IP Library Granted Patent US 10,580,491
Granted Patent B2
US 10,580,491 · App. 16/015,020 · Granted Mar 3, 2020

System and method for managing peak power demand and noise in non-volatile memory array

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,580,491
App. No.
16/015,020
Granted
Mar 3, 2020
Kind
B2
Abstract

A memory device includes rows and columns of memory cells, word lines each connected to a memory cell row, bit lines each connected to a memory cell column, a word line driver connected to the word lines, a bit line driver connected to the bit lines, word line switches each disposed on one of the word lines for selectively connecting one memory cell row to the word line driver, and bit line switches each disposed on one of the bit lines for selectively connecting one memory cell column to the bit line driver. A controller controls the word line switches to connect only some of the rows of memory cells to the word line driver at a first point in time, and controls the bit line switches to connect only some of the columns of memory cells to the bit line driver at a second point in time.

Claims (98)

1. A memory device, comprising:

a plurality of memory cells arranged in rows and columns;

a plurality of word lines each connected to a row of the memory cells;

a plurality of bit lines each connected to a column of the memory cells;

a word line driver connected to the word lines;

a bit line driver connected to the bit lines;

a plurality of word line switches each disposed on one of the word lines for selectively connecting and disconnecting one of the rows of memory cells to and from the word line driver;

a plurality of bit line switches each disposed on one of the bit lines for selectively connecting and disconnecting one of the columns of memory cells to and from the bit line driver; and

a controller configured to control the plurality of word line switches to connect some but not all of the rows of memory cells to the word line driver at a first point in time, and control the plurality of bit line switches to connect some but not all of the columns of memory cells to the bit line driver at a second point in time.

2. The memory device of claim 1 , wherein first point in time is the same as the second point in time.

3. The memory device of claim 1 , wherein first point in time is before or after the second point in time.

4. The memory device of claim 1 , wherein the plurality of word line switches includes m groups of the word line switches where m is an integer greater than 1, and wherein the controller is configured to:

control the word line switches in a first of the m groups to be in a connected state at the first point in time;

control the word line switches in a second of the m groups to be in a disconnected state at the first point in time;

control the word line switches in the first of the m groups to be in a disconnected state at a third point in time which is after the first point in time; and

control the word line switches in the second of the m groups to be in a connected state at the third point in time.

5. The memory device of claim 4 , wherein the word line driver is configured to couple any of the word lines having a word line switch in a connected state to a ground voltage at the first and third points in time.

6. The memory device of claim 1 , wherein the plurality of bit line switches includes k groups of the bit line switches where k is an integer greater than 1, and wherein the controller is configured to:

control the bit line switches in a first of the k groups to be in a connected state at the second point in time;

control the bit line switches in a second of the k groups to be in a disconnected state at the second point in time;

control the bit line switches in the first of the k groups to be in a disconnected state at a third point in time which is after the second point in time; and

control the bit line switches in the second of the k groups to be in a connected state at the third point in time.

7. The memory device of claim 6 , wherein the bit line driver is configured to charge any of the bit lines having a bit line switch in a connected state to a specific voltage at the second and third points in time.

8. The memory device of claim 6 , wherein the bit line driver is configured to couple any of the bit lines having a bit line switch in a connected state to a ground voltage at the second and third points in time.

9. The memory device of claim 6 , wherein the bit line driver comprises sense amplifier circuitry configured to sense a voltage or a current on any of the bit lines having a bit line switch in a connected state at the second and third points in time.

10. The memory device of claim 1 , wherein the plurality of word line switches includes m groups of the word line switches where m is an integer greater than 1, the plurality of bit line switches includes k groups of the bit line switches where k is an integer greater than 1, and the controller is configured to:

control the word line switches in a first of the m groups to be in a connected state at the first point in time;

control the word line switches in a second of the m groups to be in a disconnected state at the first point in time;

control the word line switches in the first of the m groups to be in a disconnected state at a third point in time which is after the first point in time;

control the word line switches in the second of the m groups to be in a connected state at the third point in time;

control the bit line switches in a first of the k groups to be in a connected state at the second point in time which is the same as the first point in time;

control the bit line switches in a second of the k groups to be in a disconnected state at the second point in time;

control the bit line switches in the first of the k groups to be in a disconnected state at the third point in time; and

control the bit line switches in the second of the k groups to be in a connected state at the third point in time.

11. A memory device, comprising:

a plurality of memory cells arranged in rows and columns;

a plurality of word lines each connected to a row of the memory cells;

a plurality of bit lines each connected to a column of the memory cells;

a word line driver connected to the word lines;

a bit line driver connected to the bit lines;

a plurality of word line switches each disposed on one of the word lines for selectively connecting and disconnecting one of the rows of memory cells to and from the word line driver; and

a controller configured to control the plurality of word line switches to connect some but not all of the rows of memory cells to the word line driver at a first point in time.

