IP Library Patent Application 16188588
Patent Application
App. No. 16/188,588

METHOD AND APPARATUS TO MEASURE SELF-CAPACITANCE USING A SINGLE PIN

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Quick Facts
Patent No.
US None
App. No.
16/188,588
Abstract

A method for measuring capacitance in a sensor device using an internal reference circuit element(s), and without implementing additional circuitry and devices external to the sensor device, is described. In some embodiments a method uses an output pin of the sensor device and an internal reference capacitor of the sensor device to identify a touch applied to a touch point or electrode coupled to the touch sensor. The method applies reference voltages to charge the reference capacitor and measure a signal received from an electrode, wherein the touch sensor controls switching within the touch sensor to apply the reference voltages to the reference capacitor.

Claims (84)

1 .- 4 . (canceled)

5 .- 20 . (canceled)

21 . A non-transitory computer-readable medium comprising instructions which, when implemented by one or more machines, cause the one or more machines to:

discharge, during a first burst cycle, a sampling capacitor and an electrode capacitor by closing a first switch of a device, opening a second switch of the device, and closing a third switch of the device, wherein:

the first switch is connected to a first ground when closed;

the second switch is connected to a reference voltage when closed; and

the third switch is connected to a second ground when closed;

float, during the first burst cycle, the sampling capacitor by opening the first switch and the third switch while the second switch remains open;

transfer, during the first burst cycle, charge to the sampling capacitor and the electrode capacitor by closing the second switch while the first switch and the third switch remain open;

float, during the first burst cycle, the sampling capacitor by opening the second switch while the first switch and the second switch remain open; and

discharge, during the first burst cycle, the electrode capacitor by closing the first switch while the second switch and the third switch remain open, wherein discharging the electrode capacitor completes the first burst cycle.

22 . The non-transitory computer-readable medium of claim 21 , wherein the instructions further cause the one or more machines to measure a capacitance of the electrode capacitor using a capacitance of the sampling capacitor.

23 . The non-transitory computer-readable medium of claim 21 , wherein the instructions further cause the one or more machines to:

float, during a second burst cycle, the sampling capacitor by opening the first switch;

transfer, during the second burst cycle, a second charge to the sampling capacitor and the electrode capacitor by closing the second switch;

float, during the second burst cycle, the sampling capacitor by opening the second switch; and

discharge, during the second burst cycle, the electrode capacitor by closing the first switch, wherein discharging the electrode capacitor during the second burst cycle completes the second burst cycle.

24 . The non-transitory computer-readable medium of claim 21 , wherein:

the sampling capacitor is positioned between two outlet ports of the device; and

a voltage across the sampling capacitor increases during each subsequent burst cycle.

25 . The non-transitory computer-readable medium of claim 21 , the instructions further causing the one or more machines to measure a voltage across the sampling capacitor based on the following equation:

V ( C s )=( C x *V dd )/( C s +C x );

wherein:

V(C s ) is the voltage across the sampling capacitor;

C x is a capacitance at the electrode capacitor;

V dd is the reference voltage; and

C s is a capacitance at the sampling capacitor.

26 . The non-transitory computer-readable medium of claim 21 , wherein discharging the sampling capacitor and the electrode capacitor comprises discharging any residual charge stored on the sampling capacitor and the electrode capacitor.

27 . The non-transitory computer-readable medium of claim 21 , wherein transferring charge to the sampling capacitor and the electrode capacitor comprises transferring a same amount of charge to the sampling capacitor and the electrode capacitor.

28 . A method, comprising:

discharging, during a first burst cycle, a sampling capacitor and an electrode capacitor by closing a first switch of a device, opening a second switch of the device, and closing a third switch of the device, wherein:

the first switch is connected to a first ground when closed;

the second switch is connected to a reference voltage when closed; and

the third switch is connected to a second ground when closed;

floating, during the first burst cycle, the sampling capacitor by opening the first switch and the third switch while the second switch remains open;

transferring, during the first burst cycle, charge to the sampling capacitor and the electrode capacitor by closing the second switch while the first switch and the third switch remain open;

floating, during the first burst cycle, the sampling capacitor by opening the second switch while the first switch and the second switch remain open; and

discharging, during the first burst cycle, the electrode capacitor by closing the first switch while the second switch and the third switch remain open, wherein discharging the electrode capacitor completes the first burst cycle.

