IP Library Assignment 056927/0038
Patent Assignment
Reel/Frame 056927/0038

Assignment of Assignor's Interest

Recorded: 2021-07-20 Pages: 40
Assignor
SPIN MEMORY, INC.
Executed: 2021-06-25
Assignee
SPIN (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
3945 FREEDOM CIRCLE, SUITE 560, SANTA CLARA, CALIFORNIA, 95054
Covered Properties (212)
Method for Manufacturing Mtj Memory Device
Patent: 9,263,667 →
Application: 14/341,185 →
Publication: US 2016/0027999
Magnetic Tunnel Junction Structure for Mram Device
Patent: 9,337,412 →
Application: 14/492,943 →
Publication: US 2016/0087193
Precessional Spin Current Structure for Mram
Patent: 9,853,206 →
Application: 14/814,036 →
Publication: US 2016/0372656
Spin Transfer Torque Structure for Mram Devices Having a Spin Current Injection Capping Layer
Patent: 9,728,712 →
Application: 14/866,359 →
Publication: US 2016/0315249
Method for Manufacturing Mtj Memory Device
Patent: 9,406,876 →
Application: 15/041,325 →
Publication: US 2016/0163973
High Annealing Temperature Perpendicular Magnetic Anisotropy Structure for Magnetic Random Access Memory
Application: 15/091,853 →
Publication: US 2016/0315118
Polishing Stop Layer(S) for Processing Arrays of Semiconductor Elements
Patent: 9,773,974 →
Application: 15/097,576 →
Publication: US 2017/0033283
Spin Transfer Torque Mram Device with Error Buffer
Application: 15/132,544 →
Memory Cell Having Magnetic Tunnel Junction and Thermal Stability Enhancement Layer
Patent: 9,741,926 →
Application: 15/157,783 →
Publication: US 2017/0222132
Method and Apparatus for Bipolar Memory Write-Verify
Application: 15/174,482 →
Publication: US 2017/0047107
Device with Dynamic Redundancy Registers
Application: 15/277,799 →
Publication: US 2018/0090226
Precessional Spin Current Structure with High in-Plane Magnetization for Mram
Application: 15/445,260 →
Publication: US 2018/0248113
Precessional Spin Current Structure with Non-Magnetic Insertion Layer for Mram
Application: 15/445,362 →
Publication: US 2018/0248110
Mram with Reduced Stray Magnetic Fields
Application: 15/634,629 →
Memory Cell Having Magnetic Tunnel Junction and Thermal Stability Enhancement Layer
Application: 15/656,398 →
Publication: US 2017/0324029
Spin Transfer Torque Structure for Mram Devices Having a Spin Current Injection Capping Layer
Application: 15/657,498 →
Publication: US 2017/0331033
Polishing Stop Layer(S) for Processing Arrays of Semiconductor Elements
Application: 15/674,620 →
Publication: US 2017/0346002
Method and Apparatus for Bipolar Memory Write-Verify
Application: 15/691,577 →
Publication: US 2017/0365317
On-The-Fly Bit Failure Detection and Bit Redundancy Remapping Techniques to Correct for Fixed Bit Defects
Application: 15/792,672 →
Publication: US 2019/0122746
Precessional Spin Current Structure for Mram
Application: 15/794,871 →
Publication: US 2018/0047894
Method of Reading Data from a Memory Device Using Multiple Levels of Dynamic Redundancy Registers
Application: 15/849,404 →
Publication: US 2018/0114589
A Memory Device Using Levels of Dynamic Redundancy Registers for Writing a Data Word That Failed a Write Operation
Application: 15/849,457 →
Publication: US 2018/0114590
Predicting Tunnel Barrier Endurance Using Redundant Memory Structures
Application: 15/851,593 →
A Method of Processing Incomplete Memory Operations in a Memory Device During a Power Up Sequence and a Power Down Sequence Using a Dynamic Redundancy Register
Application: 15/855,263 →
Publication: US 2018/0121117
Method of Flushing the Contents of a Dynamic Redundancy Register to a Secure Storage Area During a Power Down in a Memory Device
Application: 15/855,431 →
Publication: US 2018/0121355
Method of Writing Contents in Memory During a Power Up Sequence Using a Dynamic Redundancy Register in a Memory Device
Application: 15/855,589 →
Publication: US 2018/0122447
Shared Bit Line Array Architecture for Magnetoresistive Memory
Application: 15/855,660 →
Publication: US 2019/0198078
