IP Library Granted Patent US 10,759,968
Granted Patent B2
US 10,759,968 · App. 16/018,279 · Granted Sep 1, 2020

Abrasive, abrasive set, and method for polishing substrate

Inventors: Hisataka Minami (Tokyo, JP); Tomohiro Iwano (Tokyo, JP); Toshiaki Akutsu (Tokyo, JP)
Assignee: HITACHI CHEMICAL COMPANY, LTD.
C09G1/02B24B37/044C09K3/1409C09K3/1472H01L21/31053H01L21/76224
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Quick Facts
Patent No.
US 10,759,968
App. No.
16/018,279
Granted
Sep 1, 2020
Kind
B2
Abstract

A polishing agent comprises: a fluid medium; an abrasive grain containing a hydroxide of a tetravalent metal element; a first additive; a second additive; and a third additive, wherein: the first additive is at least one selected from the group consisting of a compound having a polyoxyalkylene chain and a vinyl alcohol polymer; the second additive is a cationic polymer; and the third additive is an amino group-containing sulfonic acid compound.

Claims (28)

1. A polishing agent comprising:

a fluid medium;

abrasive grains containing a hydroxide of a tetravalent metal element;

a first additive;

a second additive; and

a third additive,

wherein:

the first additive is at least one selected from the group consisting of a compound having a polyoxyalkylene chain and a vinyl alcohol polymer;

the second additive is a cationic polymer; and

the third additive is an amino group-containing sulfonic acid compound.

2. The polishing agent according to claim 1 , wherein the second additive is at least one selected from the group consisting of an allylamine polymer, a diallylamine polymer, a vinylamine polymer and an ethyleneimine polymer.

3. The polishing agent according to claim 1 , wherein the third additive is at least one selected from the group consisting of sulfamic acid, an aliphatic aminosulfonic acid, an aromatic aminosulfonic acid and their salts.

4. The polishing agent according to claim 1 , wherein a content of the third additive is 0.0005 mass % or more and 0.2 mass % or less based on a total mass of the polishing agent.

5. The polishing agent according to claim 1 , wherein the hydroxide of a tetravalent metal element contains an anion, excluding a hydroxide ion, bonded to the tetravalent metal element.

6. A polishing agent set comprising constituent components of the polishing agent according to claim 1 stored as separate liquids containing a first liquid and a second liquid, wherein the first liquid contains the abrasive grains, and the second liquid contains at least one selected from the group consisting of the first additive, the second additive and the third additive.

7. A method for polishing a base, comprising a step of polishing a surface to be polished of a base using the polishing agent according to claim 1 .

8. A method for polishing a base, comprising a step of polishing a surface to be polished of a base using a polishing agent obtained by mixing at least the first liquid and the second liquid of the polishing agent set according to claim 6 .

9. A method for polishing a base having an insulating material and a stopper material,

the method comprising a step of selectively polishing the insulating material with respect to the stopper material using the polishing agent according to claim 1 .

10. A method for polishing a base having an insulating material and a stopper material,

the method comprising a step of selectively polishing the insulating material with respect to the stopper material using a polishing agent obtained by mixing the first liquid and the second liquid of the polishing agent set according to claim 6 .

11. The method for polishing a base according to claim 9 , wherein the stopper material is polysilicon.

12. The method for polishing a base according to claim 10 , wherein the stopper material is polysilicon.

13. The method for polishing a base according to claim 7 , wherein the surface to be polished contains silicon oxide.

14. The method for polishing a base according to claim 8 , wherein the surface to be polished contains silicon oxide.

15. The method for polishing a base according to claim 9 , wherein the insulating material contains silicon oxide.

16. The method for polishing a base according to claim 10 , wherein the insulating material contains silicon oxide.

17. The polishing agent according to claim 2 , wherein the second additive comprises one or more structural units derived from at least one selected from the group consisting of acrylamide, dimethylacrylamide, diethylacrylamide, hydroxyethylacrylamide, acrylic acid, methyl acrylate, methacrylic acid, maleic acid, and sulfur dioxide.

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
CHANGE OF NAME Recorded Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2020
From: MINAMI, HISATAKA; IWANO, TOMOHIRO; AKUTSU, TOSHIAKI
To: HITACHI CHEMICAL COMPANY, LTD.
Reel/Frame 052576/0630 →
Priority Claims (1)
JP 2013-268956 · Dec 26, 2013 · national
Continuity (2)
Continuation 15108001
Related Publication 20180320024A1 · Nov 8, 2018