IP Library › Granted Patent US 10,205,088
Granted Patent B2
US 10,205,088 · App. 15/711,506 · Granted Feb 12, 2019

Magnetic memory

Inventors: Tomoyuki Sasaki (Tokyo, JP); Yohei Shiokawa (Tokyo, JP); Atsushi Tsumita (Tokyo, JP)
Assignee: TDK CORPORATION
H01L43/04G11C11/161G11C11/18H01L43/08H01L43/10H01L43/14G11C11/1659G11C11/1673G11C11/1675
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Quick Facts
Patent No.
US 10,205,088
App. No.
15/711,506
Granted
Feb 12, 2019
Kind
B2
Abstract

A magnetic memory including a plurality of magnetoresistance effect elements that hold information, each including a first ferromagnetic metal layer with a fixed magnetization direction, a second ferromagnetic metal layer with a varying magnetization direction, and a non-magnetic layer sandwiched between the first and second ferromagnetic metal layers; a plurality of first control elements that control reading of the information, wherein each of the plurality of first ferromagnetic metal layers is connected to a first control element; a plurality of spin-orbit torque wiring lines that extend in a second direction intersecting with a first direction which is a stacking direction of the magnetoresistance effect elements, wherein each of the second ferromagnetic metal layers is joined to one spin-orbit torque wiring line; a plurality of second control elements that control electric current flowing through the spin-orbit torque wiring lines.

Claims (29)

1. A magnetic memory comprising:

a plurality of magnetoresistance effect elements that hold information, each comprising a first ferromagnetic metal layer with a fixed magnetization direction, a second ferromagnetic metal layer with a varying magnetization direction, and a non-magnetic layer sandwiched between the first ferromagnetic metal layer and the second ferromagnetic metal layer;

a plurality of first control elements that control reading of the information, wherein each of the plurality of first ferromagnetic metal layers is connected to a first control element;

a plurality of spin-orbit torque wiring lines that extend in a second direction intersecting with a first direction which is a stacking direction of the magnetoresistance effect elements, wherein each of the second ferromagnetic metal layers is joined to one spin-orbit torque wiring line;

a plurality of second control elements that control electric current flowing through the spin-orbit torque wiring lines, wherein a first connection point in each of the spin-orbit torque wiring lines is connected to one second control element; and

a third control element that controls writing of the information, connected to a second connection point in each of the plurality of spin-orbit torque wiring lines.

2. A magnetic memory comprising:

a plurality of magnetoresistance effect elements that hold information, each comprising a first ferromagnetic metal layer with a fixed magnetization direction, a second ferromagnetic metal layer with a varying magnetization direction, and a non-magnetic layer sandwiched between the first ferromagnetic metal layer and the second ferromagnetic metal layer;

a first control element that controls reading of the information, connected to each of the plurality of first ferromagnetic metal layers;

a plurality of spin-orbit torque wiring lines that extend in a second direction intersecting with a first direction which is a stacking direction of the magnetoresistance effect elements, wherein each of the second ferromagnetic metal layers is joined to one spin-orbit torque wiring line;

a plurality of second control elements that control electric current flowing through the spin-orbit torque wiring lines, wherein a first connection point in each of the spin-orbit torque wiring lines is connected to one second control element; and

a plurality of third control elements that control writing of the information, wherein a second connection point in each of the spin-orbit torque wiring lines is connected to one third control element.

3. The magnetic memory according to claim 1 , wherein long axes of the magnetoresistance effect elements, on a surface perpendicular to the first direction, are oriented in the second direction.

4. The magnetic memory according to claim 2 , wherein long axes of the magnetoresistance effect elements, on a surface perpendicular to the first direction, are oriented in the second direction.

5. The magnetic memory according to claim 1 , wherein the first control elements and the second control elements are proximately arranged in a third direction intersecting with the first direction and the second direction.

6. The magnetic memory according to claim 2 , wherein the second control elements and the third control elements are proximately arranged in a third direction intersecting with the first direction and the second direction.

7. The magnetic memory according to claim 5 , wherein, in a spatial configuration that is necessary for storing one bit of the information, when a unit of a minimum processing size of length in a circuit configuration is defined as F, the length in the third direction is 8F.

8. The magnetic memory according to claim 6 , wherein, in a spatial configuration that is necessary for storing one bit of the information, when a unit of a minimum processing size of length in a circuit configuration is defined as F, the length in the third direction is 8F.

9. The magnetic memory according to claim 5 , wherein, in a spatial configuration that is necessary for storing one bit of the information, when a unit of a minimum processing size of length in a circuit configuration is defined as F, an area of a surface in the second direction and the third direction that is necessary for the circuit configuration is 16F 2 to 1056F 2 .

10. The magnetic memory according to claim 6 , wherein, in a spatial configuration that is necessary for storing one bit of the information, when a unit of a minimum processing size of length in a circuit configuration is defined as F, an area of a surface in the second direction and the third direction that is necessary for the circuit configuration is 16F 2 to 1056F 2 .

11. The magnetic memory according to claim 1 , wherein a maximum electric current flowing in the second control elements and the third control elements is greater than a maximum electric current flowing in the first control elements.

12. The magnetic memory according to claim 2 , wherein a maximum electric current flowing in the second control elements and the third control elements is greater than a maximum electric current flowing in the first control elements.

13. The magnetic memory according to claim 1 , wherein resistance values of the magnetoresistance effect elements are higher than the resistance values of spin-orbit torque wiring layers that are in contact with the magnetoresistance effect elements.

14. The magnetic memory according to claim 1 , wherein the resistances of the first control elements are lower than the resistances of the magnetoresistance effect elements.

15. The magnetic memory according to claim 1 , wherein the magnetoresistance effect elements are arranged at equidistant intervals in the second direction.

16. The magnetic memory according to claim 5 , wherein regions necessary for storing one bit of the information are proximately arranged at equidistant intervals in the second direction.

17. The magnetic memory according to claim 5 , wherein regions necessary for storing one bit of the information are proximately arranged at equidistant intervals in the third direction.

18. The magnetic memory according to claim 1 , wherein an insulating layer is provided so as to contact the magnetoresistance effect elements, and magnetic-field-providing wiring is provided so as to apply, from across the insulating layer, a magnetic field in a direction perpendicular to the magnetization direction of the magnetoresistance effect elements.

19. The magnetic memory according to claim 2 , wherein an insulating layer is provided so as to contact the magnetoresistance effect elements, and magnetic-field-providing wiring is provided so as to apply, from across the insulating layer, a magnetic field in a direction perpendicular to the magnetization direction of the magnetoresistance effect elements.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 21, 2017
From: SASAKI, TOMOYUKI; SHIOKAWA, YOHEI; TSUMITA, ATSUSHI
To: TDK CORPORATION
Reel/Frame 043655/0643 →
Priority Claims (2)
JP 2016-210535 · Oct 27, 2016 · national
JP 2017-138387 · Jul 14, 2017 · national
Continuity (1)
Related Publication 20180123022A1 · May 3, 2018
Cited By (4)
US 12,336,189 US 12,532,669 US 12,548,612 US 12,563,741