Memory Instruction Pipeline with a Pre-Read Stage for a Write Operation for Reducing Power Consumption in a Memory Device That Uses Dynamic Redundancy Registers
Application: 15/855,707 →
Publication: US 2018/0122448
Magnetic Field Transducer Mounting Apparatus for MTJ Device Testers
Application: 15/855,757 →
Publication: US 2019/0195914
Magnet Mounting Apparatus for MTJ Device Testers
Application: 15/855,799 →
Publication: US 2019/0195944
Memory Instruction Pipeline with an Additional Write Stage in a Memory Device That Uses Dynamic Redundancy Registers
Application: 15/855,811 →
Publication: US 2018/0122449
Smart Cache Design to Prevent Overflow for a Memory Device with a Dynamic Redundancy Register
Application: 15/855,855 →
Publication: US 2018/0122450
Forcing Bits as Bad to Widen the Window Between the Distributions of Acceptable High and Low Resistive Bits Thereby Lowering the Margin and Increasing the Speed of the Sense Amplifiers
Application: 15/855,866 →
Publication: US 2019/0121692
Forcing Stuck Bits, Waterfall Bits, Shunt Bits and Low Tmr Bits to Short During Testing and Using on-the-Fly Bit Failure Detection and Bit Redundancy Remapping Techniques to Correct Them
Application: 15/855,886 →
Publication: US 2019/0121693
Memory Device with a Plurality of Memory Banks Where Each Memory Bank Is Associated with a Corresponding Memory Instruction Pipeline and a Dynamic Redundancy Register
Application: 15/855,907 →
Publication: US 2018/0121361
Over-Voltage Write Operation of Tunnel Magnet-Resistance ("Tmr") Memory Device and Correcting Failure Bits Therefrom by Using on-the-Fly Bit Failure Detection and Bit Redundancy Remapping Techniques
Application: 15/855,910 →
Publication: US 2019/0121694
Memory Device with a Dual Y-Multiplexer Structure for Performing Two Simultaneous Operations on the Same Row of a Memory Bank
Application: 15/855,948 →
Publication: US 2018/0122446
Steep Slope Field-Effect Transistor (Fet) for a Perpendicular Magnetic Tunnel Junction (Pmtj)
Application: 15/855,953 →
Perpendicular Source and Bit Lines for an Mram Array
Application: 15/857,220 →
Publication: US 2019/0206470
Memory Array with Horizontal Source Line and a Virtual Source Line
Application: 15/857,241 →
Publication: US 2019/0206471
Memory Array with Horizontal Source Line and Sacrificial Bitline Per Virtual Source
Application: 15/857,264 →
Publication: US 2019/0206473
Memory Array with Individually Trimmable Sense Amplifiers
Application: 15/857,296 →
Publication: US 2019/0206467
Process for Improving Photoresist Pillar Adhesion During Mram Fabrication
Application: 15/857,318 →
Publication: US 2019/0207100
Process for Hard Mask Development for Mram Pillar Formation Using Photolithography
Application: 15/857,351 →
Publication: US 2019/0207080
Fabrication Methods of Forming Cylindrical Vertical Si Etched Channel 3D Switching Devices
Application: 15/857,358 →
Publication: US 2019/0207081
Process for Creating Dense Pillars Using Multiple Exposures for Mram Fabrication
Application: 15/857,382 →
Publication: US 2019/0207082
Methods of Forming Perpendicular Magnetic Tunnel Junction Memory Cells Having Vertical Channels
Application: 15/857,387 →
Publication: US 2019/0206716
Cylindrical Vertical Si Etched Channel 3D Switching Devices
Application: 15/857,430 →
Publication: US 2019/0206461
Three-Dimensional Magnetic Memory Devices
Application: 15/857,574 →
Publication: US 2019/0206931
Multi-Port Random Access Memory
Application: 15/858,398 →
Publication: US 2019/0206468
Methods of Fabricating Three-Dimensional Magnetic Memory Devices
Application: 15/858,765 →
Publication: US 2019/0207102
Spin Hall Effect (SHE) Assisted Three-Dimensional Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM)
Application: 15/858,808 →
Publication: US 2019/0207084
Ac Current Pre-Charge Write-Assist in Orthogonal Stt-Mram
Application: 15/858,950 →
Publication: US 2019/0206462
Self-Generating Ac Current Assist in Orthogonal Stt-Mram
Application: 15/858,988 →
Shared Oscillator (Stno) for Mram Array Write-Assist in Orthogonal Stt-Mram
Application: 15/859,015 →
