IP Library Granted Patent US 11,276,359
Granted Patent B2
US 11,276,359 · App. 16/666,672 · Granted Mar 15, 2022

Display device

Inventor: Shunpei Yamazaki (Tokyo, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G09G3/3648G02F1/1368G02F1/13624G02F1/133753G02F1/136213H01L27/1225G02F2202/10G09G2300/0809G09G2310/08H01L27/3209H01L29/045H01L29/7869H01L51/5024H01L51/5278
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Quick Facts
Patent No.
US 11,276,359
App. No.
16/666,672
Granted
Mar 15, 2022
Kind
B2
Abstract

A display panel for displaying an image is provided with a plurality of pixels arranged in a matrix. Each pixel includes one or more units each including a plurality of subunits. Each subunit includes a transistor in which an oxide semiconductor layer which is provided so as to overlap a gate electrode with a gate insulating layer interposed therebetween, a pixel electrode which drives liquid crystal connected to a source or a drain of the transistor, a counter electrode which is provided so as to face the pixel electrode, and a liquid crystal layer provided between the pixel electrode and the counter electrode. In the display panel, a transistor whose off current is lower than 10 zA/μm at room temperature per micrometer of the channel width and off current of the transistor at 85° C. can be lower than 100 zA/μm per micrometer in the channel width.

Claims (28)

1. A semiconductor device comprising:

a pixel portion comprising a transistor; and

a driver circuit electrically connected to the pixel portion,

wherein, in a first mode, a start pulse is supplied to the driver circuit and a power supply voltage is supplied to the driver circuit, so as to display a first image,

wherein, in a second mode, the start pulse supplied to the driver circuit is stopped and the power supply voltage supplied to the driver circuit is lowered, so as to display a second image in which the writing frequency is lower than the first image, and

wherein the transistor comprises a channel formation region comprising an oxide semiconductor.

2. The semiconductor device according to claim 1 , wherein the oxide semiconductor comprises indium, gallium, and zinc.

3. A semiconductor device comprising:

a pixel portion comprising a transistor; and

a driver circuit electrically connected to the pixel portion,

wherein, in a first mode, a start pulse is supplied to the driver circuit, a clock signal is supplied to the driver circuit and a power supply voltage is supplied to the driver circuit, so as to display a first image,

wherein, in a second mode, the start pulse supplied to the driver circuit is stopped, the clock signal supplied to the driver circuit is stopped and the power supply voltage supplied to the driver circuit is lowered, so as to display a second image in which the writing frequency is lower than the first image, and

wherein the transistor comprises a channel formation region comprising an oxide semiconductor.

4. The semiconductor device according to claim 3 , wherein the oxide semiconductor comprises indium, gallium, and zinc.

5. A semiconductor device comprising:

a pixel portion comprising a transistor; and

a driver circuit electrically connected to the pixel portion,

wherein, in a first mode, a start pulse is supplied to the driver circuit and a power supply voltage is supplied to the driver circuit,

wherein, in a second mode, the start pulse supplied to the driver circuit is stopped and the power supply voltage supplied to the driver circuit is lowered, and

wherein the transistor comprises a channel formation region comprising an oxide semiconductor.

6. The semiconductor device according to claim 5 , wherein the oxide semiconductor comprises indium, gallium, and zinc.

7. The semiconductor device according to claim 1 , wherein, in the case where the drain voltage is +1 V or +10 V, the off current of the transistor with the gate voltage within a range of −5 V to −20 V is smaller than or equal to 1×10 −13 A.

8. The semiconductor device according to claim 3 , wherein, in the case where the drain voltage is +1 V or +10 V, the off current of the transistor with the gate voltage within a range of −5 V to −20 V is smaller than or equal to 1×10 −13 A.

9. The semiconductor device according to claim 5 , wherein, in the case where the drain voltage is +1 V or +10 V, the off current of the transistor with the gate voltage within a range of −5 V to −20 V is smaller than or equal to 1×10 −13 A.

10. The semiconductor device according to claim 5 ,

wherein, in the first mode, a clock signal is supplied to the driver circuit, and

wherein, in the second mode, the clock signal supplied to the driver circuit is stopped.

11. The semiconductor device according to claim 10 , wherein, in the case where the drain voltage is +1 V or +10 V, the off current of the transistor with the gate voltage within a range of −5 V to −20 V is smaller than or equal to 1×10 −13 A.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2019
From: YAMAZAKI, SHUNPEI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 050853/0768 →
Priority Claims (1)
JP JP2010-012665 · Jan 24, 2010 · national
Continuity (4)
Continuation 15451541 · Mar 7, 2017
Continuation 14505593 · Oct 3, 2014
Continuation 13011535 · Jan 21, 2011
Related Publication 20200066223A1 · Feb 27, 2020