Minimizing shorting between FinFET epitaxial regions
View Patent ↗The present invention relates generally to semiconductors, and more particularly, to a structure and method of minimizing shorting between epitaxial regions in small pitch fin field effect transistors (FinFETs). In an embodiment, a dielectric region may be formed in a middle portion of a gate structure. The gate structure be formed using a gate replacement process, and may cover a middle portion of a first fin group, a middle portion of a second fin group and an intermediate region of the substrate between the first fin group and the second fin group. The dielectric region may be surrounded by the gate structure in the intermediate region. The gate structure and the dielectric region may physically separate epitaxial regions formed on the first fin group and the second fin group from one another.
1. A method comprising:
forming an opening in a dummy gate layer between a first fin group and a second fin group, the opening exposing an upper surface of a substrate;
forming a dielectric region in the opening;
forming a dummy gate aligned with the dielectric region, and covering a middle portion of the first fin group and a middle portion of the second fin group; and
replacing the dummy gate with a gate structure.
2. The method of claim 1 , wherein the dummy gate layer comprises polysilicon.
3. The method of claim 1 , wherein the gate structure comprises copper, tungsten, gold, aluminum, ruthenium, titanium, platinum, or alloys thereof.
4. The method of claim 1 , wherein the gate structure comprises polycrystalline silicon.
5. The method of claim 1 , wherein a width of the gate structure is less than a width of the dielectric region.
6. The method of claim 1 , further comprising:
forming a first epitaxial region on exposed portions of the first fin group; and
forming a second epitaxial region on exposed portions of the second fin group, wherein the dielectric region isolates the first epitaxial region from the second epitaxial region.
7. The method of claim 1 , further comprising:
forming a spacer on exposed vertical sidewalls of both the dummy gate and the dielectric region.
8. A method comprising:
forming an opening in a dummy gate layer between a first set of fins and a second set of fins, the opening exposing an upper surface of a substrate;
forming a dielectric region in the opening, wherein an upper surface of the dielectric region is substantially flush with an upper surface of the dummy gate layer;
forming a dummy gate aligned with the dielectric region by patterning the dummy gate layer, the dummy gate covers a middle portion of the first set of fins and a middle portion of the second set of fins; and
replacing the dummy gate with a metal gate.
9. The method of claim 8 , wherein the dummy gate layer comprises polysilicon.
10. The method of claim 8 , wherein the metal gate comprises copper, tungsten, gold, aluminum, ruthenium, titanium, platinum, or alloys thereof.
11. The method of claim 8 , wherein the metal gate comprises polycrystalline silicon.
12. The method of claim 8 , wherein a width of the metal gate is less than a width of the dielectric region.
13. The method of claim 8 , further comprising:
forming a first set of epitaxial regions on exposed portions of the first set of fins; and
forming a second set of epitaxial regions on exposed portions of the second set of fins, wherein the dielectric region isolates the first set of epitaxial regions from the second set of epitaxial regions.
14. The method of claim 8 , further comprising:
forming a spacer on exposed vertical sidewalls of both the dummy gate and the dielectric region.
15. A method comprising:
forming an opening in a dummy gate layer between a first fin group and a second fin group, the opening exposing an upper surface of a substrate;
forming a dielectric region in the opening, wherein an upper surface of the dielectric region is substantially flush with an upper surface of the dummy gate layer;
forming a first dummy gate and a second dummy gate by patterning the dummy gate layer, the first dummy gate covers a middle portion of the first fin group and the second dummy gate covers a middle portion of the second fin group, and the dielectric region separates the first dummy gate from the second dummy gate; and
replacing the first dummy gate and the second dummy gate with a first metal gate and a second metal gate, respectively.
16. The method of claim 15 , wherein the dummy gate layer comprises polysilicon.
17. The method of claim 15 , wherein both the first metal gate and the second metal gate comprise copper, tungsten, gold, aluminum, ruthenium, titanium, platinum, or alloys thereof.
18. The method of claim 15 , wherein the first metal gate and the second metal gate both comprise polycrystalline silicon.
19. The method of claim 15 , wherein a width of both the first metal gate and the second metal gate is less than a width of the dielectric region.
20. The method of claim 15 , wherein the first metal gate and the second metal gate are in direct contact with the dielectric region.