Ac Current Write-Assist in Orthogonal Stt-Mram
Application: 15/859,030 →
Perpendicular Magnetic Tunnel Junction Memory Cells Having Shared Source Contacts
Application: 15/859,040 →
Publication: US 2019/0206463
Three-Terminal Mram with Ac Write-Assist for Low Read Disturb
Application: 15/859,047 →
Method of Making a Three Dimensional Perpendicular Magnetic Tunnel Junction with Thin-Film Transistor
Application: 15/859,070 →
Publication: US 2019/0206932
Flexible Substrate for Use with a Perpendicular Magnetic Tunnel Junction (Pmtj)
Application: 15/859,074 →
Publication: US 2019/0206933
Three Dimensional Perpendicular Magnetic Junction with Thin-Film Transistor
Application: 15/859,114 →
Publication: US 2019/0206934
Magnetic Tunnel Junction (Mtj) Fabrication Methods and Systems
Application: 15/859,133 →
Publication: US 2019/0207103
Vertical Steep-Slope Field-Effect Transistor (I-MOSFET) with Offset Gate Electrode for Driving a Perpendicular Magnetic Tunnel Junction (PMTJ)
Application: 15/859,139 →
Publication: US 2019/0206935
Magnetic Memory having a Pinning Synthetic Antiferromagnetic Structure (SAF) with Cobalt over Platinum (Pt/Co) Bilayers
Application: 15/859,141 →
Publication: US 2019/0207085
Memory Device having Overlapping Magnetic Tunnel Junctions in Compliance with a Reference Pitch
Application: 15/859,150 →
Publication: US 2019/0206936
Magnetic Tunnel Junction (Mtj) Memory Device Having a Composite Free Magnetic Layer
Application: 15/859,157 →
Publication: US 2019/0206464
Methods for Manufacturing a Perpendicular Magnetic Tunnel Junction (p-MTJ) MRAM having a Precessional Spin Current Injection (PSC) Structure
Application: 15/859,162 →
Publication: US 2019/0207086
Method for Manufacturing a Magnetic Memory Device by Pre-Patterning a Bottom Electrode prior to Patterning a Magnetic Material
Application: 15/859,171 →
Publication: US 2019/0207104
Perpendicular Magnetic Anisotropy Interface Tunnel Junction Devices and Methods of Manufacture
Application: 15/859,195 →
Publication: US 2019/0207095
Fabrication Methods of Forming Annular Vertical Si Etched Channel Mos Devices
Application: 15/859,222 →
Publication: US 2019/0206937
Perpendicular Magnetic Tunnel Junction Retention and Endurance Improvement
Application: 15/859,224 →
Publication: US 2019/0207096
Methods of Manufacturing Magnetic Tunnel Junction Devices
Application: 15/859,230 →
Publication: US 2019/0207105
Precessional Spin Current Magnetic Tunnel Junction Devices and Methods of Manufacture
Application: 15/859,243 →
Publication: US 2019/0207097
Annular Vertical Si Etched Channel Mos Devices
Application: 15/859,245 →
Publication: US 2019/0206938
Magnetic Tunnel Junction Devices Including an Optimization Layer
Application: 15/859,249 →
Publication: US 2019/0207087
Systems and Methods Utilizing Serial Configurations of Magnetic Memory Devices
Application: 15/859,250 →
Publication: US 2019/0206465
Methods and Systems for Writing to Magnetic Memory Devices Utilizing Alternating Current
Application: 15/859,256 →
Publication: US 2019/0206472
Systems and Methods Utilizing Parallel Configurations of Magnetic Memory Devices
Application: 15/859,259 →
Publication: US 2019/0206939
Switching and Stability Control for Perpendicular Magnetic Tunnel Junction Device
Application: 15/859,374 →
Perpendicular Magnetic Tunnel Junction Device with Offset Precessional Spin Current Layer
Application: 15/859,379 →
Perpendicular Magnetic Tunnel Junction Device with Precessional Spin Current Layer Having a Modulated Moment Density
Application: 15/859,381 →
Publication: US 2019/0207088
Perpendicular Magnetic Tunnel Junction Device with Skyrmionic Assist Layers for Free Layer Switching
Application: 15/859,384 →
Publication: US 2019/0206466
Antiferromagnetic Exchange Coupling Enhancement in Perpendicular Magnetic Tunnel Junction Stacks for Magnetic Random Access Memory Applications
Application: 15/859,449 →
Publication: US 2019/0207089
Method for Combining Nvm Class and Sram Class Mram Elements on the Same Chip
