IP Library Granted Patent US 10,534,554
Granted Patent B2
US 10,534,554 · App. 15/784,025 · Granted Jan 14, 2020

Anti-hacking mechanisms for flash memory device

Inventors: Hieu Van Tran (San Jose, CA); Vipin Tiwari (Dublin, CA); Nhan Do (Saratoga, CA)
Assignee: SILICON STORAGE TECHNOLOGY, INC.
G06F3/0622G06F3/0637G06F3/0679G06F11/073G06F11/0754G06F11/0793G11C16/0408G11C16/08G11C16/10G11C16/26G11C16/3422H01L21/78H01L27/11521H01L29/42328H01L23/576
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Quick Facts
Patent No.
US 10,534,554
App. No.
15/784,025
Granted
Jan 14, 2020
Kind
B2
Abstract

Apparatus, and an associated method, for enhancing security and preventing hacking of a flash memory device. The apparatus and method use a random number to offset the read or write address in a memory cell. The random number is generated by determining the leakage current of memory cells. In another embodiment, random data can be written or read in parallel to thwart hackers from determining contents of data being written or read by monitoring sense amplifiers.

Claims (19)

1. A flash memory system, comprising:

an array comprising a first plurality of flash memory cells, a second plurality of flash memory cells, and a third plurality of flash memory cells;

control circuitry for generating a random number based on the third plurality of flash memory cells; and

decoding circuitry for receiving an address, wherein if the address corresponds to the first plurality of flash memory cells, the decoding circuitry, without performing a scrambling function, activates a row and column corresponding to the address for a read or program operation, and wherein if the address corresponds to the second plurality of flash memory cells, the decoding circuitry performs a scrambling function on the address utilizing the random number to generate a scrambled address and activates a row and column corresponding to the scrambled address for a read or program operation.

2. The flash memory system of claim 1 , wherein the control circuitry derives the random number from leakage current in the third plurality of flash memory cells.

3. The flash memory system of claim 2 , wherein the scrambled address is determined by applying the random number as an offset to the address.

4. The flash memory system of claim 1 , wherein the control circuitry derives the random number from current resulting from a fixed program or erase voltage for the third plurality of flash memory cells.

5. The flash memory system of claim 4 , wherein the scrambled address is determined by applying the random number as an offset to the address.

6. The flash memory system of claim 1 , wherein the first plurality of flash memory cells, the second plurality of flash memory cells, and the third plurality of flash memory cells are split gate flash memory cells.

7. A method of accessing a first plurality of flash memory cells, a second plurality of flash memory cells, and a third plurality of flash memory cells in an array of flash memory cells, comprising:

generating, by control circuitry, a random number based on the third plurality of flash memory cells;

receiving, by decoding circuitry, an address;

if the address corresponds to the first plurality of flash memory cells, without performing a scrambling function, activating a row and column corresponding to the address and performing a read or program operation at the address; and

if the address corresponds to the second plurality of flash memory cells, performing a scrambling function on the address utilizing the random number to generate a scrambled address and activating a row and column corresponding to the scrambled address and performing a read or program operation at the scrambled address.

8. The method of claim 7 , wherein the control circuitry derives the random number from leakage current in the third plurality of flash memory cells.

9. The method of claim 8 , wherein the scrambled address is generated by applying the random number as an offset to the address.

10. The method of claim 7 , wherein the control circuitry derives the random number from current resulting from a fixed program or erase voltage for the third plurality of flash memory cells.

11. The method of claim 10 , wherein the scrambled address is generated by applying the random number as an offset to the address.

12. The method of claim 7 , wherein the first plurality of flash memory cells, the second plurality of flash memory cells, and the third plurality of flash memory cells are split gate flash memory cells.

Assignments (13)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2018
From: TRAN, HIEU VAN; TIWARI, VIPIN; DO, NHAN
To: SILICON STORATE TECHNOLOGY, INC.
Reel/Frame 044750/0079 →
Continuity (1)
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