IP Library Granted Patent US 11,487,201
Granted Patent B2
US 11,487,201 · App. 16/498,139 · Granted Nov 1, 2022

Photosensitive resin composition, method of manufacturing pattern cured product, cured product, interlayer insulating film, cover-coat layer, surface protective film, and electronic component

Inventors: Etsuharu Tsuchiya (Tokyo, JP); Tetsuya Enomoto (Hitachi, JP); Takashi Kawamori (Tokyo, JP); Nobuyuki Saito (Hitachi, JP); Yukari Koibuchi (Hitachi, JP); Atsutaro Yoshizawa (Hitachi, JP); Akira Asada (Hitachi, JP)
Assignee: HD MicroSystems, Ltd.
G03F7/037C08G73/10G03F7/028G03F7/0382G03F7/2004
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,487,201
App. No.
16/498,139
Granted
Nov 1, 2022
Kind
B2
Abstract

A photosensitive resin composition comprising (A) a polyimide precursor having a polymerizable unsaturated bond; (B) a polymerizable monomer having an aliphatic cyclic skeleton; (C) a photopolymerization initiator; and (D) a solvent.

Claims (27)

1. A photosensitive resin composition consisting essentially of:

(A) a polyimide precursor having a polymerizable unsaturated bond;

(B) a polymerizable monomer having an aliphatic cyclic skeleton;

(C) a photopolymerization initiator;

(D) a solvent; and

optionally, one or more of a thermal polymerization initiator, a coupling agent, a surfactant or a leveling agent, a rust inhibitor, and a polymerization inhibitor.

2. The photosensitive resin composition according to claim 1 , wherein the component (A) is a polyimide precursor having a structural unit represented by the following formula (1):

wherein in the formula (1), X 1 is a tetravalent aromatic group, —COOR 1 group and —CONH— group are on the ortho-position to each other, —COOR 2 group and —CO— group are on the ortho-position to each other; Y 1 is a divalent aromatic group; R 1 and R 2 are independently a hydrogen atom, a group represented by the following formula (2), or an aliphatic hydrocarbon group having 1 to 4 carbon atoms; and at least one of R 1 and R 2 is a group represented by the formula (2);

wherein in the formula (2), R 3 to R 5 is independently a hydrogen atom or an aliphatic hydrocarbon group having 1 to 3 carbon atoms, and m is an integer of 1 to 10.

3. The photosensitive resin composition according to claim 1 , wherein the component (B) comprises a polymerizable monomer having a group comprising a polymerizable unsaturated double bond and having an aliphatic cyclic skeleton.

4. The photosensitive resin composition according to claim 3 , wherein the polymerizable monomer has two or more groups comprising the polymerizable unsaturated double bond.

5. The photosensitive resin composition according to claim 1 , wherein the component (B) comprises a polymerizable monomer represented by the following formula (3):

wherein in the formula (3), R 6 and R 7 are independently an aliphatic hydrocarbon group having 1 to 4 carbon atoms or a group represented by the following formula (4); n1 is 0 or 1; n2 is an integer of 0 to 2; the number of n1+n2 is 1 or more; and at least one of n1-number of R 6 and n2-number of R 7 is a group represented by the following formula (4);

wherein in the formula (4), R 9 to R 11 is independently a hydrogen atom or an aliphatic hydrocarbon group having 1 to 3 carbon atoms, and I is an integer of 0 to 10.

6. The photosensitive resin composition according to claim 5 , wherein the number of n1+n2 is 2 or 3.

7. The photosensitive resin composition according to claim 1 , wherein the component (B) comprises a polymerizable monomer represented by the following formula (5)

8. The photosensitive resin composition according to claim 1 , further comprising (E) a thermal polymerization initiator.

9. A method of manufacturing the pattern cured product comprising:

applying the photosensitive resin composition according to claim 1 on a substrate and drying the photosensitive resin composition to form a photosensitive resin film;

pattern-exposing the photosensitive resin film to obtain a resin film;

developing the resin film after the pattern exposure using an organic solvent to obtain a pattern resin film; and

heat-treating the pattern resin film.

10. The method for manufacturing the pattern cured product according to claim 9 , wherein a temperature of the heat treatment is 200° C. or less.

11. A cured product obtained by coating and then curing the photosensitive resin composition according to claim 1 .

12. The pattern cured product obtained by the method according to claim 9 .

13. An interlayer insulating film, a cover coat layer, or a surface protective film comprising the cured product according to claim 11 .

14. An electronic component comprising a semiconductor substrate having a circuit device and the interlayer insulating film, the cover coat layer, or the surface protective film according to claim 13 provided over the semiconductor substrate having the circuit device.

Assignments (2)
CHANGE OF NAME Recorded Sep 19, 2022
From: HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD.
To: HD MICROSYSTEMS, LTD.
Reel/Frame 061462/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2020
From: TSUCHIYA, ETSUHARU; ENOMOTO, TETSUYA; KAWAMORI, TAKASHI; SAITO, NOBUYUKI; KOIBUCHI, YUKARI; YOSHIZAWA, ATSUTARO; ASADA, AKIRA
To: HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD.
Reel/Frame 051553/0311 →
Priority Claims (1)
WO PCT/JP2017/013729 · Mar 31, 2017 · international
Continuity (1)
Related Publication 20210116809A1 · Apr 22, 2021
Cited By (1)
US 12,386,256