Application: 15/859,451 →
Vertically-Strained Silicon Device for Use with a Perpendicular Magnetic Tunnel Junction (Pmtj)
Application: 15/859,453 →
Publication: US 2019/0206940
Magnetic Random Access Memory with Reduced Internal Operating Temperature Range
Application: 15/859,455 →
Publication: US 2019/0207090
Magnetic Memory Chip Having Nvm Class and Sram Class Mram Elements on the Same Chip
Application: 15/859,456 →
Publication: US 2019/0206929
HIGH RETENTION STORAGE LAYER USING ULTRA-LOW RA MgO PROCESS IN PERPENDICULAR MAGNETIC TUNNEL JUNCTIONS FOR MRAM DEVICES
Application: 15/859,458 →
Publication: US 2019/0207091
Method for Manufacturing High Density Magnetic Random Access Memory Devices Using Diamond Like Carbon Hard Mask
Application: 15/859,459 →
Publication: US 2019/0207106
Perpendicular Magnetic Tunnel Junction Having Improved Reference Layer Stability
Application: 15/859,460 →
Publication: US 2019/0207092
Method for Manufacturing Reduced Pitch Magnetic Random Access Memory Pillar
Application: 15/859,464 →
Publication: US 2019/0207107
Method for Measuring Proximity Effect on High Density Magnetic Tunnel Junction Devices in a Magnetic Random Access Memory Device
Application: 15/859,465 →
Publication: US 2019/0206749
Method for Manufacturing Magnetic Tunnel Junction Pillars Using Photolithographically Directed Block Copolymer Self-Assembly and Organometallic Gas Infusion
Application: 15/859,467 →
Publication: US 2019/0207108
Microwave Write-Assist in Orthogonal Stt-Mram
Application: 15/859,514 →
Microwave Write-Assist in Series-Interconnected Orthogonal Stt-Mram Devices
Application: 15/859,517 →
Magnetic Random Access Memory Having Improved Reliability Through Thermal Cladding
Application: 15/862,495 →
Perpendicular Magnetic Tunnel Junction Device with Skyrmionic Enhancement Layers for the Precessional Spin Current Magnetic Layer
Application: 15/862,788 →
Publication: US 2019/0214548
Fabrication of a Perpendicular Magnetic Tunnel Junction (Pmtj) Using Block Copolymers
Application: 15/865,066 →
Publication: US 2019/0214551
Buried Tap for a Vertical Transistor Used with a Perpendicular Magnetic Tunnel Junction (Pmtj)
Application: 15/865,109 →
High Density 3D Magnetic Random Access Memory (Mram) Cell Integration Using Wafer Cut and Transfer
Application: 15/865,118 →
Publication: US 2019/0214552
Methods of Fabricating Contacts for Cylindrical Devices
Application: 15/865,123 →
Adjustable Current Selectors
Application: 15/865,125 →
Methods of Fabricating Dual Threshold Voltage Devices with Stacked Gates
Application: 15/865,132 →
Dual Threshold Voltage Devices Having a First Transistor and a Second Transistor
Application: 15/865,135 →
Publication: US 2019/0214431
Dual Threshold Voltage Devices with Stacked Gates
Application: 15/865,138 →
Methods of Fabricating Dual Threshold Voltage Devices
Application: 15/865,140 →
Dual Gate Memory Devices
Application: 15/865,144 →
Publication: US 2019/0214069
Methods of Fabricating Magnetic Tunnel Junctions Integrated with Selectors
Application: 15/865,247 →
Publication: US 2019/0214430
Devices Including Magnetic Tunnel Junctions Integrated with Selectors
Application: 15/865,249 →
Publication: US 2019/0214429
Method for Manufacturing a Chemical Guidance Pattern for Block Copolymer Self Assembly from Photolithographically Defined Topographic Block Copolymer Guided Self Assembly
Application: 15/866,362 →
Method for Manufacturing High Density Magnetic Tunnel Junction Devices Using Photolithographic Vias and Chemically Guided Block Copolymer Self Assembly
Application: 15/866,370 →
Dual Channel/Gate Vertical Field-Effect Transistor (Fet) for Use with a Perpendicular Magnetic Tunnel Junction (Pmtj)
Application: 15/866,381 →
Publication: US 2019/0214432
Method for Manufacturing a Magnetic Memory Element Array Using High Angle Side Etch to Open Top Electrical Contact
Application: 15/866,394 →
Publication: US 2019/0214553
Magnetic Tunnel Junction Wafer Adaptor Used in Magnetic Annealing Furnace and Method of Using the Same
