Systems and methods for evaluating integrity of adjacent sub blocks of data storage apparatuses
The disclosure relates in some aspects to a design for a data storage apparatus with a non-volatile memory that includes a block of memory comprising N wordlines partitioned into a first sub-block comprising a first subset of the N wordlines and a second sub-block comprising a second subset of the N wordlines different than the first subset. In some aspects, the disclosure relates to detecting a failure in a first sub-block. The second sub-block is then marked, in response to a failure detection in the first sub-block, with an initial designation as an unusable sub-block, and a test of the second sub-block is performed to determine a usability of the second sub-block. Based on the test, the second sub-block is then marked with a second designation that is one of a tested usable sub-block or a tested unusable sub-block.
1. A data storage apparatus, comprising:
a non-volatile memory, wherein:
the non-volatile memory includes a block comprising N wordlines physically partitioned on the block into a first sub-block and a second sub-block;
the first sub-block comprises a first subset of the N wordlines; and
the second sub-block comprises a second subset of the N wordlines different than the first subset; and
one or more processors, individually or in combination, configured to:
determine whether a failure has been detected in the first sub-block;
in response to determining that the failure has been detected in the first sub-block:
mark the second sub-block with an initial designation as a defective sub-block;
perform at least one test on the second sub-block to determine a usability of the second sub-block; and
mark, based on the at least one test, the second sub-block with a second designation that is one of a tested usable sub-block or a tested defective sub-block; and
in response to determining that the failure has not been detected in the first sub-block:
refrain from marking the second sub-block with the initial designation as a defective sub-block.
2. The data storage apparatus of claim 1 , wherein the failure is associated with at least one of a program failure, an erase failure, or a read disturb failure.
3. The data storage apparatus of claim 1 , wherein the one or more processors is further configured to relocate data stored in the second sub-block in response to the failure in the first sub-block and before marking the second sub-block with the initial designation.
4. The data storage apparatus of claim 1 , wherein the one or more processors is further configured to perform the at least one test on the second sub-block during a run time of a solid state device (SSD) of the data storage apparatus.
5. The data storage apparatus of claim 4 , wherein the one or more processors is further configured to perform the at least one test on the second sub-block via firmware.
6. The data storage apparatus of claim 1 , wherein the one or more processors is further configured to perform the at least one test on the second sub-block during an idle time of a solid state device (SSD) of the data storage apparatus.
7. The data storage apparatus of claim 1 , wherein the at least one test on the second sub-block comprises at least one of an erase test, a program test, or a read test.
8. The data storage apparatus of claim 1 , wherein the first sub-block and the second sub-block are physically partitioned on the block by at least one dummy wordline.
9. The data storage apparatus of claim 1 , wherein the one or more processors is further configured to, in response to determining that the failure has not been detected in the first sub-block:
refrain from performing the at least one test on the second sub-block.
10. A data storage method operable on a non-volatile memory, wherein the non-volatile memory includes a block comprising N wordlines physically partitioned on the block into a first sub-block and a second sub-block, and wherein the first sub-block comprises a first subset of the N wordlines and the second sub-block comprises a second subset of the N wordlines different than the first subset, the data storage method comprising:
determining whether a failure has been detected in the first sub-block;
in response to determining that the failure has been detected in the first sub-block:
marking the second sub-block with an initial designation as a defective sub-block;
performing at least one test on the second sub-block to determine a usability of the second sub-block; and
marking, based on the at least one test, the second sub-block with a second designation that is one of a tested usable sub-block or a tested defective sub-block; and
in response to determining that the failure has not been detected in the first sub-block:
refraining from marking the second sub-block with the initial designation as a defective sub-block.
11. The data storage method of claim 10 , wherein the failure is associated with at least one of a program failure, an erase failure, or a read disturb failure.
12. The data storage method of claim 10 , further comprising relocating data residing in the second sub-block in response to the failure.
13. The data storage method of claim 10 , further comprising performing the at least one test on the second sub-block during a run time of a solid state device (SSD).
14. The data storage method of claim 13 , further comprising performing the at least one test on the second sub-block via firmware.
15. The data storage method of claim 10 , further comprising performing the at least one test on the second sub-block during an idle time of a solid state device (SSD).
16. The data storage method of claim 10 , wherein the at least one test on the second sub-block comprises at least one of an erase test, a program test, or a read test.
17. The data storage method of claim 10 , further comprising physically partitioning the first sub-block and the second sub-block via at least one dummy wordline.
18. The data storage method of claim 10 , further comprising, in response to determining that the failure has not been detected in the first sub-block:
refraining from performing the at least one test on the second sub-block.
19. A data storage apparatus, comprising:
a non-volatile memory, wherein the non-volatile memory includes a block comprising N wordlines physically partitioned on the block into a first sub-block and a second sub-block, and wherein the first sub-block comprises a first subset of the N consecutive wordlines and the second sub-block comprises a second subset of the N wordlines different than the first subset;
means for determining whether a failure has been detected in the first sub-block;
means for marking, in response to determining that the failure has been detected in the first sub-block, the second sub-block with an initial designation as a defective sub-block;
means for performing, in response to determining that the failure has been detected in the first sub-block, at least one test on the second sub-block to determine a usability of the second sub-block; and
means for marking, based on the at least one test and in response to determining that the failure has been detected in the first sub-block, the second sub-block with a second designation that is one of a tested usable sub-block or a tested defective sub-block; and
wherein the means for marking the second sub-block with the initial designation as the defective sub-block is configured to refrain, in response to determining that the failure has not been detected in the first sub-block, from marking the second sub-block with the initial designation as the defective sub-block.
20. The data storage apparatus of claim 19 , further comprising means for relocating data residing in the second sub-block in response to the failure in the first sub-block.
21. The data storage apparatus of claim 19 , further comprising means for performing the at least one test on the second sub-block during one of a run time or an idle time of a solid state device (SSD).
22. The data storage apparatus of claim 19 , wherein the first sub-block and the second sub-block are physically partitioned on the block by at least one dummy wordline.
23. The data storage apparatus of claim 19 , wherein the means for marking the second sub-block with the initial designation as the defective sub-block is further configured to refrain, in response to determining that the failure has not been detected in the first sub-block, from performing the at least one test on the second sub-block.