IP Library Granted Patent US 10,649,487
Granted Patent B2
US 10,649,487 · App. 16/143,841 · Granted May 12, 2020

Fail-safe clock monitor with fault injection

Inventors: Kevin Kilzer (Chandler, AZ); Aditya Nukala (Gilbert, AZ)
Assignee: MICROCHIP TECHNOLOGY INCORPORATED
G06F1/14G06F1/04G06F1/08G06F1/10G06F11/1604
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Quick Facts
Patent No.
US 10,649,487
App. No.
16/143,841
Granted
May 12, 2020
Kind
B2
Abstract

A system for testing a clock monitor includes a fault injection circuit, a control circuit, and a clock monitor circuit to evaluate a clock source signal from a clock source. The fault injection circuit is to modify or replace the clock source signal from the clock source to yield a modified clock signal, and send the modified clock signal to the clock monitor circuit. The clock monitor circuit is to receive an input clock signal, determine whether the input clock signal indicates a faulty clock source, and issue a clock corrective action if the input clock signal indicates a faulty clock source. The control circuit is to monitor for the clock corrective action, and determine, based on whether the clock corrective action is issued, whether the clock monitor circuit is operating correctly.

Claims (47)

1. A system for testing a clock monitor, comprising:

a fault injection circuit with an input communicatively coupled to a clock source;

a control circuit; and

a clock monitor circuit communicatively coupled to an output of the fault injection circuit and to an input of the control circuit, the clock monitor circuit configured to evaluate a clock source signal from the clock source;

wherein:

the fault injection circuit is configured to:

modify or replace the clock source signal from the clock source to yield a modified clock signal; and

send the modified clock signal to the clock monitor circuit;

the clock monitor circuit is configured to:

receive an input clock signal;

determine whether the input clock signal indicates a faulty clock source; and

issue a clock corrective action based upon a determination that the input clock signal indicates a faulty clock source; and

the control circuit is configured to:

monitor for the clock corrective action; and

determine based on whether the clock corrective action is issued whether the clock monitor circuit is operating correctly.

2. The system of claim 1 , wherein the control circuit is further configured to determine that the clock monitor is operating correctly based upon the clock monitor circuit issuing the clock corrective action.

3. The system of claim 1 :

further comprising a peripheral circuit;

wherein the peripheral circuit is configured to use the clock source signal while the fault injection circuit sends the modified clock signal to the clock monitor circuit.

4. The system of claim 1 , wherein the fault injection circuit is further configured to selectively modify or replace the clock source signal from the clock source to yield a modified clock signal based upon a clock monitor testing mode for the system, wherein the clock monitor circuit is to be tested during the clock monitor testing mode.

5. The system of claim 4 , wherein the control circuit is further configured to monitor for the clock corrective action and determine whether the clock monitor circuit is operating correctly based upon the clock monitor testing mode.

6. The system of claim 4 , wherein the clock monitor circuit is configured to evaluate the modified clock signal as its input clock signal during the clock monitor testing mode.

7. The system of claim 1 , wherein the fault injection circuit is further configured to selectively forward the clock source signal instead of the modified clock signal to the clock monitor circuit in a pass-through mode.

8. The system of claim 7 , wherein during the pass-through mode the control circuit is further configured to determine, from clock corrective action issued by the clock monitor circuit, that the clock source is faulty.

9. The system of claim 7 , wherein the clock monitor circuit is configured to evaluate the clock source signal as its input clock signal during the pass-through mode.

10. The system of claim 1 , wherein the control circuit is configured to suppress clock corrective action to be taken on other elements of the system based upon the clock monitor circuit issuing the clock corrective action after evaluating the modified control signal.

11. A method for testing a clock monitor, comprising:

operating a fault injection circuit with an input communicatively coupled to a clock source;

operating a control circuit; and

receiving a clock source signal from the clock source;

modifying or replace the clock source signal from the clock source to yield a modified clock signal;

sending the modified clock signal to a clock monitor circuit communicatively coupled to an output of the fault injection circuit and to an input of the control circuit;

at the clock monitor circuit:

receiving an input clock signal;

determining whether the input clock signal indicates a faulty clock source; and

issuing a clock corrective action based upon a determination that the input clock signal indicates a faulty clock source; and

monitoring for the clock corrective action; and

determining based on whether the clock corrective action is issued whether the clock monitor circuit is operating correctly.

12. The method of claim 11 , further comprising determining that the clock monitor is operating correctly based upon the clock monitor circuit issuing the clock corrective action.

13. The method of claim 11 , further comprising operating a peripheral circuit with the clock source signal while the modified clock signal is routed to the clock monitor circuit.

14. The method of claim 11 , further comprising selectively modifying or replacing the clock source signal from the clock source to yield a modified clock signal based upon a clock monitor testing mode for the method, wherein the clock monitor circuit is to be tested during the clock monitor testing mode.

15. The method of claim 14 , further comprising monitoring for the clock corrective action and determining whether the clock monitor circuit is operating correctly based upon the clock monitor testing mode.

16. The method of claim 14 , further comprising evaluating the modified clock signal as an input clock signal for the clock monitor circuit during the clock monitor testing mode.

17. The method of claim 11 , further comprising selectively forwarding the clock source signal instead of the modified clock signal to the clock monitor circuit in a pass-through mode.

18. The method of claim 17 , further comprising, during the pass-through mode, determining, from clock corrective action issued by the clock monitor circuit, that the clock source is faulty.

19. The method of claim 17 , further comprising evaluating the clock source signal as an input clock signal for the clock monitor circuit during the pass-through mode.

20. The method of claim 11 , further comprising suppressing clock corrective action to be taken on other elements of the system based upon the clock monitor circuit issuing the clock corrective action after evaluating the modified control signal.

Assignments (13)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2018
From: KILZER, KEVIN; NUKALA, ADITYA
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 046992/0932 →