Application: 15/916,050 →
Publication: US 2019/0280193
Magnetic Tunnel Junction Wafer Adaptor Used in Magnetic Annealing Furnace and Method of Using the Same
Application: 15/916,078 →
Publication: US 2019/0280194
Process for Creating a High Density Magnetic Tunnel Junction Array Test Platform
Application: 15/992,815 →
MAGNETIC MEMORY ELEMENT HAVING MgO ISOLATION LAYER
Application: 16/019,429 →
Publication: US 2019/0392879
Precessional Spin Current Structure for MRAM
Application: 16/027,739 →
Publication: US 2018/0315920
Multi-Bit Cell Read-Out Techniques
Application: 16/028,412 →
Publication: US 2020/0013445
Read-Out Techniques for Multi-Bit Cells
Application: 16/028,415 →
Publication: US 2020/0013454
Patterning of High Density Small Feature Size Pillar Structures
Application: 16/051,272 →
Publication: US 2020/0043537
Magnetic Tunnel Junction Memory Element with Improved Reference Layer Stability for Magnetic Random Access Memory Application
Application: 16/058,836 →
Publication: US 2020/0052034
Three-Dimensional Arrays with Magnetic Tunnel Junction Devices Including an Annular Discontinued Free Magnetic Layer and a Planar Reference Magnetic Layer
Application: 16/059,012 →
Publication: US 2019/0296221
Bit Line Structures for Three-Dimensional Arrays with Magnetic Tunnel Junction Devices Including an Annular Free Magnetic Layer and a Planar Reference Magnetic Layer
Application: 16/059,016 →
Publication: US 2019/0296222
Three-Dimensional (3D) Magnetic Memory Device comprising a Magnetic Tunnel Junction (MTJ) having a Metallic Buffer Layer
Application: 16/103,835 →
Publication: US 2019/0207094
System for a Wide Temperature Range Nonvolatile Memory
Application: 16/107,352 →
Publication: US 2020/0066320
Method of Optimizing Write Voltage Based on Error Buffer Occupancy
Application: 16/118,137 →
Publication: US 2019/0139590
Magnetic Tunnel Junction Devices Including a Free Magnetic Trench Layer and a Planar Reference Magnetic Layer
Application: 16/121,453 →
Publication: US 2019/0296224
Three-Dimensional Arrays with MTJ Devices Including a Free Magnetic Trench Layer and a Planar Reference Magnetic Layer
Application: 16/121,480 →
Publication: US 2019/0296225
Methods of Manufacturing Three-Dimensional Arrays with MTJ Devices Including a Free Magnetic Trench Layer and a Planar Reference Magnetic Layer
Application: 16/121,495 →
Publication: US 2019/0296230
Multi-Bit Cell Read-Out Techniques for Mram Cells with Mixed Pinned Magnetization Orientations
Application: 16/122,745 →
Publication: US 2020/0013455
Multi-Bit Cell Read-Out Techniques for Mram Cells with Mixed Pinned Magnetization Orientations
Application: 16/122,773 →
Publication: US 2020/0013456
Memory Cell Having Magnetic Tunnel Junction and Thermal Stability Enhancement Layer
Application: 16/123,663 →
Publication: US 2019/0006582
Precessional Spin Current Structure for Magnetic Random Access Memory with Novel Capping Materials
Application: 16/124,655 →
Publication: US 2020/0083442
Word Line Decoder Memory Architecture
Application: 16/134,869 →
Publication: US 2020/0090721
Method for Forming High Density Structures with Improved Resist Adhesion to Hard Mask
Application: 16/140,455 →
Publication: US 2020/0098980
Magnetic Memory Element with Voltage Controlled Magnetic Anistropy
Application: 16/147,242 →
Publication: US 2020/0105831
Defect Injection Structure and Mechanism for Magnetic Memory
Application: 16/147,257 →
Publication: US 2020/0105325
Defect Propagation Structure and Mechanism for Magnetic Memory
Application: 16/147,283 →
Publication: US 2020/0105326
Multi Terminal Device Stack Systems and Methods
Application: 16/148,223 →
Publication: US 2020/0105829
Multi Terminal Device Stack Formation Methods
Application: 16/148,308 →
Publication: US 2020/0106006
Memory System Utilizing Heterogeneous Magnetic Tunnel Junction Types in a Single Chip
Application: 16/178,105 →
Publication: US 2020/0143862
Adjustable Stabilizer/Polarizer Method for MRAM with Enhanced Stability and Efficient Switching
Application: 16/192,972 →
