Systems and processes for increasing semiconductor device reliability
A system configured to increase a reliability of electrical connections in a device. The system including a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component. The lead includes an upper portion that includes a lower surface arranged on a lower surface thereof. The lower surface of the upper portion is arranged vertically above a first upper surface of a first pad connection portion; and the lower surface of the upper portion is arranged vertically above a second upper surface of the second pad connection portion. A process configured to increase a reliability of electrical connections in a device is also disclosed.
1. A system configured to increase a reliability of electrical connections in a device, the system comprising:
a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component;
the lead includes a first pad connection portion that includes a first upper surface;
the first pad connection portion configured to connect the lead to the pad of the at least one support structure;
the lead includes a second pad connection portion that includes a second upper surface;
the second pad connection portion configured to connect the lead to the pad of the at least one electrical component;
the lead includes an upper portion that includes a lower surface arranged on a lower surface thereof; and
the upper portion being arranged between the first pad connection portion and the second pad connection portion,
wherein the lower surface of the upper portion is arranged vertically above the first upper surface of the first pad connection portion; and
wherein the lower surface of the upper portion is arranged vertically above the second upper surface of the second pad connection portion.
2. The system according to claim 1 wherein the upper portion comprises a curved convex construction.
3. The system according to claim 1 wherein:
the lead is configured to reduce stress in a first lead-solder interface arranged between the first pad connection portion of the lead and the pad of the at least one support structure; and
the lead is configured to reduce stress in a second lead-solder interface arranged between the second pad connection portion of the lead and the pad of the at least one electrical component.
4. The system according to claim 1 wherein:
the lead includes a first connection portion that connects between the first pad connection portion and the upper portion; and
the lead includes a second connection portion that connects between the second pad connection portion and the upper portion,
wherein portions of the first connection portion are arranged vertically above the first upper surface of the first pad connection portion; and
wherein portions of the second connection portion are arranged vertically above the second upper surface of the second pad connection portion.
5. The system according to claim 1 wherein
the lead includes a first connection portion that connects between the first pad connection portion and the upper portion; and
the lead includes a second connection portion that connects between the second pad connection portion and the upper portion,
wherein the first connection portion and the second connection portion each comprise a concave construction.
6. The system according to claim 1 wherein:
the lead includes a first end portion and a second end portion;
the first end portion forming a terminating end of the lead and the second end portion forming another terminating end of the lead; and
a curved distance from the first end portion to the second end portion along the lead is greater than a linear distance from the first end portion to the second end portion.
7. The system according to claim 1 wherein a vertical height of an upper surface of the upper portion is 2 to 20 times greater than a vertical height of the first pad connection portion.
8. The system according to claim 1 wherein the lead is configured to have a cross-sectional area smaller than a cross-sectional area of prior art leads.
9. The system according to claim 1 further comprising:
the at least one support structure; and
an element configured to alleviate signaling degradation through the lead,
wherein the element comprises a metallic construction; and
wherein the element is arranged in one of the following: on the at least one support structure or within the at least one support structure.
10. The system according to claim 9 wherein:
the at least one support structure comprises a zone that includes a limited number of additional features; and
the element is arranged in the zone.
11. The system according to claim 10 wherein:
the at least one support structure comprises a Co-Planar Wave Guide (CPWG) printed circuit board (PCB) having vias; and
the zone that includes the element does not include the vias.
12. The system according to claim 11 further comprising the at least one electrical component,
wherein the electrical component comprises an RF (Radio Frequency) component.