IP Library Granted Patent US 11,636,322
Granted Patent B2
US 11,636,322 · App. 16/829,757 · Granted Apr 25, 2023

Precise data tuning method and apparatus for analog neural memory in an artificial neural network

Inventors: Hieu Van Tran (San Jose, CA); Steven Lemke (Boulder Creek, CA); Vipin Tiwari (Dublin, CA); Nhan Do (Saratoga, CA); Mark Reiten (Alamo, CA)
Assignee: SILICON STORAGE TECHNOLOGY, INC.
G06N3/0635G06F1/03G06F7/78G06F11/1666G06F17/16G11C11/54G11C11/5635G11C13/0021G11C29/44
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Quick Facts
Patent No.
US 11,636,322
App. No.
16/829,757
Granted
Apr 25, 2023
Kind
B2
Abstract

Numerous embodiments of a precision programming algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.

Claims (27)

1. A method of tuning a differential pair of selected non-volatile memory cells in a vector-by-matrix multiplication array of non-volatile memory cells, the method comprising:

(i) setting a first initial current target for a first selected non-volatile memory cell to store a w+ value and a second initial current target for a second selected non-volatile memory cell to store a w− value;

(ii) performing a soft erase on all non-volatile memory cells in the vector-by-matrix multiplication array;

(iii) performing a coarse programming operation on the first selected memory cell and the second selected memory cell;

(iv) performing a fine programming operation on the first selected memory cell and the second selected memory cell;

(v) performing a read operation on the first selected memory cell and the second selected memory cell and determining a combined weight w drawn by the first selected memory cell and the second selected memory cell during the read operation according to a formula w=(w+)−(w−);

(vi) calculating an output error based on a difference between w and a difference between the first initial current target and the second initial current target; and

repeating steps (i), (ii), (iii), (iv), (v), and (vi) until the output error is less than a predetermined threshold.

2. The method of claim 1 , wherein the first initial current target and the second initial current target are derived using a mathematical function.

3. The method of claim 1 , wherein the first initial current target and the second initial current target are derived from a look-up table.

4. A method of tuning a differential pair of selected non-volatile memory cells in a vector-by-matrix multiplication array of non-volatile memory cells, the method comprising:

(i) setting a first initial target for a first selected non-volatile memory cell to store a w+ value and a second initial target for a second selected non-volatile memory cell to store a w− value;

(ii) performing a programming operation on the first selected memory cell and the second selected memory cell;

(iii) performing a read operation on the first selected memory cell and the second selected memory cell and determining a combined weight w drawn by the first selected memory cell and the second selected memory cell during the read operation according to a formula w=(w+)−(w−);

(iv) calculating an output error based on a difference between w and a difference between the first initial target and the second initial target; and

(v) repeating steps (i), (ii), (iii), and (iv) until the output error is less than a predetermined threshold.

5. The method of claim 4 , further comprising: reading a current drawn by the first selected non-volatile memory cell and a current drawn by the second selected non-volatile memory cell.

6. The method of claim 4 , further comprising: performing a soft erase operation.

7. The method of claim 4 , further comprising: performing a coarse programming-verify cycle on the first selected non-volatile memory cell and the second selected non-volatile memory cell.

8. The method of claim 4 , further comprising: performing a fine programming-verify cycle on the first selected non-volatile memory cell and the second selected non-volatile memory cell.

9. The method of claim 4 , wherein the first selected non-volatile memory cell and the second selected non-volatile memory cell are programmed using Fowler-Nordheim tunneling.

10. The method of claim 4 , wherein the first selected non-volatile memory cell and the selected non-volatile memory cell are programmed using source side injection.

11. The method of claim 4 , further comprising:

performing a sector erase; and

performing steps (i), (ii), (iii), and (iv) for the sector.

12. The method of claim 4 , wherein the programming operation for the first selected non-volatile memory cell or the second selected non-volatile memory cell overshoots the first initial target or the second initial target respectively and a new target is calculated based on the overshoot.

13. The method of claim 4 , wherein the programming operation of the first selected non-volatile memory cell or the second selected non-volatile memory cell undershoots the first initial target or the second initial target respectively and a new target is calculated based on the undershoot.

Assignments (11)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2020
From: TRAN, HIEU VAN; LEMKE, STEVEN; TIWARI, VIPIN; DO, NHAN; REITEN, MARK
To: SILICON STORAGE TECHNOLOGY, INC.
Reel/Frame 052226/0534 →
Cited By (1)
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