IP Library › Granted Patent US 12,336,189
Granted Patent B2
US 12,336,189 · App. 17/520,216 · Granted Jun 17, 2025

Magnetic array and method for manufacturing magnetic array

Inventors: Tomoyuki Sasaki (Tokyo, JP); Yohei Shiokawa (Tokyo, JP)
Assignee: TDK CORPORATION
H10B61/22G11C11/161G11C11/1673H10N50/01H10N50/80G11C11/1675
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Quick Facts
Patent No.
US 12,336,189
App. No.
17/520,216
Granted
Jun 17, 2025
Kind
B2
Abstract

This magnetic array includes a substrate, a first unit, a second unit, a word line, a first read line, a second read line, a first gate line, a second gate line, and a source line. Each of the units includes a magnetoresistance effect element, a first switching element, and a second switching element. The magnetoresistance effect element includes a laminate and a wiring provided on the laminate. The first switching element is connected to a reference layer of the laminate. The second switching element is connected to the wiring. Each of the read lines is connected to the first switching element. The word line is connected to the second switching element. The gate lines are respectively connected to the first switching element and the second switching element of different units. The source line is connected to the wiring.

Claims (46)

1. A magnetic array comprising:

a substrate;

a first unit;

a second unit;

a word line;

a first read line;

a second read line;

a first gate line;

a second gate line; and

a source line,

wherein each of the first unit and the second unit includes a magnetoresistance effect element, a first switching element, and a second switching element,

wherein the magnetoresistance effect element includes a laminate and a wiring provided on the laminate,

wherein the laminate includes at least a reference layer and a non-magnetic layer in order from a substrate side,

wherein the first switching element of the first unit is connected to the reference layer of the first unit and the first switching element of the second unit is connected to the reference layer of the second unit,

wherein the second switching element of the first unit is connected to the wiring of the first unit, and the second switching element of the second unit is connected to the wiring of the second unit,

wherein the first read line is connected to the first switching element of the first unit, the first read line being configured to conduct a read current when data is read from the magnetoresistance effect element,

wherein the second read line is connected to the first switching element of the second unit, the second read line being configured to conduct the read current when data is read from the magnetoresistance effect element,

wherein the word line is connected to the second switching elements of the first unit and the second unit, the word line being configured to conduct a write current when data is written to the magnetoresistance effect element,

wherein the first gate line is connected to a gate of the first switching element of the first unit and a gate of the second switching element of the second unit, the first gate line being configured to control ON/OFF operation of the first switching element and the second switching element,

wherein the second gate line is connected to a gate of the second switching element of the first unit and a gate of the first switching element of the second unit, the second gate line being configured to control ON/OFF operation of the first switching element and the second switching element, and

wherein the source line is connected to the wiring of the first unit and the wiring of the second unit, the source line being configured to conduct the read current and the write current.

2. The magnetic array according to claim 1 further comprising:

a comparison unit that is connected to the first read line and the second read line.

3. The magnetic array according to claim 1 ,

wherein a width of the gate of the first switching element is narrower than a width of the gate of the second switching element.

4. The magnetic array according to claim 1 ,

wherein the first switching element of the first unit and the second switching element of the second unit are adjacent to each other, and

wherein the second switching element of the first unit and the first switching element of the second unit are adjacent to each other.

5. The magnetic array according to claim 1 further comprising:

an insulating layer that covers a lateral side surface of the laminate; and

a first electrode and a second electrode that are provided on the insulating layer,

wherein the first electrode and the second electrode are electrically connected to each other via the wiring.

6. The magnetic array according to claim 5 ,

wherein each of the first electrode and the second electrode includes an underlayer which comes into contact with the wiring.

7. The magnetic array according to claim 6 ,

wherein the underlayer includes the same material as the wiring.

8. The magnetic array according to claim 5 further comprising:

a first via wiring that is connected to the first electrode; and

a second via wiring that is connected to the second electrode,

wherein the first via wiring is provided on an inward side of the first electrode or comes into contact with a lateral side surface of the first electrode, and

wherein the second via wiring is provided on an inward side of the second electrode or comes into contact with a lateral side surface of the second electrode.

9. The magnetic array according to claim 1 ,

wherein the laminate includes—the reference layer, the non-magnetic layer, and a free layer in order from a substrate side.

10. The magnetic array according to claim 1 ,

wherein the wiring includes a magnetic layer internally including a magnetic domain wall, and

