IP Library Granted Patent US 12,437,985
Granted Patent B2
US 12,437,985 · App. 18/137,553 · Granted Oct 7, 2025

Cleaning method of glass substrate, manufacturing method of semiconductor device, and glass substrate

Inventors: Shunpei Yamazaki (Setagaya, JP); Masataka Sato (Tochigi, JP); Satoru Idojiri (Tochigi, JP); Natsuko Takase (Isehara, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L21/02041H01L21/304H01L21/30604B23K26/38
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Quick Facts
Patent No.
US 12,437,985
App. No.
18/137,553
Granted
Oct 7, 2025
Kind
B2
Abstract

A glass substrate is reused. The mass productivity of a semiconductor device is increased. A glass substrate one surface of which includes a first material and a second material. The first material includes one or both of a metal and a metal oxide. The second material includes one or both of a resin and a decomposition product of a resin. A cleaning method of a glass substrate, which includes a step of preparing the glass substrate one surface of which includes a first material and a second material and a step of exposing the first material by removing at least part of the second material.

Claims (47)

1. A method for manufacturing a display device, comprising:

a step of forming a stack and a metal oxide layer over a first formation substrate;

a step of irradiating the stack with laser light through the first formation substrate;

a step of separating the stack and the metal oxide layer; and

a step of attaching a first substrate including a flexible material to a surface of the stack where the metal oxide layer is separated,

wherein the stack comprises a layer comprising a transistor and a light-emitting device, and a resin layer between the layer and the first formation substrate, and

wherein a focus of the laser light is at an interface between the resin layer and the metal oxide layer or a vicinity thereof.

2. The method for manufacturing a display device according to claim 1 ,

wherein the stack comprises a second substrate, and

wherein the layer is between the first formation substrate and the second substrate.

3. The method for manufacturing a display device according to claim 2 , wherein the second substrate is attached onto the layer by a bonding layer.

4. The method for manufacturing a display device according to claim 2 , wherein the second substrate comprises a flexible material.

5. The method for manufacturing a display device according to claim 1 , wherein the separation is executed in a manner that a part of the resin layer remains over the first formation substrate.

6. The method for manufacturing a display device according to claim 1 , wherein a channel formation region of the transistor comprises polycrystalline silicon.

7. The method for manufacturing a display device according to claim 1 , wherein the transistor is between the first formation substrate and the light-emitting device.

8. A method for manufacturing a display device, comprising:

a step of forming a first stack over a second stack;

a step of performing laser irradiation through a first formation substrate;

a step of separating the first stack and the second stack; and

a step of attaching a first substrate to a first surface of the first stack, the first surface being a surface where the second stack is separated,

wherein the first stack comprises a first layer comprising a transistor and a light-emitting device, and a resin layer between the first layer and the second stack,

wherein the second stack comprises the first formation substrate and a second layer over the first formation substrate, and

wherein a focus of the laser light is the first surface of the first stack.

9. The method for manufacturing a display device according to claim 8 ,

wherein the first stack comprises a second substrate, and

wherein the first layer is between the first formation substrate and the second substrate.

10. The method for manufacturing a display device according to claim 9 , wherein the second substrate is attached onto the first layer by a bonding layer.

11. The method for manufacturing a display device according to claim 9 , wherein the second substrate comprises a flexible material.

12. The method for manufacturing a display device according to claim 8 , wherein the separation is executed in a manner that a part of the resin layer remains over the second stack.

13. The method for manufacturing a display device according to claim 8 , wherein a channel formation region of the transistor comprises polycrystalline silicon.

14. The method for manufacturing a display device according to claim 8 , wherein the transistor is between the first formation substrate and the light-emitting device.

15. A method for manufacturing a display device, comprising:

a step of forming a first stack over a second stack;

a step of performing laser irradiation through a first formation substrate;

a step of separating the first stack and the second stack; and

a step of attaching a first substrate including a flexible material to a first surface of the first stack, the first surface being a surface where the second stack is separated,

wherein the first stack comprises a first layer comprising a transistor and a light-emitting device, and a resin layer between the first layer and the second stack,

wherein the second stack comprises the first formation substrate and a second layer over the first formation substrate, and

wherein a focus of the laser light is the first surface of the first stack.

16. The method for manufacturing a display device according to claim 15 ,

wherein the first stack comprises a second substrate, and

wherein the first layer is between the first formation substrate and the second substrate.

17. The method for manufacturing a display device according to claim 16 , wherein the second substrate is attached onto the first layer by a bonding layer.

18. The method for manufacturing a display device according to claim 16 , wherein the second substrate comprises a flexible material.

19. The method for manufacturing a display device according to claim 15 , wherein a channel formation region of the transistor comprises polycrystalline silicon.

20. The method for manufacturing a display device according to claim 15 , wherein the transistor is between the first formation substrate and the light-emitting device.

21. The method for manufacturing a display device according to claim 8 , wherein the second layer is a metal oxide layer.

Priority Claims (1)
JP 2016-198925 · Oct 7, 2016 · national
Continuity (2)
Continuation 16332546
Related Publication 20230260778A1 · Aug 17, 2023
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