Adaptive power measurement accumulator with a changing sampling frequency
A power meter includes a sampling circuit configured to initially make electrical measurements of a unit under test at a first sampling frequency. The power meter includes an adaptive circuit. The power meter includes an accumulator configured to accumulate electrical measurements of the unit under test from the sampling circuit. After a change in sampling frequency from the first sampling frequency to a second sampling frequency, the sampling circuit makes second electrical measurements at the second sampling frequency. The adaptive circuit is configured to adjust the second electrical measurements from the sampling circuit according to a factor. The factor is based on a relationship between the first sampling frequency and the second sampling frequency. The adjustment yields adjusted second electrical measurements. The accumulator is further configured to accumulate the adjusted second electrical measurements.
1. An apparatus, comprising:
a sampling circuit to initially make electrical measurements of a unit under test at a first sampling frequency;
an adaptive circuit; and
an accumulator to accumulate electrical measurements of the unit under test from the sampling circuit including a plurality of first electrical measurements at the first sampling frequency;
wherein, after a change in sampling frequency from the first sampling frequency to a second sampling frequency:
the sampling circuit is to make a plurality of second electrical measurements at the second sampling frequency;
the adaptive circuit is to adjust a value of the plurality of second electrical measurements from the sampling circuit according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements; and
the accumulator is to accumulate the plurality of adjusted second electrical measurements with the first electrical measurements.
2. The apparatus of claim 1 , wherein the accumulator is to accumulate the plurality of adjusted second electrical measurements made at the second sampling frequency with the plurality of first electrical measurements made at the first sampling frequency without resetting a value of the accumulator.
3. The apparatus of claim 1 , comprising a sample counter to:
initially accumulate a count of the plurality of electrical measurements made by the sampling circuit at the first sampling frequency; and
after a change from the first sampling frequency to the second sampling frequency, accumulate the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency, the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency adjusted by the factor.
4. The apparatus of claim 1 , wherein the adaptive circuit is to receive an indication that the plurality of second electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency.
5. The apparatus of claim 4 , wherein the adaptive circuit is to receive the indication that the plurality of second electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency without notification to a central processing unit, the central processing unit to use a value of the accumulator.
6. The apparatus of claim 1 , wherein the accumulator is to provide a single value of accumulated electrical measurements, the accumulated electrical measurements including electrical measurements made with both the first sampling frequency and the second sampling frequency.
7. The apparatus of claim 1 , wherein:
the adaptive circuit includes a shift circuit;
the factor is given as 2 S , wherein 2 S is equal to a ratio of the first sampling frequency to the second sampling frequency; and
the shift circuit is to shift an accumulated value of electrical measurements by S bits.
8. A method, comprising
with a sampling circuit, initially making electrical measurements of a unit under test at a first sampling frequency including a plurality of first electrical measurements at the first sampling frequency;
with an accumulator, accumulating electrical measurements of the unit under test;
with an adaptive circuit, determining a change in sampling frequency from the first sampling frequency to a second sampling frequency;
with the sampling circuit, making a plurality of second electrical measurements at the second sampling frequency after determining the change in sampling frequency;
with the adaptive circuit, adjusting a value of the second electrical measurements according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements; and
with the accumulator, accumulating the plurality of adjusted second electrical measurements with the plurality of first electrical measurements.
9. The method of claim 8 , comprising accumulating the plurality of adjusted second electrical measurements made at the second sampling frequency with the plurality of first electrical measurements made at the first sampling frequency without resetting a value of accumulation.
10. The method of claim 8 , comprising:
maintaining a sample count;
initially accumulating a count of the plurality of first electrical measurements made at the first sampling frequency in the sample count; and
after a change from the first sampling frequency to the second sampling frequency, accumulating the count of the plurality of second electrical measurements made at the second sampling frequency in the sample count, the count of the plurality of second electrical measurements made at the second sampling frequency adjusted by the factor.
11. The method of claim 8 , comprising receiving an indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency.
12. The method of claim 11 , comprising receiving the indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency without notification to a central processing unit, the central processing unit to use a value of the accumulator.
13. The method of claim 8 , comprising providing a single value of accumulated electrical measurements, the accumulated electrical measurements including electrical measurements made with both the first sampling frequency and the second sampling frequency.
14. The method of claim 8 , wherein:
the adjustment is performed with a shift circuit;
the factor is given as 2 S , wherein 2 S is equal to a ratio of the first sampling frequency to the second sampling frequency; and
the method comprises using the shift circuit to shift an accumulated value of electrical measurements by S bits.
15. A system, comprising:
a processor; and
a power meter, including:
a sampling circuit to initially make electrical measurements of a unit under test at a first sampling frequency;
an adaptive circuit; and
an accumulator to accumulate electrical measurements of the unit under test from the sampling circuit including a plurality of first electrical measurements at the first sampling frequency;
wherein, after a change in sampling frequency from the first sampling frequency to a second sampling frequency:
the sampling circuit is to make a plurality of second electrical measurements at the second sampling frequency;
the adaptive circuit is to adjust a value of the plurality of second electrical measurements from the sampling circuit according to a factor, wherein the factor is a multiplication factor, the factor based on a relationship between the first sampling frequency and the second sampling frequency, to yield a plurality of adjusted second electrical measurements;
the accumulator is to accumulate the plurality of adjusted second electrical measurements; and
the accumulator is to provide an accumulation of adjusted second electrical measurements to the processor with the first electrical measurements.
16. The system of claim 15 , wherein the accumulator is to accumulate the plurality of adjusted second electrical measurements made at the second sampling frequency with the plurality of first electrical measurements made at the first sampling frequency without resetting a value of the accumulator.
17. The system of claim 15 , comprising a sample counter to:
initially accumulate a count of the plurality of first electrical measurements made by the sampling circuit at the first sampling frequency; and
after a change from the first sampling frequency to the second sampling frequency, accumulate the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency, the count of the plurality of second electrical measurements made by the sampling circuit at the second sampling frequency adjusted by the factor.
18. The system of claim 15 , wherein the adaptive circuit is to receive an indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency.
19. The system of claim 18 , wherein the adaptive circuit is to receive the indication that electrical measurements are to be made at the second sampling frequency instead of the first sampling frequency without notification to the processor.
20. The system of claim 15 , wherein the accumulator is to provide a single value of accumulated electrical measurements, the accumulated electrical measurements including electrical measurements made with both the first sampling frequency and the second sampling frequency.