wherein the laminate consists of the reference layer and the non-magnetic layer in order from a substrate side.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2021
From: SASAKI, TOMOYUKI; SHIOKAWA, YOHEI
To: TDK CORPORATION
Reel/Frame 058034/0701 →
Priority Claims (1)
JP 2020-199587 · Dec 1, 2020 · national
Continuity (1)
Related Publication 20220173162A1 · Jun 2, 2022
References Cited (61)
US 8350347B2 · Gaudin et al. · 2013 [cited by applicant]
US 10205088B2 · Sasaki et al. · 2019 [cited by applicant]
US 10490735B2 · Sasaki · 2019 [cited by applicant]
US 10608169B2 · Kim · 2020 [cited by examiner]
US 20010008289A1 · Hahn · 2001 [cited by applicant]
US 20060056223A1 · Ditewig et al. · 2006 [cited by applicant]
US 20110129691A1 · Ishiwata et al. · 2011 [cited by applicant]
US 20120020152A1 · Gaudin et al. · 2012 [cited by applicant]
US 20130026585A1 · Sung et al. · 2013 [cited by applicant]
US 20140017077A1 · Lin · 2014 [cited by applicant]
US 20140056060A1 · Khvalkovskiy et al. · 2014 [cited by applicant]
US 20150129995A1 · Wang et al. · 2015 [cited by applicant]
US 20150248932A1 · Yi · 2015 [cited by examiner]
US 20150348606A1 · Buhrman et al. · 2015 [cited by applicant]
US 20160020207A1 · Tsuchiya et al. · 2016 [cited by applicant]
US 20160021468A1 · Karunasiri et al. · 2016 [cited by applicant]
US 20160225982A1 · Guo · 2016 [cited by examiner]
US 20160359105A1 · Sandhu et al. · 2016 [cited by applicant]
US 20170076769A1 · Shirotori · 2017 [cited by examiner]
US 20170117323A1 · Braganca et al. · 2017 [cited by applicant]
US 20170222135A1 · Fukami et al. · 2017 [cited by applicant]
US 20180083065A1 · Endo · 2018 [cited by examiner]
US 20180158588A1 · Manipatruni et al. · 2018 [cited by applicant]
US 20190051820A1 · Sugiyama et al. · 2019 [cited by applicant]
US 20190189516A1 · Sasaki et al. · 2019 [cited by applicant]
US 20200161542A1 · Ahn · 2020 [cited by examiner]
US 20200212104A1 · Sonobe · 2020 [cited by applicant]
US 20200341079A1 · Swerts et al. · 2020 [cited by applicant]
US 20220310146A1 · Xing · 2022 [cited by examiner]
JP 2005526351A · 2005 [cited by applicant]
JP 2014045196A · 2014 [cited by applicant]
JP 5441005B2 · 2014 [cited by applicant]
JP 2016021530A · 2016 [cited by applicant]
JP 2017059594A · 2017 [cited by applicant]
JP 2017216286A · 2017 [cited by applicant]
JP 2019033166A · 2019 [cited by applicant]
JP 6620915B1 · 2019 [cited by applicant]
JP 2020107790A · 2020 [cited by applicant]
WO 2015041934A1 · 2015 [cited by applicant]
WO 2015200003A1 · 2015 [cited by applicant]
WO 2016021468A1 · 2016 [cited by applicant]
WO 2017052494A1 · 2017 [cited by applicant]
WO 2018189964A1 · 2018 [cited by applicant]
WO 2019171715A1 · 2019 [cited by applicant]
Y.K.Kato et al. “Observation of the Spin Hal Effect in Semiconductors”. Science, 2004, vol. 306, pp. 1910-1913. [cited by applicant]
I.M. Miron et al. “Perpendicular Switching of a Single Ferromagnetic Layer Induced By In-Plane Current Injection”. Nature, 2011, vol. 476, pp. 189-194. [cited by applicant]
Luqiao Liu et al. “Spin Torque Switching With the Giant Spin Hall Effect of Tantalum”. Science, 2012, vol. 336, pp. 555. [cited by applicant]
Luqiao Liu et al. “Current-Induced Switching of Perpendicularly Magnetized Magnetic Layers Using Spin Torque From the Spin Hall Effect”. Physical Review Letters, 2012, vol. 109, pp. 096602. [cited by applicant]
Ki-Seung Lee et al. “Threshold Current for Switching of a Perpendicular Magnetic Layer Induced By Spin Hall Effect”. Applied Physics Letters, 2013, vol. 102, pp. 112410. [cited by applicant]
Ki-Seung Lee et al. “Thermally Activated Switching of Perpendicular Magnet By Spin-Orbit Spin Torque”. Applied Physics Letters, 2014, vol. 104, pp. 072413. [cited by applicant]
Shunsuke Fukami et al. “Magnetization Switching By Spin-Orbit Torque in an Antiferromagnet-Ferromagnet Bilayer System”. Nature Materials, 2016, vol. 15, pp. 535-542. [cited by applicant]
S. Fukami et al. “A Spin-Orbit Torque Switching Scheme With Collinear Magnetic Easy Axis and Current Configuration”. Nature Nanotechnology, 2016. [cited by applicant]
S. Takahashi et al. “Spin Injection and Detection in Magnetic Nanostructures”. Physical Review 3, 2003, vol. 67, pp. 052409. [cited by applicant]
Yeongkyo Seo et al. “Area-Efficient Sot-Mram With a Schottky Diode”. IEEE Electron Device Letters, 2016, vol. 37, No. 8, pp. 982-985. [cited by applicant]
Wei Zhang et al. “Spin Hall Effects in Metallic Antiferromagnets”. Physical Review Letters, 2014, vol. 113, pp. 196602. [cited by applicant]
H. Sato et al. “Perpendicular-Anisotropy CoFeB—MgO Magnetic Tunnel Junctions With A MgO/CoFeB/Ta/CoFeB/MgO Recording Structure”. Applied Physics Letters, 2012, vol. 101, pp. 022414. [cited by applicant]
Luqiao Liu et al. “Magnetic Oscillations Driven By the Spin Hall Effect in 3-Terminal Magnetic Tunnel Junction Devices”. Physical Review Letters, 2012, vol. 109, pp. 186602. [cited by applicant]
Takashi Kimura et al. “Electrical Control of the Direction of Spin Accumulation”. Physical Review Letters, 2007, vol. 99, pp. 166601. [cited by applicant]
Guoqiang Yu et al. “Switching of Perpendicular Magnetization by Spin-Orbit Torques in the Absence of External Magnetic Fields”. Nature Nanotechnology, 2014, vol. 9, pp. 548-554. [cited by applicant]
Yeongkyo Seo et al. “High-Density Sot-MRAM Based on Shared Bitline Structure”. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2018, vol. 26, No. 8, pp. 1600-1603. [cited by applicant]
Translation of Oct. 18, 2022 Office Action issued in Taiwanese Patent Application No. 110143740. [cited by applicant]
Cited By (1)
US 12,738,306