IP Library Granted Patent US 10,460,778
Granted Patent B2
US 10,460,778 · App. 15/859,040 · Granted Oct 29, 2019

Perpendicular magnetic tunnel junction memory cells having shared source contacts

Inventors: Kuk-Hwan Kim (San Jose, CA); Dafna Beery (Palo Alto, CA); Gian Sharma (Fremont, CA); Marcin Gajek (Berkeley, CA); Kadriye Deniz Bozdag (Sunnyvale, CA); Girish Jagtiani (Santa Clara, CA); Eric Michael Ryan (Fremont, CA); Michail Tzoufras (Sunnyvale, CA); Amitay Levi (Cupertino, CA); Andrew J. Walker (Mountain View, CA)
Assignee: SPIN MEMORY, INC.
G11C11/161G11C11/1675G11C11/1697
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Quick Facts
Patent No.
US 10,460,778
App. No.
15/859,040
Granted
Oct 29, 2019
Kind
B2
Abstract

A magnetic device, according to one approach, includes: a plurality of perpendicular magnetic tunnel junction (p-MTJ) cells, each p-MTJ cell having a transistor and a magnetic tunnel junction (MTJ) sensor. Moreover, each of the transistors includes a drain terminal, a source terminal, and a gate terminal. The magnetic device also includes: a first common word line coupled to the gate terminal of each transistor in a first subset of the plurality of p-MTJ cells, a first common bit line coupled to a first end of each MTJ sensor in a second subset of the plurality of p-MTJ cells, and a first common source line coupled to the drain terminal of each transistor in the first subset. A second end of each of the MTJ sensors in the second subset is coupled to the source terminal of each respective transistor in the second subset.

Claims (13)

1. A magnetic device, comprising:

a plurality of perpendicular magnetic tunnel junction (p-MTJ) cells, each p-MTJ cell having a transistor and a magnetic tunnel junction (MTJ) sensor, wherein each of the transistors includes a drain terminal, a source terminal, and a gate terminal, wherein each of the p-MTJ cells has a cylindrical shape;

a first common word line coupled to the gate terminal of each transistor in a first subset of the plurality of p-MTJ cells;

a first common bit line coupled to a first end of each MTJ sensor in a second subset of the plurality of p-MTJ cells, wherein a second end of each of the MTJ sensors in the second subset is coupled to the source terminal of each respective transistor in the second subset; and

a first common source line coupled to the drain terminal of each transistor in the first subset.

2. The magnetic device as recited in claim 1 , wherein an effective cell size of each of the p-MTJ cells is 5F 2 , wherein F is the minimum feature size associated with a technology used to fabricate each of the p-MTJ cells.

3. The magnetic device as recited in claim 1 , wherein a diameter of each of the p-MTJ cells is about 11 nm.

4. The magnetic device as recited in claim 1 , wherein the first subset of p-MTJ cells are oriented in a first column and the second subset of p-MTJ cells are oriented in a first row, wherein the first column extends perpendicular to the first row.

5. The magnetic device as recited in claim 4 , wherein the first column and the first row intersect such that the first and second subsets of p-MTJ cells include a common p-MTJ cell.

6. The magnetic device as recited in claim 5 , wherein each of the remaining p-MTJ cells in the first subset are also included in a respective row which intersects the first column, wherein each of the remaining p-MTJ cells in the second subset are also included in a respective column which intersects the first row.

7. The magnetic device as recited in claim 6 , comprising: a common source line coupled to the drain terminal of each transistor in each of the respective columns which intersect the first row.

8. The magnetic device as recited in claim 7 , comprising: a sense amplifier coupled to each of the respective common source lines.

9. The magnetic device as recited in claim 1 , comprising: a voltage generating circuit coupled to the first common source line.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2021
From: SPIN (ASSIGNMENT FOR BENEFIT OF CREDITORS), LLC
To: INTEGRATED SILICON SOLUTION, (CAYMAN) INC.
Reel/Frame 057473/0319 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2021
From: SPIN MEMORY, INC.
To: SPIN (ASSIGNMENT FOR THE BENEFIT OF CREDITORS), LLC
Reel/Frame 056927/0038 →
CHANGE OF NAME Recorded Jan 9, 2019
From: SPIN TRANSFER TECHNOLOGIES, INC.
To: SPIN MEMORY, INC.
Reel/Frame 048040/0409 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2018
From: BOZDAG, KADRIYE DENIZ
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 046351/0184 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2018
From: KIM, KUK-HWAN; BEERY, DAFNA; SHARMA, GIAN; GAJEK, MARCIN; BOZDAG, KADRIYE DENIZ; JAGTIANI, GIRISH; RYAN, ERIC MICHAEL; TZOUFRAS, MICHAIL; LEVI, AMITAY; WALKER, ANDREW J.
To: SPIN TRANSFER TECHNOLOGIES, INC.
Reel/Frame 044615/0575 →
Continuity (1)
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