Spin Transfer Torque Structure for MRAM Devices Having a Spin Current Injection Capping Layer
Application: 16/197,622 →
Publication: US 2019/0109278
Method for Manufacturing a Data Recording System Utilizing Heterogeneous Magnetic Tunnel Junction Types in a Single Chip
Application: 16/211,167 →
Publication: US 2020/0185601
System and Method for Training Artificial Neural Networks
Application: 16/223,055 →
Publication: US 2020/0193282
Process for Manufacturing Scalable Spin-Orbit Torque (Sot) Magnetic Memory
Application: 16/223,077 →
Publication: US 2020/0194666
Spin-Orbit Torque (Sot) Magnetic Memory with Voltage or Current Assisted Switching
Application: 16/223,080 →
Scalable Spin-Orbit Torque (SOT) Magnetic Memory
Application: 16/223,084 →
Patterned Silicide Structures and Methods of Manufacture
Application: 16/236,275 →
Publication: US 2020/0212296
Methods of Forming Perpendicular Magnetic Tunnel Junction Memory Cells Having Vertical Channels
Application: 16/237,143 →
Publication: US 2019/0206941
High Density Mram Integration
Application: 16/237,171 →
Publication: US 2020/0013827
High Density Mram Integration
Application: 16/237,194 →
Publication: US 2020/0013828
High Retention Multi-Level-Series Magnetic Random-Access Memory
Application: 16/256,766 →
Publication: US 2020/0243124
Method for Manufacturing a Magnetic Random-Access Memory Device Using Post Pillar Formation Annealing
Application: 16/259,791 →
Publication: US 2020/0243757
Methods of Fabricating Dual Threshold Voltage Devices
Application: 16/261,414 →
Publication: US 2019/0311956
Multi-Chip Module for Mram Devices with Levels of Dynamic Redundancy Registers.
Application: 16/275,088 →
Publication: US 2019/0180807
Master Slave Level Shift Latch for Word Line Decoder Memory Architecture
Application: 16/294,920 →
Publication: US 2020/0286561
Mram Array Having Reference Cell Structure and Circuitry That Reinforces Reference States by Induced Magnetic Field
Application: 16/362,329 →
Publication: US 2020/0302983
Error Recovery in Magnetic Random Access Memory After Reflow Soldering
Application: 16/367,058 →
Publication: US 2020/0310930
System and Method for Classifying Data Using Neural Networks with Errors
Application: 16/367,067 →
Publication: US 2020/0311522
System and Method for Training Neural Networks with Errors
Application: 16/367,078 →
Publication: US 2020/0311555
Process for Creating a High Density Magnetic Tunnel Junction Array Test Platform
Application: 16/388,774 →
Publication: US 2019/0371997
Magnetic Tunnel Junction Element with Ru Hard Mask for Use in Magnetic Random-Access Memory
Application: 16/392,440 →
Publication: US 2020/0343298
Method for Manufacturing a Magnetic Memory Element Using Ru and Diamond Like Carbon Hard Masks
Application: 16/397,759 →
Publication: US 2020/0343042
Method for Manufacturing a Self-Aligned Magnetic Memory Element with Ru Hard Mask
Application: 16/397,987 →
Publication: US 2020/0343043
Mram Access Coordination Systems and Methods with a Plurality of Pipelines
Application: 16/442,345 →
Publication: US 2019/0303044
Fabricating Devices with Reduced Isolation Regions
Application: 16/452,197 →
Publication: US 2020/0409273
Fabricating Sub-Lithographic Devices
Application: 16/452,302 →
Publication: US 2020/0409272
Vertical Selector Stt-Mram Architecture
Application: 16/457,544 →
Systems and Methods Utilizing Serial and Parallel Configurations of Magnetic Memory Devices
Application: 16/506,878 →
Publication: US 2020/0043535
Memory Array with Individually Trimmable Sense Amplifiers
Application: 16/520,162 →
Publication: US 2019/0348097
Integration of Epitaxially Grown Channel Selector with Mram Device
Application: 16/555,150 →
Publication: US 2021/0065760
Measurement of Mtj in a Compact Memory Array
Application: 16/577,839 →
Publication: US 2021/0090679
Magnetic Tunnel Junction Wafer Adaptor Used in Magnetic Annealing Furnace and Method of Using the Same
Application: 16/584,731 →
Publication: US 2020/0020853
