Methods for chemical mechanical polishing (CMP) processing with ozone
A polymer layer on a substrate may be treated with ozone gas or with deionized water and ozone gas to increase a removal rate of the polymer layer in a chemical mechanical polishing (CMP) process. The ozone gas may be diffused directly into the polymer layer or through a thin layer of deionized water on the surface of the polymer layer and into the polymer layer. The deionized water may also be heated during the process to further enhance the diffusion of the ozone gas into the polymer layer.
1. A method of planarizing a semiconductor substrate, comprising:
treating at least a portion of a polymer layer on a substrate by diffusing a gas into at least a portion of a thickness of the polymer layer such that a removal rate by a chemical mechanical polishing (CMP) process is at least approximately 150% of a removal rate of an untreated polymer layer.
2. The method of claim 1 , further comprising:
treating the at least a portion of the polymer layer by exposing the at least a portion of the polymer layer to an ozone gas.
3. The method of claim 2 , further comprising:
exposing the at least a portion of the polymer layer to the ozone gas up to approximately 60 minutes.
4. The method of claim 2 , further comprising:
concentrating the ozone gas up to approximately 300,000 ppm.
5. The method of claim 2 , further comprising:
flowing the ozone gas at a rate up to approximately 10 slpm.
6. The method of claim 2 , further comprising:
pressurizing the ozone gas up to approximately 100 psi.
7. The method of claim 2 , further comprising:
flowing deionized water on the at least a portion of the polymer layer while exposing the at least a portion of the polymer layer to the ozone gas.
8. The method of claim 7 , further comprising:
rotating the substrate on a central axis of the substrate at a rate of approximately 400 rpm to approximately 1500 rpm.
9. The method of claim 7 , further comprising:
heating the deionized water to a temperature of approximately 25 degrees Celsius to approximately 100 degrees Celsius.
10. The method of claim 7 , further comprising:
flowing the deionized water onto the at least a portion of the polymer layer at a flow rate up to approximately 400 milliliters per minute.
11. The method of claim 7 , further comprising:
treating the at least a portion of the polymer layer on the substrate by diffusing the ozone gas into the at least a portion of the thickness of the polymer layer such that a removal rate by a chemical mechanical polishing (CMP) process is at least approximately 600% of a removal rate of an untreated polymer layer.
12. A method of planarizing a semiconductor substrate, comprising:
treating a polyimide layer on a substrate, comprising:
flowing deionized water over a top surface of the polyimide layer;
spinning the substrate on a central axis of the substrate to form a boundary layer of deionized water on the top surface of the polyimide layer;
flowing ozone gas with a gas concentration up to approximately 300,000 ppm over a top surface of the boundary layer to diffuse the ozone gas through the boundary layer and into the polyimide layer; and
removing material from the polyimide layer with a chemical mechanical polishing (CMP) process, wherein a removal rate of a treated polyimide layer is at least approximately 150% of a removal rate of an untreated polyimide layer.
13. The method of claim 12 , further comprising:
pressurizing the ozone gas up to approximately 100 psi.
14. The method of claim 12 , further comprising:
flowing the ozone gas at a rate up to approximately 10 slpm.
15. The method of claim 12 , further comprising:
spinning the substrate at a rate of approximately 400 rpm to approximately 1500 rpm.
16. The method of claim 12 , further comprising:
heating the deionized water to a temperature of approximately 25 degrees Celsius to approximately 100 degrees Celsius.
17. The method of claim 12 , further comprising:
flowing the deionized water at a flow rate of up to approximately 400 milliliters per minute.
18. The method of claim 12 , further comprising:
removing material from the polyimide layer with the CMP process, wherein a removal rate of a treated polyimide layer is at least approximately 600% of a removal rate of an untreated polyimide layer.
19. The method of claim 12 , further comprising:
treating the polyimide layer for up to approximately 60 minutes.
20. A method of planarizing a substrate, comprising:
flowing deionized water over a top surface of a polyimide layer at a temperature of approximately 25 degrees Celsius to approximately 100 degrees Celsius;
spinning the substrate on a central axis of the substrate at a rate of approximately 400 rpm to approximately 1500 rpm to form a boundary layer of deionized water on the top surface of the polyimide layer; and
flowing ozone gas with a gas concentration up to approximately 300,000 ppm at a pressure up to approximately 100 psi over a top surface of the boundary layer to diffuse the ozone gas through the boundary layer and into the polyimide layer.