Method of fabricating semiconductor device having resistance elements
A semiconductor device includes as a resistance element a first polycrystalline silicon and a second polycrystalline silicon containing impurities, such as boron, of the same kind and having different widths. The first polycrystalline silicon contains the impurities at a concentration C X . The second polycrystalline silicon has a width larger than a width of the first polycrystalline silicon and contains the impurities of the same kind at a concentration C Y lower than the concentration C X . A sign of a temperature coefficient of resistance (TCR) of the first polycrystalline silicon changes at the concentration C X . A sign of a TCR of the second polycrystalline silicon changes at the concentration C Y .
1. A semiconductor device fabrication method comprising:
acquiring a relationship between a concentration of first impurities and a temperature coefficient for a first polycrystalline silicon having a first width and a second polycrystalline silicon having a second width larger than the first width;
setting, on the basis of the relationship, a first concentration of the first impurities in the first polycrystalline silicon and a second concentration of the first impurities in the second polycrystalline silicon; and
forming the first polycrystalline silicon containing the first impurities at the first concentration and the second polycrystalline silicon containing the first impurities at the second concentration, wherein:
the first polycrystalline silicon contains the first impurities at the first concentration throughout a direction perpendicular to a direction of the first width, in a plan view; and
the second polycrystalline silicon contains the first impurities at the second concentration throughout a direction perpendicular to a direction of the second width, in the plan view.
2. The semiconductor device fabrication method according to claim 1 , wherein:
the second concentration is lower than the first concentration;
a sign of the temperature coefficient of the first polycrystalline silicon changes at the first concentration; and
a sign of the temperature coefficient of the second polycrystalline silicon changes at the second concentration.
3. The semiconductor device fabrication method according to claim 1 , wherein:
the second concentration is same as or lower than the first concentration;
the first polycrystalline silicon containing the first impurities at the first concentration has a negative temperature coefficient; and
the second polycrystalline silicon containing the first impurities at the second concentration has a positive temperature coefficient.
4. The semiconductor device fabrication method according to claim 1 , wherein the first concentration and the second concentration are higher than or equal to 1×10 20 cm −3 and lower than or equal to 1×10 21 cm −3 .
5. The semiconductor device fabrication method according to claim 1 , wherein the first polycrystalline silicon and the second polycrystalline silicon are electrically connected in series.
6. The semiconductor device fabrication method according to claim 1 , wherein the first polycrystalline silicon and the second polycrystalline silicon are electrically connected in parallel.
7. The semiconductor device fabrication method according to claim 1 , wherein one end portion of the first polycrystalline silicon and one end portion of the second polycrystalline silicon are electrically connected in series.
8. The semiconductor device fabrication method according to claim 1 , wherein:
one end portion of the first polycrystalline silicon and one end portion of the second polycrystalline silicon are electrically connected;
the other end portion of the first polycrystalline silicon and the other end portion of the second polycrystalline silicon are electrically connected; and
the first polycrystalline silicon and the second polycrystalline silicon are electrically connected in parallel.
9. The semiconductor device fabrication method according to claim 1 , wherein the first impurities are p-type impurities.
10. The semiconductor device fabrication method according to claim 1 , wherein the first polycrystalline silicon and the second polycrystalline silicon are formed as continuous one body and electrically connected.
11. The semiconductor device fabrication method according to claim 10 , wherein the first polycrystalline silicon and the second polycrystalline silicon are electrically connected in series.
12. The semiconductor device fabrication method according to claim 1 , wherein a first sheet resistance of the first polycrystalline silicon and a second sheet resistance of the second polycrystalline silicon are equal or almost equal.
13. A semiconductor device fabrication method comprising:
acquiring a relationship between a concentration of first impurities and a temperature coefficient for a first polycrystalline silicon having a first width and a second polycrystalline silicon having a second width larger than the first width;
setting, on the basis of the relationship, a first concentration of the first impurities in the first polycrystalline silicon and a second concentration of the first impurities in the second polycrystalline silicon; and
forming the first polycrystalline silicon containing the first impurities at the first concentration and the second polycrystalline silicon containing the first impurities at the second concentration in a same layer.
14. The semiconductor device fabrication method according to claim 13 , wherein:
the second concentration is lower than the first concentration;
a sign of the temperature coefficient of the first polycrystalline silicon changes at the first concentration; and
a sign of the temperature coefficient of the second polycrystalline silicon changes at the second concentration.
15. The semiconductor device fabrication method according to claim 13 , wherein:
the second concentration is same as or lower than the first concentration;
the first polycrystalline silicon containing the first impurities at the first concentration has a negative temperature coefficient; and
the second polycrystalline silicon containing the first impurities at the second concentration has a positive temperature coefficient.
16. The semiconductor device fabrication method according to claim 13 , wherein:
the first polycrystalline silicon contains the first impurities at the first concentration throughout a direction perpendicular to a direction of the first width, in a plan view; and
the second polycrystalline silicon contains the first impurities at the second concentration throughout a direction perpendicular to a direction of the second width, in the plan view.
17. The semiconductor device fabrication method according to claim 13 , wherein the first polycrystalline silicon and the second polycrystalline silicon are formed as continuous one body and electrically connected.
18. The semiconductor device fabrication method according to claim 13 , wherein a first sheet resistance of the first polycrystalline silicon and a second sheet resistance of the second polycrystalline silicon are equal or almost equal.
19. A semiconductor device fabrication method comprising:
acquiring a relationship between a concentration of first impurities and a temperature coefficient for a first polycrystalline silicon having a first width and a second polycrystalline silicon having a second width larger than the first width;
setting, on the basis of the relationship, a first concentration of the first impurities in the first polycrystalline silicon and a second concentration of the first impurities in the second polycrystalline silicon; and
forming the first polycrystalline silicon containing the first impurities at the first concentration and the second polycrystalline silicon containing the first impurities at the second concentration, wherein:
the second concentration is lower than the first concentration;
the first polycrystalline silicon containing the first impurities at the first concentration has a negative temperature coefficient;
the second polycrystalline silicon containing the first impurities at the second concentration has a positive temperature coefficient; and
a first sheet resistance of the first polycrystalline silicon is higher than a second sheet resistance of the second polycrystalline silicon.
20. The semiconductor device fabrication method according to claim 19 , wherein:
the first polycrystalline silicon contains the first impurities at the first concentration throughout a direction perpendicular to a direction of the first width, in a plan view; and
the second polycrystalline silicon contains the first impurities at the second concentration throughout a direction perpendicular to a direction of the second width, in the plan view.
21. The semiconductor device fabrication method according to claim 19 , wherein the first polycrystalline silicon and the second polycrystalline silicon are formed as continuous one body and electrically connected.