IP Library Granted Patent US 10,170,302
Granted Patent B2
US 10,170,302 · App. 15/847,250 · Granted Jan 1, 2019

Superlattice lateral bipolar junction transistor

Inventors: Karthik Balakrishnan (White Plains, NY); Stephen W. Bedell (Wrappingers Falls, NY); Pouya Hashemi (White Plains, NY); Bahman Hekmatshoartabari (White Plains, NY); Alexander Reznicek (Troy, NY)
Assignee: International Business Machines Corporation
H01L21/02507H01L29/1008H01L29/155H01L29/165H01L29/66242H01L29/735H01L21/8249H01L29/06H01L29/0808H01L29/0821H01L29/42304H01L29/6625H01L29/66234H01L29/66265H01L29/7317
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Quick Facts
Patent No.
US 10,170,302
App. No.
15/847,250
Granted
Jan 1, 2019
Kind
B2
Abstract

A bipolar junction transistor includes an intrinsic base formed on a substrate. The intrinsic base includes a superlattice stack including a plurality of alternating layers of semiconductor material. A collector and emitter are formed adjacent to the intrinsic base on opposite sides of the base. An extrinsic base structure is formed on the intrinsic base.

Claims (12)

1. A method for forming a bipolar junction transistor, comprising:

patterning an extrinsic base on a superlattice stack including a plurality of alternating layers of semiconductor material on a substrate;

etching an intrinsic base in the superlattice stack; and

growing a collector and emitter adjacent to the intrinsic base on opposite sides of the intrinsic base.

2. The method as recited in claim 1 , wherein the superlattice stack includes alternating layers of Si and Ge.

3. The method as recited in claim 1 , wherein the superlattice stack is deposited on a strained semiconductor layer.

4. The method as recited in claim 3 , further comprising adjusting a mass variance to increase thermal conductivity of the strained semiconductor layer by isotope enrichment of the strained semiconductor layer.

5. The method as recited in claim 1 , further comprising adjusting a mass variance to increase thermal conductivity of the superlattice stack by isotope enrichment of the superlattice stack.

6. The method as recited in claim 1 , wherein the superlattice stack includes alternating materials in the alternating layers.

7. The method as recited in claim 1 , wherein the substrate is an extremely thin semiconductor-on-insulator (ETSOI) substrate.

8. The method as recited in claim 7 , wherein a semiconductor layer of the ETSOI substrate forms a layer of the superlattice stack.

9. The method as recited in claim 1 , wherein the alternating layers are lattice mismatched to each other.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 13, 2020
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: ELPIS TECHNOLOGIES INC.
Reel/Frame 052644/0868 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2017
From: BALAKRISHNAN, KARTHIK; BEDELL, STEPHEN W.; HASHEMI, POUYA; HEKMATSHOARTABARI, BAHMAN; REZNICEK, ALEXANDER
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 044439/0351 →
Continuity (3)
Continuation 15584851 · May 2, 2017
Division 14978430 · Dec 22, 2015
Related Publication 20180122925A1 · May 3, 2018