12. The memory device of claim 11 , wherein the plurality of word line switches includes m groups of the word line switches where m is an integer greater than 1, and wherein the controller is configured to:

control the word line switches in a first of the m groups to be in a connected state at the first point in time;

control the word line switches in a second of the m groups to be in a disconnected state at the first point in time;

control the word line switches in the first of the m groups to be in a disconnected state at a second point in time which is after the first point in time; and

control the word line switches in the second of the m groups to be in a connected state at the second point in time.

13. A memory device, comprising:

a plurality of memory cells arranged in rows and columns;

a plurality of word lines each connected to a row of the memory cells;

a plurality of bit lines each connected to a column of the memory cells;

a word line driver connected to the word lines;

a bit line driver connected to the bit lines;

a plurality of bit line switches each disposed on one of the bit lines for selectively connecting and disconnecting one of the columns of memory cells to and from the bit line driver; and

a controller configured to control the plurality of bit line switches to connect some but not all of the columns of memory cells to the bit line driver at a first point in time.

14. The memory device of claim 13 , wherein the plurality of bit line switches includes k groups of the bit line switches where k is an integer greater than 1, and wherein the controller is configured to:

control the bit line switches in a first of the k groups to be in a connected state at the first point in time;

control the bit line switches in a second of the k groups to be in a disconnected state at the first point in time;

control the bit line switches in the first of the k groups to be in a disconnected state at a second point in time which is after the first point in time; and

control the bit line switches in the second of the k groups to be in a connected state at the second point in time.

15. A method of operating a memory device that includes:

a plurality of memory cells arranged in rows and columns,

a plurality of word lines each connected to a row of the memory cells,

a plurality of bit lines each connected to a column of the memory cells,

a word line driver connected to the word lines,

a bit line driver connected to the bit lines,

a plurality of word line switches each disposed on one of the word lines for selectively connecting and disconnecting one of the rows of memory cells to and from the word line driver, and

a plurality of bit line switches each disposed on one of the bit lines for selectively connecting and disconnecting one of the columns of memory cells to and from the bit line driver;

the method comprising:

operating the plurality of word line switches to connect some but not all of the rows of memory cells to the word line driver at a first point in time, and

operating the plurality of bit line switches to connect some but not all of the columns of memory cells to the bit line driver at a second point in time.

16. The method of claim 15 , wherein the plurality of word line switches includes m groups of the word line switches where m is an integer greater than 1, and wherein the method comprises:

operating the word line switches in a first of the m groups to be in a connected state at the first point in time;

operating the word line switches in a second of the m groups to be in a disconnected state at the first point in time;

operating the word line switches in the first of the m groups to be in a disconnected state at a third point in time which is after the first point in time; and

operating the word line switches in the second of the m groups to be in a connected state at the third point in time.

17. The method of claim 16 , further comprising:

coupling any of the word lines having a word line switch in a connected state to a ground voltage at the first and third points in time.

18. The method of claim 15 , wherein the plurality of bit line switches includes k groups of the bit line switches where k is an integer greater than 1, and wherein the method comprises:

operating the bit line switches in a first of the k groups to be in a connected state at the second point in time;

operating the bit line switches in a second of the k groups to be in a disconnected state at the second point in time;

operating the bit line switches in the first of the k groups to be in a disconnected state at a third point in time which is after the second point in time; and

operating the bit line switches in the second of the k groups to be in a connected state at the third point in time.

19. The method of claim 18 , further comprising:

charging any of the bit lines having a bit line switch in a connected state to a specific voltage at the second and third points in time.

20. The method of claim 18 , further comprising:

coupling any of the bit lines having a bit line switch in a connected state to a ground voltage at the second and third points in time.

21. The method of claim 18 , further comprising:

sensing a voltage or a current on any of the bit lines having a bit line switch in a connected state at the second and third points in time.

22. The method of claim 15 , wherein the plurality of word line switches includes m groups of the word line switches where m is an integer greater than 1, and the plurality of bit line switches includes k groups of the bit line switches where k is an integer greater than 1, the method comprising:

operating the word line switches in a first of the m groups to be in a connected state at the first point in time;

operating the word line switches in a second of the m groups to be in a disconnected state at the first point in time;

operating the word line switches in the first of the m groups to be in a disconnected state at a third point in time which is after the first point in time;

operating the word line switches in the second of the m groups to be in a connected state at the third point in time;

operating the bit line switches in a first of the k groups to be in a connected state at the second point in time which is the same as the first point in time;

operating the bit line switches in a second of the k groups to be in a disconnected state at the second point in time;

operating the bit line switches in the first of the k groups to be in a disconnected state at the third point in time; and

operating the bit line switches in the second of the k groups to be in a connected state at the third point in time.

Assignments (13)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2018
From: TIWARI, VIPIN; TRAN, HIEU VAN; DO, NHAN; REITEN, MARK
To: SILICON STORAGE TECHNOLOGY, INC.
Reel/Frame 046872/0709 →