29 . The method of claim 28 , further comprising measuring a capacitance of the electrode capacitor using a capacitance of the sampling capacitor.

30 . The method of claim 28 , further comprising:

floating, during a second burst cycle, the sampling capacitor by opening the first switch;

transferring, during the second burst cycle, a second charge to the sampling capacitor and the electrode capacitor by closing the second switch;

floating, during the second burst cycle, the sampling capacitor by opening the second switch; and

discharging, during the second burst cycle, the electrode capacitor by closing the first switch, wherein discharging the electrode capacitor during the second burst cycle completes the second burst cycle.

31 . The method of claim 28 , wherein:

the sampling capacitor is positioned between two outlet ports of the device; and

a voltage across the sampling capacitor increases during each subsequent burst cycle.

32 . The method of claim 28 , the method further comprising measuring a voltage across the sampling capacitor based on the following equation:

V ( C s )=( C x *V dd )/( C s +C x );

wherein:

V(C s ) is the voltage across the sampling capacitor;

C x is a capacitance at the electrode capacitor;

V dd is the reference voltage; and

C s is a capacitance at the sampling capacitor.

33 . The method of claim 28 , wherein discharging the sampling capacitor and the electrode capacitor comprises discharging any residual charge stored on the sampling capacitor and the electrode capacitor.

34 . The method of claim 28 , wherein transferring charge to the sampling capacitor and the electrode capacitor comprises transferring a same amount of charge to the sampling capacitor and the electrode capacitor.

35 . An apparatus, comprising:

one or more processors; and

one or more memory units coupled to the one or more processors, the one or more memory units collectively storing logic configured to, when executed by the one or more processors, cause the one or more processors to perform operations comprising:

discharging, during a first burst cycle, a sampling capacitor and an electrode capacitor by closing a first switch of a device, opening a second switch of the device, and closing a third switch of the device, wherein:

the first switch is connected to a first ground when closed;

the second switch is connected to a reference voltage when closed; and

the third switch is connected to a second ground when closed;

floating, during the first burst cycle, the sampling capacitor by opening the first switch and the third switch while the second switch remains open;

transferring, during the first burst cycle, charge to the sampling capacitor and the electrode capacitor by closing the second switch while the first switch and the third switch remain open;

floating, during the first burst cycle, the sampling capacitor by opening the second switch while the first switch and the second switch remain open; and

discharging, during the first burst cycle, the electrode capacitor by closing the first switch while the second switch and the third switch remain open, wherein discharging the electrode capacitor completes the first burst cycle.

36 . The apparatus of claim 35 , the operations further comprising measuring a capacitance of the electrode capacitor using a capacitance of the sampling capacitor.

37 . The apparatus of claim 35 , the operations further comprising:

floating, during a second burst cycle, the sampling capacitor by opening the first switch;

transferring, during the second burst cycle, a second charge to the sampling capacitor and the electrode capacitor by closing the second switch;

floating, during the second burst cycle, the sampling capacitor by opening the second switch; and

discharging, during the second burst cycle, the electrode capacitor by closing the first switch, wherein discharging the electrode capacitor during the second burst cycle completes the second burst cycle.

38 . The apparatus of claim 35 , wherein:

the sampling capacitor is positioned between two outlet ports of the device; and

a voltage across the sampling capacitor increases during each subsequent burst cycle.

39 . The apparatus of claim 35 , the operations further comprising measuring a voltage across the sampling capacitor based on the following equation:

V ( C s )=( C x *V dd )/( C s +C x );

wherein:

V(C s ) is the voltage across the sampling capacitor;

C x is a capacitance at the electrode capacitor;

V dd is the reference voltage; and

C s is a capacitance at the sampling capacitor.

40 . The apparatus of claim 35 , wherein discharging the sampling capacitor and the electrode capacitor comprises discharging any residual charge stored on the sampling capacitor and the electrode capacitor.

Assignments (13)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2018
From: SIMMONS, MARTIN J.
To: QRG LIMITED
Reel/Frame 047483/0119 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2018
From: QRG LIMITED
To: ATMEL CORPORATION
Reel/Frame 047483/0203 →