Magnet mounting apparatus for MTJ device testers

1. A magnet mounting apparatus comprising:

a wafer test magnet;

a first frame element configured for mounting to an Automated Test Equipment (ATE);

a second frame element coupled to the wafer test magnet;

a pneumatic cylinder coupled between the first frame element and the second frame element, the pneumatic cylinder configured to move the wafer test magnet coupled to the second frame element between a first position and a second position, wherein the first position is a predetermined distance from a Device Under Test (DUT) wafer for use in testing of the DUT wafer and the second position for changing a probe card;

a third frame element; and

a set of fourth frame elements fixedly coupled between the first frame element and the third frame element, the set of fourth frame elements configured to guide the second frame element between the first position and the second position when the wafer test magnet coupled to the second frame element is moved by the pneumatic cylinder between the first position and the second position.

2. The magnet mounting apparatus of claim 1 , further comprising:

a controller configured for actuating the pneumatic cylinder to move the wafer test magnet between the first position and the second position.

3. The magnet mounting apparatus of claim 2 , wherein the controller is user operable.

4. The magnet mounting apparatus of claim 2 , wherein the controller is operable by the ATE.

5. The magnet mounting apparatus of claim 1 , further comprising:

one or more stepper motors coupled between the wafer test magnet and the second frame element, the one or more stepper motors configured to control displacement of the wafer test magnet along one or more axis.

6. The magnet mounting apparatus of claim 1 , wherein the DUT wafer comprises a wafer of Magnetic Tunnel Junction (MTJ) devices.

7. A magnet mounting apparatus comprising:

a cage configured for mounting to a test fixture, the cage including a top cage frame, a base cage frame and a set of guide rods fixedly coupled between the base cage frame and the top cage frame;

a magnet carriage configured for coupling to a wafer test magnet;

a first actuator coupled between the cage and the magnet carriage, the first actuator configured to move the magnet carriage between a first position and a second position along a z-axis, the first position configured for locating the wafer test magnet within a predetermined proximity to a Device Under Test (DUT) wafer and the second position can be configured for replacing a probe card; and

wherein the magnet carriage is movably coupled to the set of guide rods and wherein the set of guide rods are configured to guide the magnet carriage between the first position and the second position.

8. The magnet mounting apparatus of claim 7 , further comprising:

the magnet carriage including a top carriage frame, a bottom carriage frame, and a set of spacers fixedly coupled between the top carriage frame and the bottom carriage frame; and

wherein the first actuator is coupled between the top carriage frame and the base cage frame, and the top carriage frame is configured for coupling to the wafer test magnet.

9. The magnet mounting apparatus of claim 7 , further comprising:

a controller configured for actuating the first actuator to move the magnet carriage between the first position and the second position.

10. The magnet mounting apparatus of claim 7 , wherein the first actuator comprises a pneumatic cylinder.

11. The magnet mounting apparatus of claim 7 , further comprising:

a second actuator coupled to the magnet carriage and configured to control a displacement of the wafer test magnet along an x-axis; and

a third actuator coupled to the magnet carriage and configured to control a displacement of the wafer test magnet along a y-axis.

12. The magnet mounting apparatus of claim 11 , further comprising:

a fourth actuator coupled to the magnet carriage and configured to further control a displacement of the wafer test magnet along the z-axis.

13. The magnet mounting apparatus of claim 12 , wherein the second, third and fourth actuators comprise stepper motors.

14. A method of testing Magnetic Tunnel Junction (MTJ) devices on Device Under Test (DUT) wafers comprising:

moving a wafer test magnet coupled to a carriage, using a first actuator coupled between the carriage and a cage, into a first position for testing of a Device Under Test (DUT) wafer;

moving, using the first actuator, the wafer test magnet into a second position;

replacing a probe card while the wafer test magnet is in the second position;

moving, using the first actuator, the wafer test magnet into the first position, after replacing the probe card, for testing of another DUT wafer; and

guiding, using a set of cage guide rods fixedly coupled between a to and bottom of the cage, the carriage with the coupled wafer test magnet between the first position and the second position, wherein the carriage is moveably coupled to the cage guide rods of the cage.

15. The method according to claim 14 , further comprising:

registering, using the first actuator, the wafer test magnet in the first position, wherein the first position is within a predetermined proximity to a wafer chuck during a setup stage.

16. The method according to claim 15 , wherein registering the wafer test magnet in the first position further comprises:

registering the wafer test magnet along an x-axis for the first position using a second actuator coupled between the carriage and the wafer test magnet;

registering the wafer test magnet along a y-axis for the first position using a third actuator coupled between the carriage and the wafer test magnet; and

registering the wafer test magnet along a z-axis for the first position using a fourth actuator between the carriage and the wafer test magnet.

17. The method according to claim 16 , wherein,

the first actuator includes a pneumatic cylinder; and

the second, third and fourth actuator include stepper motors.

18. The method according to claim 14 , wherein the DUT wafers comprise wafers of Magnetic Tunnel Junction (MTJ) devices.