Method of concurrent multi-state programming of non-volatile memory with bit line voltage step up
A method of concurrently programming a memory. Various methods include: applying a non-negative voltage on a first bit line coupled to a first memory cell; applying a negative voltage on a second bit line coupled to a second memory cell, where the negative voltage is generated using triple-well technology; then applying a programming pulse to the first and second memory cells concurrently; and in response, programming the first and second memory cells to different states. The methods also include applying a quick pass write operation to the first and second memory cells, by: applying a quick pass write voltage to the first bit line coupled to the first memory cell, where the quick pass write voltage is higher than the non-negative voltage; applying a negative quick pass write voltage to the second bit line coupled to the first memory cell, where the negative quick pass write voltage is generated using triple-well technology.
1. A method of concurrently programming a memory, comprising:
applying a non-negative voltage on a first bit line coupled to first memory cell;
applying a negative voltage on a second bit line coupled to the second memory cell, wherein the negative voltage is generated using triple-well technology; then
applying a programming pulse to the first and second memory cells concurrently and over a duration of time and wherein the negative voltage is applied to the second bit line during the duration of time and the non-negative voltage is applied to the first bit line during the duration of time; and in response,
programming the first and second memory cells to different states.
2. The method of claim 1 , wherein the non-negative voltage is provided by a ground pin of a positive supply voltage.
3. The method of claim 1 , further comprising:
applying a quick pass write operation to the first and second memory cells, by:
applying a quick pass write voltage to the first bit line coupled to the first memory cell, wherein the quick pass write voltage is higher than the non-negative voltage;
applying a negative quick pass write voltage to the second bit line coupled to the first memory cell, wherein the negative quick pass write voltage is between the negative voltage and the non-negative voltage, and wherein the negative quick pass write voltage is generated using triple-well technology.
4. The method of claim 1 , further comprising:
applying a quick pass write operation to the first and second memory cells during a second duration of time by:
applying a quick pass write voltage to the first bit line coupled to the first memory cell, wherein the quick pass write voltage is higher than the non-negative voltage;
applying a negative quick pass write voltage to the second bit line coupled to the first memory cell, wherein the negative quick pass write voltage is between the negative voltage and the non-negative voltage, and wherein the negative quick pass write voltage is generated using triple-well technology.
5. The method of claim 1 , wherein the memory stores states that correspond to negative threshold voltages and additional states that correspond to positive voltages.
6. The method of claim 1 , wherein two or more memory cells are programmed concurrently.
7. A memory controller, comprising:
a first terminal coupled to a memory array;
the memory controller configured to:
apply a non-negative voltage on a first bit line coupled to a first memory cell in the memory array;
apply a negative voltage on a second bit line coupled to a second memory cell in the memory array;
apply a programming pulse to the first and second memory cells concurrently over a duration of time and wherein the negative voltage is applied to the second bit line during the duration of time and the non-negative voltage is applied to the first bit line during the duration of time; and in response,
program the first and second memory cells to different states.
8. The memory controller of claim 7 , wherein the non-negative voltage is provided by a ground pin of a positive supply voltage.
9. The memory controller of claim 7 , wherein the memory controller is further configured to:
apply a quick pass write operation to the first and second memory cells during a second duration of time, wherein the memory controller is further configured to:
apply a quick pass write voltage to the first bit line coupled to the first memory cell, wherein the quick pass write voltage is higher than the non-negative voltage;
apply a negative quick pass write voltage to the second bit line coupled to the first memory cell, wherein the negative quick pass write voltage is between the negative voltage and the non-negative voltage, and wherein the negative quick pass write voltage is generated using triple-well technology.
10. The memory controller of claim 7 , wherein the memory array stores states that correspond to negative threshold voltages and additional states that correspond to positive voltages.
11. The memory controller of claim 7 , wherein two or more memory cells are programmed concurrently.
12. A non-volatile storage system, configured to concurrently program memory cells, comprising:
a memory array including a first and second memory cells;
a controller coupled to the memory array, wherein the controller is configured to:
apply a non-negative voltage on a first bit line coupled to a first memory cell;
apply a negative voltage on a second bit line coupled to the second memory cell, wherein the negative voltage is generated using triple-well technology; then
apply a programming pulse to the first and second memory cells concurrently over a duration of time, wherein the negative voltage is applied to the second bit line during the duration of time and the non-negative voltage is applied to the first bit line during the duration of time; and in response,
program the first and second memory cells to different states.
13. The non-volatile storage system of claim 12 , wherein the non-negative voltage is provided by a ground pin of a positive supply voltage.
14. The non-volatile storage system of claim 12 , wherein the controller is further configured to:
apply a quick pass write operation to the first and second memory cells, wherein the controller is further configured to:
apply a quick pass write voltage to the first bit line coupled to the first memory cell, wherein the quick pass write voltage is higher than the non-negative voltage;
apply a negative quick pass write voltage to the second bit line coupled to the first memory cell, wherein the negative quick pass write voltage is between the negative voltage and the non-negative voltage, and wherein the negative quick pass write voltage is generated using triple-well technology.
15. The non-volatile storage system of claim 12 , wherein the controller is further configured to:
apply a quick pass write operation to the first and second memory cells during a second duration of time, wherein the controller is further configured to:
apply a quick pass write voltage to the first bit line coupled to the first memory cell, wherein the quick pass write voltage is higher than the non-negative voltage;
apply a negative quick pass write voltage to the second bit line coupled to the first memory cell, wherein the negative quick pass write voltage is between the negative voltage and the non-negative voltage, and wherein the negative quick pass write voltage is generated using triple-well technology.
16. The non-volatile storage system of claim 12 , wherein the memory array stores states that correspond to negative threshold voltages and additional states that correspond to positive voltages.
17. The non-volatile storage system of claim 12 , wherein two or more memory cells are programmed concurrently.