Apparatus and methods for merging post-write read and select gate maintenance operations
View Patent ↗A method is provided that includes performing a post-write read operation on a block of memory cells that includes a select gate transistor, and based on results of the post-write read operation selectively performing a select gate maintenance operation on the select gate transistor.
1. A method comprising:
performing a post-write read operation on a block of memory cells that includes a select gate transistor, wherein the select gate transistor is not used to store user data; and
based on results of the post-write read operation selectively performing a select gate maintenance operation on the select gate transistor.
2. The method of claim 1 , wherein performing the post-write read operation comprises:
performing a read operation after a plurality of memory cells in the block of memory cells have been programmed with data; and
calculating a bit error rate based on results of the read operation.
3. The method of claim 2 , further comprising:
comparing the calculated bit error rate to a first threshold; and
based on results of the comparing step selectively: (a) performing the select gate maintenance operation on the select gate transistor, and (b) continuing to program memory cells in the block of memory cells with data.
4. The method of claim 1 , wherein performing a select gate maintenance operation on the select gate transistor comprises:
determining a threshold voltage of the select gate transistor; and
selectively retiring the block of memory cells based on the determined threshold voltage.
5. The method of claim 1 , wherein performing a select gate maintenance operation on the select gate transistor comprises:
determining a threshold voltage of the select gate transistor; and
selectively programming the select gate transistor based on the determined threshold voltage.
6. The method of claim 1 , wherein performing the post-write read operation comprises calculating a bit error rate, and the method further comprises:
(a) comparing the calculated bit error rate to a first threshold;
(b) comparing the calculated bit error rate to a second threshold;
(c) based on results of step (b) selectively: (i) performing the select gate maintenance operation on the select gate transistor, and (ii) continuing to program memory cells in the block of memory cells with data.
7. The method of claim 6 , wherein the second threshold comprises a fixed value.
8. The method of claim 6 , wherein the second threshold comprises an adaptive value.
9. The method of claim 6 , wherein the second threshold is less than the first threshold.
10. The method of claim 1 , wherein the block of memory cells comprises any of a NAND string of memory cells and a NOR string of memory cells.
11. Apparatus comprising:
a memory device comprising a block of memory cells that includes a select gate transistor, wherein the select gate transistor is not used to store user data;
a post-write read module configured to perform a read operation after a plurality of memory cells in the block of memory cells have been programmed with data, calculate a bit error rate based on results of the read operation, and compare the calculated bit error rate to a first threshold,
wherein based on results of the comparing step, the post-write read module selectively invokes a select gate maintenance module configured to: (a) determine a threshold voltage of the select gate transistor, and (b) selectively program the select gate transistor based on the determined threshold voltage.
12. The apparatus of claim 11 , wherein the post-write read module is further configured to compare the calculated bit error rate to a second threshold, and based on results of the second comparison, selectively invoke the select gate maintenance module, and continue to program memory cells in the block of memory cells with data.
13. The apparatus of claim 12 , wherein the second threshold comprises a fixed value.
14. The apparatus of claim 12 , wherein the second threshold comprises an adaptive value.
15. The apparatus of claim 12 , wherein the second threshold is less than the first threshold.
16. The apparatus of claim 11 , wherein the block of memory cells comprises any of a NAND string of memory cells and a NOR string of memory cells.
17. A system comprising:
a memory array comprising a block of memory cells that includes a select gate transistor, wherein the select gate transistor is not used to store user data;
a controller configured to program a plurality of memory cells in the block of memory cells; and
a post-write read module configured to read the plurality of programmed memory cells, calculate a bit error rate based on results of the read, and compare the calculated bit error rate to an adaptive threshold,
wherein based on results of the comparing step, the post-write read module selectively invokes a select gate maintenance module configured to: (a) determine a threshold voltage of the select gate transistor, and (b) selectively program the select gate transistor based on the determined threshold voltage.
18. The system of claim 17 , wherein the select gate maintenance module is further configured to increment a false alarm count if the calculated bit error rate is greater than the adaptive threshold, and the determined threshold voltage is not below a first predetermined value and not above a second predetermined value.
19. The system of claim 18 , wherein the adaptive threshold comprises a value that is adjusted if the false alarm count exceeds a first threshold false alarm count.
20. The system of claim 17 , wherein the memory array comprises any of a NAND string of memory cells and a NOR string of memory cells.