Method of Manufacturing High Annealing Temperature Perpendicular Magnetic Anisotropy Structure for Magnetic Random Access Memory
Application: 16/591,804 →
Publication: US 2020/0035914
Bi-Polar Write Scheme
Application: 16/598,568 →
Publication: US 2020/0043540
Error Cache Segmentation for Power Reduction
Application: 16/598,596 →
Publication: US 2020/0042450
Mram Noise Mitigation for Write Operations with Simultaneous Background Operations
Application: 16/598,599 →
Publication: US 2020/0050545
Heuristics for Selecting Subsegments for Entry in and Entry Out Operations in an Error Cache System with Coarse and Fine Grain Segments
Application: 16/598,634 →
Publication: US 2020/0117592
Error Cache System with Coarse and Fine Segments for Power Optimization
Application: 16/598,647 →
Publication: US 2020/0117610
Determining an Inactive Memory Bank During an Idle Memory Cycle to Prevent Error Cache Overflow
Application: 16/598,854 →
Publication: US 2020/0042451
Integration of Epitaxially Grown Channel Selector with Two Terminal Resistive Switching Memory Element
Application: 16/685,873 →
Publication: US 2021/0090626
Vertical Selector Stt-Mram Architecture
Application: 16/691,448 →
Memory Cell Using Selective Epitaxial Vertical Channel Mos Selector Transistor
Application: 16/719,790 →
Publication: US 2020/0127052
Selector Transistor with Continuously Variable Current Drive
Application: 16/738,835 →
Publication: US 2021/0217814
Dram with Selective Epitaxial Cell Transistor
Application: 16/774,928 →
Publication: US 2021/0233913
Magnetic Field Transducer Mounting Methods for MTJ Device Testers
Application: 16/777,755 →
Publication: US 2020/0166544
Precessional Spin Current Structure for MRAM
Application: 16/818,472 →
Publication: US 2020/0220070
Precessional Spin Current Structure with Non-Magnetic Insertion Layer for Mram
Application: 16/821,656 →
Publication: US 2020/0220074
Dram with Selective Epitaxial Transistor and Buried Bitline
Application: 16/828,879 →
Publication: US 2021/0305256
Word Line Decoder Memory Architecture
Application: 16/831,592 →
Publication: US 2020/0227102
Compact and Efficient Cmos Inverter
Application: 16/836,590 →
Publication: US 2021/0305105
Three-Dimensional (3D) Magnetic Memory Devices Comprising a Magnetic Tunnel Junction (MTJ) Having a Metallic Buffer Layer
Application: 16/892,964 →
Publication: US 2020/0303631
Selector Transistor with Metal Replacement Gate Wordline
Application: 16/898,234 →
Publication: US 2021/0391386
Methods of Manufacture Precessional Spin Current Magnetic Tunnel Junction Devices
Application: 16/996,573 →
Publication: US 2020/0411752
Circuit Engine for Managing Memory Meta-Stability
Application: 17/111,207 →
Publication: US 2021/0089455
Mram Architecture with Multiplexed Sense Amplifiers and Direct Write Through Buffers
Application: 17/145,083 →
Publication: US 2021/0217453
High Density Spin Orbit Torque Magnetic Random Access Memory
Application: 17/145,126 →
Publication: US 2022/0223787
Multi Terminal Device Stack Formation Methods
Application: 17/224,019 →
Publication: US 2021/0399213
High Annealing Temperature Perpendicular Magnetic Anisotropy Structure for Magnetic Random Access Memory
Application: 62/150,785 →
Spin Transfer Torque Structure for Mram Devices
Application: 62/150,791 →
Spin Transfer Torque Mram Device with Error Cache
Application: 62/150,804 →
Precessional Spin Current Structure for Mram
Application: 62/180,412 →
Chemical Mechanical Polishing Stop Layer for Mram Array Processing
Application: 62/198,870 →
Methods and Apparatus for Mram Write
Application: 62/205,178 →
Memory Cell Having Magnetic Tunnel Junction and Thermal Stability Enhancement Layer
Application: 62/287,994 →
Magnetic Tunnel Junction Device Including an Annular Free Magnetic Layer and a Planar Reference Magnetic Layer
Application: 62/647,210 →
Mram Read and Write Scheme for Ddr
Application: 62/685,218 →
MRAM Engine Multi Chip Module
Application: 62/691,506 →
Circuit Engine for Managing Mram Meta-Stability
Application: 62/944,826 →
