Memory die temperature adjustment based on aging condition
A device includes a memory device and a controller. The controller is coupled to the memory device. The controller is configured to, in response to receiving a request to perform a memory access at the memory device, determine that the memory device has a characteristic indicative of a temperature crossing. The controller is also configured to, in response to the determination, increase a temperature of the memory device by performing memory operations on the memory device until detecting a condition related to the temperature.
1. A data storage device, comprising:
a memory device; and
a controller coupled to the memory device, the controller including:
a temperature crossing engine, wherein the temperature crossing engine is configured to determine a read temperature, wherein the temperature crossing engine is configured to determine, based on a write temperature, whether a die has a characteristic indicative of a temperature crossing condition;
an interface; and
memory.
2. The data storage device of claim 1 , wherein the temperature crossing engine is configured to store the determined read temperature in the memory.
3. The data storage device of claim 2 , wherein the temperature crossing engine is configured to determine a write temperature.
4. The data storage device of claim 3 , wherein the temperature crossing engine is configured to store the determined write temperature in the memory.
5. The data storage device of claim 4 , wherein the temperature crossing engine is configured to determine a write temperature satisfies a first temperature threshold.
6. The data storage device of claim 5 , wherein the temperature crossing engine is configured to determine a write temperature fails to satisfy a second temperature threshold.
7. The data storage device of claim 1 , wherein the temperature crossing engine is configured to determine a write temperature.
8. The data storage device of claim 7 , wherein the temperature crossing engine is configured to store the determined write temperature in the memory.
9. The data storage device of claim 1 , wherein the temperature crossing engine is configured to determine a write temperature satisfies a first temperature threshold.
10. The data storage device of claim 9 , wherein the temperature crossing engine is configured to determine a write temperature fails to satisfy a second temperature threshold.
11. A method, comprising:
checking a die temperature;
determining that a temperature crossing condition is met;
applying a temperature crossing mitigation operating;
writing data to the die; and
reading data from the die.
12. The method of claim 11 , wherein the determining includes determining that the checked die temperature is greater than a temperature threshold.
13. The method of claim 11 , wherein the applying comprises performing memory operations until a temperature condition is met.
14. The method of claim 11 , wherein prior to writing the data to the die, heating the die.
15. The method of claim 11 , wherein prior to reading the data from the die, heating the die.
16. A data storage device, comprises:
a memory device; and
a controller coupled to the memory device, the controller including:
means to determine a read temperature; and
means to determine, based on a write temperature, whether a die has a characteristic indicative of a temperature crossing condition.
17. The data storage device of claim 16 , further comprising means to heat a memory die.
18. The data storage device of claim 17 , further comprising:
means to determine a write temperature; and
means to determine a read temperature.
19. The data storage device of claim 16 , further comprising:
means to determine a write temperature satisfies a first temperature threshold; and
means to determine a write temperature fails to satisfy a second temperature threshold.
20. The data storage device of claim 16 , further comprising means to perform memory operations until a temperature condition is met.