IP Library Granted Patent US 10,431,517
Granted Patent B2
US 10,431,517 · App. 15/686,558 · Granted Oct 1, 2019

Arrangement and thermal management of 3D stacked dies

Inventors: John Wuu (Fort Collins, CO); Samuel Naffziger (Fort Collins, CO); Patrick J. Shyvers (Fort Collins, CO); Milind S. Bhagavat (Los Altos, CA); Kaushik Mysore (Austin, TX); Brett P. Wilkerson (Austin, TX)
Assignee: Advanced Micro Devices, Inc.
H01L23/367H01L23/36H01L25/0657H01L25/50H01L23/373H01L23/3732H01L23/3736H01L23/3737H01L2224/16145H01L2224/16225H01L2225/06589H01L2924/15311H01L2924/181H01L2924/18161
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Quick Facts
Patent No.
US 10,431,517
App. No.
15/686,558
Granted
Oct 1, 2019
Kind
B2
Abstract

Various semiconductor chip devices with stacked chips are disclosed. In one aspect, a semiconductor chip device is provided. The semiconductor chip device includes a first semiconductor chip that has a floor plan with a high heat producing area and a low heat producing area. At least one second semiconductor chip is stacked on the low heat producing area. The semiconductor chip device also includes means for transferring heat from the high heat producing area.

Claims (21)

1. A semiconductor chip device, comprising:

a first semiconductor chip having a side and a floor plan with a high heat producing area and a low heat producing area;

at least one second semiconductor chip stacked on the side and on the low heat producing area; and

means for thermally contacting the side and transferring heat from the high heat producing area.

2. The semiconductor chip device of claim 1 , wherein the high heat producing area comprises at least one processor core.

3. The semiconductor chip device of claim 1 , wherein the means for thermally contacting the side and transferring heat comprises a dummy component mounted on the high heat producing area.

4. The semiconductor chip device of claim 3 , comprising a thermal interface material layer positioned between the dummy component and the first semiconductor chip.

5. The semiconductor chip device of claim 3 , comprising a molding material at least partially encapsulating the dummy component and the at least one second semiconductor chip.

6. The semiconductor chip device of claim 1 , wherein the means for thermally contacting the side and transferring heat comprises a lid having a first interface surface to seat on the high heat producing area and a second interface surface to seat on the at least one semiconductor chip.

7. The semiconductor chip device of claim 1 , wherein the means for thermally contacting the side and transferring heat comprises a molded heat spreader positioned on and in thermal contact with the high generating area.

8. A semiconductor chip device, comprising:

a first semiconductor chip having a floor plan with a high heat producing area and a low heat producing area;

at least one second semiconductor chip stacked on the low heat producing area;

a dummy component mounted on the high heat producing area to transferring heat from the high heat producing area; and

a molding material at least partially encapsulating the dummy component and the at least one second semiconductor chip.

9. The semiconductor chip device of claim 8 , comprising a thermal interface material layer positioned between the dummy component and the first semiconductor chip.

10. The semiconductor chip device of claim 8 , wherein the high heat producing area comprises at least one processor core.

11. The semiconductor chip device of claim 8 , comprising at least one third semiconductor chip mounted on the at least one second semiconductor chip.

12. The semiconductor chip device of claim 11 , wherein the at least one second semiconductor chip and the at least one third semiconductor chip comprise memory chips.

13. The semiconductor chip device of claim 8 , wherein the first semiconductor chip floor plan includes another high heat producing area that has at least one processor core, the semiconductor chip device including another dummy component mounted on the another high heat producing area.

14. The semiconductor chip device of claim 8 , comprising a thermal interface material layer positioned between the dummy component and the first semiconductor chip.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 2, 2017
From: SHYVERS, PATRICK J.
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 043754/0689 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2017
From: WUU, JOHN; NAFFZIGER, SAMUEL
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 043403/0308 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2017
From: MYSORE, KAUSHIK; WILKERSON, BRETT P.
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 043403/0355 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2017
From: BHAGAVAT, MILIND S.
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 043403/0396 →
Continuity (1)
Related Publication 20190067152A1 · Feb 28, 2019
Cited By (4)
US 12,266,585 US 12,381,127 US 12,489,083 US 12,653,031