Mram Architecture with Multiplexed Sense Amplifiers and Direct Write Through Buffers
Application: 62/959,081 →
Related Assignments (24)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 7, 2014
From: PINARBASI, MUSTAFA
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 033488/0201 →
Assignment of Assignor's Interest Oct 3, 2014
From: PINARBASI, MUSTAFA; KARDASZ, BARTEK
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 033888/0498 →
Assignment of Assignor's Interest Sep 10, 2015
From: PINARBASI, MUSTAFA MICHAEL; TZOUFRAS, MICHAIL
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 036535/0976 →
Assignment of Assignor's Interest Sep 25, 2015
From: KARDASZ, BARTLOMIEJ ADAM; PINARBASI, MUSTAFA MICHAEL
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 036661/0882 →
Assignment of Assignor's Interest Feb 11, 2016
From: PINARBASI, MUSTAFA
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 037712/0745 →
Assignment of Assignor's Interest Apr 6, 2016
From: KARDASZ, BARTLOMIEJ ADAM; PINARBASI, MUSTAFA MICHAEL; HERNANDEZ, JACOB ANTHONY
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 038206/0114 →
Assignment of Assignor's Interest Apr 13, 2016
From: PINARBASI, MUSTAFA MICHAEL; HERNANDEZ, JACOB ANTHONY; DATTA, ARINDOM; GAJEK, MARCIN JAN
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 038267/0113 →
Assignment of Assignor's Interest Apr 19, 2016
From: LOUIE, BENJAMIN STANLEY; BERGER, NEAL
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 038318/0318 →
Assignment of Assignor's Interest May 18, 2016
From: PINARBASI, MUSTAFA; KARDASZ, BARTEK
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 038635/0055 →
Assignment of Assignor's Interest Jun 6, 2016
From: BERGER, NEAL; LOUIE, BEN; EL-BARAJI, MOURAD
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 038820/0643 →
Assignment of Assignor's Interest Sep 27, 2016
From: EL BARAJI, MOURAD; BERGER, NEAL; LOUIE, BENJAMIN STANLEY; CRUDELE, LESTER M.
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 039870/0697 →
Assignment of Assignor's Interest Feb 28, 2017
From: PINARBASI, MUSTAFA MICHAEL; KARDASZ, BARTLOMIEJ ADAM
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 041402/0487 →
Assignment of Assignor's Interest Feb 28, 2017
From: PINARBASI, MUSTAFA MICHAEL; KARDASZ, BARTLOMIEJ ADAM
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 041401/0881 →
Security Interest Jun 16, 2017
From: SPIN TRANSFER TECHNOLOGIES, INC.
To: SILICON VALLEY BANK
Reel/Frame 042981/0819 →
Assignment of Assignor's Interest Jun 27, 2017
From: SCHABES, MANFRED ERNST; KARDASZ, BARTLOMIEJ ADAM; PINARBASI, MUSTAFA
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 042829/0320 →
Assignment of Assignor's Interest Jul 21, 2017
From: PINARBASI, MUSTAFA; KARDASZ, BARTEK
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 043065/0347 →
Assignment of Assignor's Interest Jul 24, 2017
From: KARDASZ, BARTLOMIEJ ADAM; PINARBASI, MUSTAFA MICHAEL
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 043075/0511 →
Assignment of Assignor's Interest Aug 11, 2017
From: PINARBASI, MUSTAFA MICHAEL; HERNANDEZ, JACOB ANTHONY; DATTA, ARINDOM; GAJEK, MARCIN JAN
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 043266/0001 →
Assignment of Assignor's Interest Oct 20, 2017
From: KARDASZ, BARTLOMIEJ ADAM
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 043915/0198 →
Assignment of Assignor's Interest Nov 25, 2017
From: HOBERMAN, BARRY
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 044219/0987 →
Change of Name Jan 15, 2019
From: SPIN TRANSFER TECHNOLOGIES, INC.
To: SPIN MEMORY, INC.
Reel/Frame 048075/0550 →
Change of Name Jun 10, 2019
From: SPIN TRANSFER TECHNOLOGIES, INC.
To: SPIN MEMORY, INC.
Reel/Frame 049421/0501 →
Assignment of Assignor's Interest Sep 7, 2021
From: SPIN (ASSIGNMENT FOR BENEFIT OF CREDITORS), LLC
To: INTEGRATED SILICON SOLUTION, (CAYMAN) INC.
Reel/Frame 057436/0237 →
Assignment of Assignor's Interest Sep 11, 2021
From: SPIN (ASSIGNMENT FOR BENEFIT OF CREDITORS), LLC
To: INTEGRATED SILICON SOLUTION, (CAYMAN) INC.
Reel/Frame 057473/0319 →