IP Library Patent Application 16495652
Patent Application
App. No. 16/495,652

DRY ETCHING APPARATUS AND DRY ETCHING METHOD

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Quick Facts
Patent No.
US None
App. No.
16/495,652
Abstract

According to a dry etching method using plasma, when an organic film is etched, a first step of irradiating an organic film of a sample only with oxygen radicals while Ar ions are shielded, and a second step of irradiating the organic film with ions of a noble gas are alternately repeated, thereby an accurate etching process can be performed while a variation in etching of the organic film is suppressed. This makes it possible to suppress collapse of an LS pattern formed in a silicon substrate or the like.

Claims (15)

1 . A dry etching method of an organic film,

wherein a first step of allowing neutral radicals to be adsorbed by a surface of an organic film in a first atmosphere having a decreased concentration of ions of a noble gas or nitrogen in plasma, and a second step of supplying the ions of the noble gas or nitrogen to the surface of the organic film in a second atmosphere having a higher ion concentration than the first atmosphere are alternately repeated.

2 . The dry etching method according to claim 1 , wherein the neutral radicals are radicals of oxygen or hydrogen.

3 . The dry etching method according to claim 1 , wherein the noble gas is argon gas.

4 . The dry etching method according to claim 1 , wherein the organic film is made of PMMA.

5 . The dry etching method according to claim 1 , wherein in the first step, the neutral radicals are adsorbed in a saturated manner by the organic film.

6 . The dry etching method according to claim 1 , wherein the first step has a longer processing time than the second step.

7 . A dry etching apparatus performing the dry etching method according to claim 1 , comprising:

a plasma generator that generates plasma in a decompression treatment chamber;

a plate with many through-hole placed in the decompression treatment chamber; and

a plasma controller capable of changing a generation position of the plasma to be above or below the plate.

8 . A dry etching apparatus performing the dry etching method according to claim 1 , comprising:

a first device that irradiates an organic film of a sample with neutral radicals in the first atmosphere;

a second device that irradiates the organic film of the sample with ions of a noble gas or nitrogen in the second atmosphere; and

a transfer device that transfers the sample from the first device to the second device, or from the second device to the first device.

Assignments (2)
CHANGE OF NAME Recorded Mar 25, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052225/0894 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2019
From: KOFUJI, NAOYUKI; KUWAHARA, KENICHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 050434/0673 →