System and method to enhance solder joint reliability
A reliability cover that is disposed over at least one of an integrated circuit package and a Si die of the integrated circuit package is disclosed. The integrated circuit package is mountable to a printed circuit board via a plurality of solder balls. The reliability cover is configured to reduce a difference in a coefficient of thermal expansion between the integrated circuit package and the printed circuit board, and between the Si die and a substrate of the integrated circuit package by a threshold value.
1. A method comprising:
identifying a failure profile of solder joints formed between a first component and a level of interconnects and between the level of interconnects and a second component; and
disposing a reliability cover over one or more surfaces of at least one of the first component and the second component based upon the failure profile,
wherein the reliability cover comprises a package level reliability cover that is disposed on at least a portion of an integrated circuit package, and wherein a second reliability cover comprises a die level reliability cover that is disposed on at least a portion of a die.
2. The method of claim 1 , wherein the first component is the integrated circuit package.
3. The method of claim 2 , wherein the second component is a printed circuit board.
4. The method of claim 3 , wherein identifying the failure profile comprises identifying a difference in a coefficient of thermal expansion between the integrated circuit package and the printed circuit board.
5. The method of claim 3 , wherein the reliability cover is disposed on the one or more surfaces of the integrated circuit package whose difference in a coefficient of thermal expansion between the integrated circuit package and the printed circuit board is greater than a threshold value.
6. The method of claim 1 , wherein the first component is a Si die, and the second component is a substrate of the integrated circuit package.
7. The method of claim 6 , wherein identifying the failure profile comprises identifying a difference in a coefficient of thermal expansion between the substrate of the integrated circuit package and the Si die.
8. The method of claim 6 , wherein the reliability cover is disposed over the one or more surfaces of the Si die whose difference in a coefficient of thermal expansion between the substrate of the integrated circuit package and the Si die is greater than a threshold value.
9. The method of claim 2 , wherein the reliability cover is disposed over the integrated circuit package and covers a total area that is less than an entire top surface area of the integrated circuit package.
10. The method of claim 1 , wherein the reliability cover is deposited as a film.
11. The method of claim 1 , wherein the reliability cover is configured as a mechanical lid.
12. The method of claim 2 , wherein an air release hole on a surface of the reliability cover vents air pressure from between the reliability cover and the integrated circuit package.
13. The method of claim 2 , wherein a thickness of the reliability cover is scaled based on a height of the integrated circuit package, a coefficient of thermal expansion of the integrated circuit package, and a coefficient of thermal expansion of the reliability cover.
14. The method of claim 6 , wherein the reliability cover comprises a die level reliability cover that is disposed on an interposer layer formed between the substrate of the integrated circuit package and the Si die.
15. The method of claim 3 , wherein the reliability cover comprises one or more reliability cover portions, and each of the one or more reliability cover portions is configured to reduce a difference in a coefficient of thermal expansion between the integrated circuit package and the printed circuit board by varying threshold values.
16. The method of claim 9 , wherein the second component is a printed circuit board, and wherein the integrated circuit package is mounted to the printed circuit board via a plurality of solder balls.
17. The method of claim 16 , wherein the total area corresponds to a failure profile of solder joints formed between the plurality of solder balls and the integrated circuit package and between the plurality of solder balls and the printed circuit board.
18. The method of claim 1 , wherein the reliability cover is disposed along at least a portion of a perimeter of a top surface of the integrated circuit package.
19. The method of claim 1 , wherein the reliability cover is disposed at one or more corners of a top surface of the integrated circuit package.
20. The method of claim 1 , wherein the die is a Si die.