IP Library Granted Patent US 10,741,353
Granted Patent B2
US 10,741,353 · App. 16/362,837 · Granted Aug 11, 2020

Electron emitting construct configured with ion bombardment resistant

Inventors: Hidenori Kenmotsu (Machida, JP); Hitoshi Masuya (Kashiwa, JP); Koichi Iida (Kayabe, JP)
Assignee: NANO-X IMAGING LTD
H01J35/065H01J35/08H01J35/14H01J1/3042H01J2235/062H01J2235/086
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Quick Facts
Patent No.
US 10,741,353
App. No.
16/362,837
Granted
Aug 11, 2020
Kind
B2
Abstract

A robust cold cathode uses an electron emitting construct design possibly for an x-ray emitter device. The electron beam emitted by the emitting construct is focused and accelerated by an electrical field towards an electron anode target. A shield is provided to prevent a cold cathode from being damaged by ion bombardment in high-voltage applications and a non-emitter zone may provide a robust ion bombardment zone. The system is further configured to provide an angled target anode or a stepped target anode to further reduce the ion bombardment damage.

Claims (20)

1. An x-ray emitting device comprising:

an electron anode target; and

a cold cathode electron source having

at least one electron emitting zone configured to emit electrons towards said electron anode target, and

at least one non-emitting ion bombardment zone,

wherein said at least one electron emitting zone further comprises

an electrically insulating substrate,

an array of nano-Spindt field emission type electron sources,

a plurality of control contacts configured for controlling said electron sources,

a focus electrode configured for applying a voltage above said array, and

a shield disposed over said control contacts, said shield constituting part of the focus electrode, and

wherein said at least one non-emitting ion bombardment zone is disposed along a line perpendicular to the surface of said electron anode target; said at least one ion bombardment zone being distinct from said electron emitting zone of said cold cathode electron source.

2. The x-ray emitter device of claim 1 , further comprising a focus structure configured to direct electron towards said electron anode target such that said electrons strike an electron focal spot at an angle.

3. The x-ray emitter device of claim 2 , wherein said at least one ion bombardment zone is disposed along a line perpendicular to the surface of said electron anode target at said electron focal spot.

4. The x-ray emitter device of claim 2 , wherein said at least one ion bombardment zone has larger dimensions than said electron focal spot.

5. The x-ray emitter device of claim 2 , wherein said at least one ion bombardment zone is coated with an elemental material.

6. The x-ray emitter device of claim 5 , wherein said elemental material comprises a pure metal.

7. The x-ray emitter device of claim 5 , wherein said elemental material comprises carbon.

8. The x-ray emitter device of claim 2 , wherein said at least one ion bombardment zone comprises a central region surrounded by said electron emitting zone of said cold cathode electron source.

9. The x-ray emitter device of claim 2 , wherein the electrically insulating substrate is silicon-based.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 14, 2020
From: KENMOTSU, HIDENORI; MASUYA, HITOSHI; IIDA, KOICHI
To: NANOX IMAGING PLC.
Reel/Frame 052657/0212 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2019
From: NANOX IMAGING PLC.
To: NANO-X IMAGING LTD
Reel/Frame 050966/0035 →
Continuity (4)
Continuation 15038737
Provisional Application 62013567 · Jun 18, 2014
Provisional Application 61909387 · Nov 27, 2013
Related Publication 20190221398A1 · Jul 18, 2019
Cited By (2)
US 12,451,317 US 12,451,318