IP Library Granted Patent US 11,637,009
Granted Patent B2
US 11,637,009 · App. 16/332,546 · Granted Apr 25, 2023

Cleaning method of glass substrate, manufacturing method of semiconductor device, and glass substrate

Inventors: Shunpei Yamazaki (Setagaya, JP); Masataka Sato (Tochigi, JP); Satoru Idojiri (Tochigi, JP); Natsuko Takase (Isehara, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L21/02041H01L21/304H01L21/30604B23K26/38
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Quick Facts
Patent No.
US 11,637,009
App. No.
16/332,546
Granted
Apr 25, 2023
Kind
B2
Abstract

A glass substrate is reused. The mass productivity of a semiconductor device is increased. A glass substrate one surface of which includes a first material and a second material. The first material includes one or both of a metal and a metal oxide. The second material includes one or both of a resin and a decomposition product of a resin. A cleaning method of a glass substrate, which includes a step of preparing the glass substrate one surface of which includes a first material and a second material and a step of exposing the first material by removing at least part of the second material.

Claims (47)

1. A method for manufacturing a display device, comprising:

a step of forming a stack over a first formation substrate;

a step of irradiating the stack with laser light through the first formation substrate;

a step of separating the stack and the first formation substrate; and

a step of attaching a first substrate including a flexible material to a surface of the stack where the first formation substrate is separated,

wherein the stack comprises a layer comprising a transistor and a light-emitting device, and a resin layer between the layer and the first formation substrate,

wherein an inside of the resin layer is irradiated with the laser light at the step of irradiating the stack with the laser light, and

wherein the number of shots of the laser light are 10 shots to 40 shots.

2. The method for manufacturing a display device according to claim 1 ,

wherein the stack comprises a second substrate including a flexible material, and

wherein the layer is between the first formation substrate and the second substrate.

3. The method for manufacturing a display device according to claim 2 , wherein the second substrate is attached onto the layer by a bonding layer.

4. The method for manufacturing a display device according to claim 1 ,

wherein the stack comprises a second substrate, and

wherein the layer is between the first formation substrate and the second substrate.

5. The method for manufacturing a display device according to claim 1 , wherein the separation is executed in a manner that a part of the resin layer remains over the first formation substrate.

6. The method for manufacturing a display device according to claim 1 , wherein a channel formation region of the transistor comprises a polycrystalline silicon.

7. The method for manufacturing a display device according to claim 1 , wherein the transistor is between the first formation substrate and the light-emitting device.

8. A method for manufacturing a display device, comprising:

a step of forming a stack over a first formation substrate and a metal oxide layer;

a step of irradiating the first formation substrate with at least a first shot and a second shot of laser light;

a step of separating the stack and the first formation substrate; and

a step of attaching a first substrate including a flexible material to a surface of the stack where the first formation substrate is separated,

wherein the stack comprises a layer comprising a transistor and a light-emitting device, and a resin layer between the layer and the first formation substrate,

wherein the metal oxide layer is positioned over the first formation substrate,

wherein the focus of the laser light is at the interface between the resin layer and the metal oxide layer or a vicinity thereof, and

wherein a portion overlapping with the first shot of the laser light and the second shot of the laser light is provided at the step of irradiating the first formation substrate with the laser light.

9. The method for manufacturing a display device according to claim 8 ,

wherein the stack comprises a second substrate including a flexible material, and

wherein the layer is between the first formation substrate and the second substrate.

10. The method for manufacturing a display device according to claim 9 , wherein the second substrate is attached onto the layer by a bonding layer.

11. The method for manufacturing a display device according to claim 8 ,

wherein the stack comprises a second formation substrate, and

wherein the layer is between the first formation substrate and the second formation substrate.

12. The method for manufacturing a display device according to claim 8 , wherein an inside of the resin layer is irradiated with the laser light at the step of irradiating the stack with the laser light.

13. The method for manufacturing a display device according to claim 8 ,

wherein the stack comprises a second substrate including a flexible material,

wherein the layer is between the first formation substrate and the second substrate, and

wherein an inside of the resin layer is irradiated with the laser light at the step of irradiating the stack with the laser light.

14. The method for manufacturing a display device according to claim 8 , wherein the second substrate is attached onto the layer by a bonding layer.

15. The method for manufacturing a display device according to claim 8 ,

wherein the stack comprises a second formation substrate,

wherein the layer is between the first formation substrate and the second formation substrate, and

wherein an inside of the resin layer is irradiated with the laser light at the step of irradiating the stack with the laser light.

16. The method for manufacturing a display device according to claim 8 , wherein the separation is executed in a manner that a part of the resin layer remains over the first formation substrate.

17. The method for manufacturing a display device according to claim 8 , wherein a channel formation region of the transistor comprises a polycrystalline silicon.

18. The method for manufacturing a display device according to claim 8 , wherein the transistor is between the first formation substrate and the light-emitting device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2019
From: YAMAZAKI, SHUNPEI; SATO, MASATAKA; IDOJIRI, SATORU; TAKASE, NATSUKO
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 048573/0676 →
Priority Claims (1)
JP JP2016-198925 · Oct 7, 2016 · national
Continuity (1)
Related Publication 20210090879A1 · Mar 25, 2021
Cited By (1)
US 12,437,985