal cross-section, the first antifuse electrode and the second antifuse electrode being laterally spaced from the pass gate.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050700/0535 →
RELEASE OF SECURITY INTEREST Recorded Jul 20, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 046597/0393 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
SUPPLEMENT NO. 5 TO PATENT SECURITY AGREEMENT Recorded Aug 8, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 043482/0776 →
SUPPLEMENT NO. 5 TO PATENT SECURITY AGREEMENT Recorded Aug 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION
Reel/Frame 043483/0686 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2017
From: ISHII, TOSHINAO; TANUMA, YASUHIKO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 042676/0858 →
Continuity (1)
Related Publication 20180358356A1 · Dec 13, 2018
Cited By (1)
US 12,575,093