Techniques for clock signal jitter generation

1. A device, comprising:

an integrated circuit; and

a jitter generator located on the integrated circuit, comprising:

a random number generator configured to generate a random number in response to a clock input signal;

delay-causing circuitry configured to receive the clock input signal, and wherein the delay-causing circuitry is configured to create a delayed clock input signal; and

a phase mixer configured to receive the random number, the delayed clock input signal, and the clock input signal, and wherein the phase mixer is configured to output a clock output signal comprising the clock input signal and jitter.

2. The device of claim 1 , wherein the jitter generator is configured to receive a first clocking signal or a second clocking signal as the clock input signal and is configured to output the clock output signal to a command decoder, a delay locked loop, or an input/output interface, or any combination thereof.

3. The device of claim 1 , wherein the delay-causing circuitry is configured to have a variable delay value, wherein the variable delay value is configured to vary based at least in part on an operational mode of the jitter generator.

4. The device of claim 3 , comprising a first variable capacitor and a second variable capacitor, wherein the first variable capacitor is configured to couple to the phase mixer, wherein the second variable capacitor is configured to couple to the delay-causing circuitry, and wherein the first variable capacitor and the second variable capacitor are configured to vary in a capacitance value based on the operational mode of the jitter generator.

5. The device of claim 3 , comprising a first variable capacitor and a second variable capacitor, wherein the first variable capacitor is configured to couple to the phase mixer, wherein the second variable capacitor is configured to couple to the delay-causing circuitry, and wherein the first variable capacitor and the second variable capacitor are configured to vary in a capacitance value based on a control signal configured to transmit from the random number generator.

6. The device of claim 5 , wherein the random number generator is configured to transmit one or more bits as the random number to the phase mixer, and wherein the control signal is configured to comprise a bit of the one or bits transmitted from the random number generator.

7. The device of claim 1 , comprising a first capacitor and a second capacitor, wherein the first capacitor is configured to couple to the phase mixer, and wherein the second capacitor is configured to couple to the delay-causing circuitry.

8. The device of claim 1 , wherein the delay-causing circuitry comprises combinational logic configured to delay the clock input signal an amount to create the delayed clock input signal.

9. The device of claim 1 , wherein the random number generator comprises a linear feedback shift register comprising a plurality of flip-flops and XOR gates, wherein the linear feedback shift register is configured to count in a pseudo-random counting order, and wherein the random number generator is configured to output the random number based at least in part on the pseudo-random counting order.

10. A jitter generator, comprising:

a first variable capacitor configured to change a first value of capacitance in response to a first control signal, wherein the first variable capacitor is configured to receive a clock-in signal;

a second variable capacitor configured to change a second value of capacitance in response to the first control signal, wherein the second variable capacitor is configured to receive the clock-in signal;

a delay-causing circuitry configured to couple to the second variable capacitor, wherein the delay-causing circuitry is configured to receive the clock-in signal from the second variable capacitor, and wherein the delay-causing circuitry is configured to generate a delayed clock-in signal by delaying the clock-in signal;

a random number generator configured to receive the clock-in signal, and wherein the random number generator is configured to generate a random number in response to the clock-in signal; and

a phase mixer configured to receive the random number from the random number generator, to receive the clock-in signal from the first variable capacitor, and to receive the delayed clock-in signal from the delay-causing circuitry, and wherein the phase mixer is configured to generate a clock-out signal comprising the clock-in signal and added jitter.

11. The jitter generator of claim 10 , wherein the first variable capacitor and the second variable capacitor are each configured to have a third value of capacitance in response to a second control signal, and wherein the first variable capacitor and the second variable capacitor are each configured to have a fourth value of capacitance in response to a third control signal.

12. The jitter generator of claim 11 , wherein the delay-causing circuitry is configured to cause a variable amount of delay based at least in part on operational modes of the jitter generator, wherein a first operational mode corresponds to the first control signal, a second operational mode corresponds to the second control signal, and a third operational mode corresponds to the third control signal.

13. The jitter generator of claim 10 , wherein the random number generator comprises a linear feedback shift register having combinational logic configured to enable counting in a non-sequential order in response to the clock-in signal.

14. A method, comprising:

receiving an input clock signal;

receiving a mode selection signal indicative of an operational mode;

delaying the input clock signal through transmission in delay-causing circuitry, wherein a delay of the input clock signal caused by the delay-causing circuitry changes a value of the delay in response to the mode selection signal; and

outputting, via a jitter generator, an output clock signal comprising the input clock signal and additional jitter, wherein the output clock signal is generated in response to a random number acting to mix phases of the input clock signal and a delayed input clock signal transmitted from the delay-causing circuitry.

15. The method of claim 14 , wherein one or more variable capacitors change capacitance value in response to the mode selection signal.

16. The method of claim 15 , wherein the delay-causing circuitry comprises one or more NAND logic gates and one or more inverting logical gates responsive to the mode selection signal.

17. A method comprising:

receiving an input clock signal;

generating the random number by providing the input clock signal to pseudo-random counting circuitry, wherein the random number is represented with a plurality of bits;

transmitting a subset of the plurality of bits to one or more capacitors configured to activate in response to the subset of the plurality of bits, wherein a capacitance value of the one or more capacitors is configured to change in response to activation;

delaying the input clock signal through transmission in delay-causing circuitry; and

outputting an output clock signal comprising the input clock signal and additional jitter, wherein the output clock signal is generated in response to a random number acting to mix phases of the input clock signal and a delayed input clock signal transmitted from the delay-causing circuitry.

18. The method of claim 14 , comprising:

generating the random number by providing the input clock signal to a linear feedback shift register, wherein the linear feedback shift register is configured to count in a non-binary sequential order mimicking a pseudo-random counting order;

at a first rising edge of the input clock signal, providing the random number to a phase mixer through a parallel transmission of bits for a first binary number associated with the non-binary sequential order; and

at a second rising edge of the input clock signal, providing the random number to the phase mixer through the parallel transmission of bits for a second binary number associated with the non-binary sequential order.

19. The method of claim 14 , wherein the output clock signal comprises the additional jitter causing a Gaussian distribution of one or more amounts of jitter.

20. The method of claim 14 , wherein the input clock signal is an internal clock signal CLK, a phase controlled internal locked clock signal LCLK, or any combination thereof.