IP Library Granted Patent US 11,664,228
Granted Patent B2
US 11,664,228 · App. 16/627,693 · Granted May 30, 2023

Vacuumizing device and vacuumizing method for bonding substrate

Inventors: Yuangen Yu (Shanghai, CN); Zhijun Huo (Shanghai, CN); Bin Zhao (Shanghai, CN); Hui Fu (Shanghai, CN); Xingxing Wang (Shanghai, CN)
Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
H01L21/187H01L21/67017H01L21/67092H01L21/67155H01L21/67242H01L21/6838H01L21/68785
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Quick Facts
Patent No.
US 11,664,228
App. No.
16/627,693
Granted
May 30, 2023
Kind
B2
Abstract

A vacuumizing device includes a vacuum chamber, a bonding fixture and a vacuumizing system. The bonding fixture is disposed in the vacuum chamber and includes a substrate table provided with a plurality of grooves for retention of the substrate by suction. The vacuumizing system is disposed in communication with both the vacuum chamber and grooves. During vacuumizing by the vacuumizing system, a vacuum value in the grooves is smaller than or equal to a vacuum value in the vacuum chamber. In the vacuumizing device and methods, the vacuumizing system is used to vacuumize the grooves in the substrate table and the vacuum chamber so that the vacuum value in the grooves is always smaller than or equal to that in the vacuum chamber. As a result, the substrates are firmly retained on the substrate table without warping, thereby improving the quality of substrate bonding.

Claims (15)

1. A vacuumizing device, used for providing a vacuum environment for bonding of a substrate, the vacuumizing device comprising a vacuum chamber, a bonding fixture and a vacuumizing system,

wherein the bonding fixture is disposed in the vacuum chamber, the bonding fixture comprising a substrate table provided with a plurality of grooves, which are able to be vacuumized so that the substrate is retained by suction on the substrate table,

wherein the vacuumizing system is configured for vacuumizing of both the vacuum chamber and the plurality of grooves, so that the substrate does not warp during the vacuumizing by the vacuumizing system,

wherein the vacuumizing system comprises a first vacuumizing circuit for vacuumizing the vacuum chamber and a second vacuumizing circuit for vacuumizing the plurality of grooves, the first vacuumizing circuit in communication with the vacuum chamber, the second vacuumizing circuit in communication with the plurality of grooves,

wherein the second vacuumizing circuit comprises a third vacuum pump and a second pressure sensor, the second pressure sensor configured for monitoring the second vacuumizing circuit, the first vacuumizing circuit connected to the second vacuumizing circuit to compensate for working efficiency of the second vacuumizing circuit.

2. The vacuumizing device of claim 1 , wherein during the vacuumizing by the vacuumizing system, a vacuum value in the plurality of grooves is configured to be smaller than or equal to a vacuum value in the vacuum chamber.

3. The vacuumizing device of claim 1 , wherein the first vacuumizing circuit comprises a first pressure sensor, a primary vacuum pipe and a secondary vacuum pipe, the primary vacuum pipe connected in parallel to the secondary vacuum pipe, the first pressure sensor configured to monitor the first vacuumizing circuit and/or the second vacuumizing circuit, the primary vacuum pipe configured for gas-flow evacuation of the vacuum chamber, the secondary vacuum pipe configured for molecular-flow evacuation of the vacuum chamber.

4. The vacuumizing device of claim 3 , wherein the primary vacuum pipe is provided with a first vacuum pump, wherein the primary vacuum pipe has a first end in communication with the vacuum chamber and a second end in communication with the first vacuum pump.

5. The vacuumizing device of claim 4 , wherein the secondary vacuum pipe is provided with a second vacuum pump, the secondary vacuum pipe disposed in series with or in parallel to the first vacuum pump.

6. The vacuumizing device of claim 5 , wherein the second vacuum pump is a molecular pump.

7. The vacuumizing device of claim 4 , wherein the first vacuum pump is a dry pump.

8. The vacuumizing device of claim 3 , wherein the first vacuumizing circuit further comprises a first valve for controlling opening or closing of the primary vacuum pipe and/or the secondary vacuum pipe.

9. The vacuumizing device of claim 1 , wherein the second vacuumizing circuit further comprises a second valve for controlling opening or closing of the second vacuumizing circuit.

10. The vacuumizing device of claim 1 , wherein the third vacuum pump is an air pump.

11. The vacuumizing device of claim 1 , wherein the second vacuumizing circuit further comprises a third valve for controlling connection or disconnection between the first vacuumizing circuit and the second vacuumizing circuit.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2025
From: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
To: AMIES TECHNOLOGY CO., LTD.
Reel/Frame 072912/0466 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2020
From: YU, YUANGEN; HUO, ZHIJUN; ZHAO, BIN; FU, HUI; WANG, XINGXING
To: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Reel/Frame 051422/0949 →
Priority Claims (1)
CN 201710526081.2 · Jun 30, 2017 · national
Continuity (1)
Related Publication 20200168459A1 · May 28, 2020