Dynamic ZNS open zone active limit
A storage device includes a controller that can dynamically adjust the zone active limit (ZAL) for a zoned namespace (ZNS). Rather than assuming a worst-case scenario for the ZNS, the ZAL can be dynamically adjusted, even after providing the ZAL to a host device. In so doing, device behavior changes due to factors such as temperature, failed or flipped bit count, and device cycling can be considered as impacting the ZAL. The ZAL can then be adjusted over time, and the new ZAL can be communicated to the host device. As such, rather than a fixed, worst-case ZAL, the host device will receive updated ZAL values over time as the device performs.
1. A data storage device, comprising:
a memory device; and
a controller supporting at least one zoned namespace (ZNS) coupled to the memory device, wherein the controller is configured to:
receive a request from a host device to open a new zone;
deliver an initial zone active limit (ZAL) value for the ZNS to the host device, wherein a ZAL value corresponds to a maximum time that an open zone can be open for, wherein the open zone is closed upon reaching the maximum time, wherein the ZAL value corresponds to a current cycling condition of the open zone and a time that the open zone has been open for, and wherein the current cycling condition corresponds to a number of write/erase cycles of the open zone;
change, based on the current cycling condition, the initial ZAL value for the ZNS to a new ZAL value for the ZNS; and
communicate the new ZAL value for the ZNS to the host device.
2. The data storage device of claim 1 , wherein the controller is further configured to calculate the new ZAL value for the ZNS.
3. The data storage device of claim 2 , wherein the new ZAL value is based upon a change in a temperature of the data storage device.
4. The data storage device of claim 2 , wherein the new ZAL value is based upon a change in flipped bit count for the data storage device.
5. The data storage device of claim 1 , wherein the initial ZAL value is based on a cycling level of blocks that are in the open zone.
6. The data storage device of claim 5 , wherein the cycling level of the blocks remains the same while the zone is open.
7. The data storage device of claim 1 , wherein the new ZAL value is less than the initial ZAL value.
8. A data storage device, comprising:
a memory device; and
a controller coupled to the memory device, wherein the controller is configured to:
provide an initial zone active limit (ZAL) value for a zoned namespace (ZNS) to a host device, wherein a ZAL value corresponds to a maximum time that an open zone can be open for, wherein the open zone is closed upon reaching the maximum time, wherein the ZAL value corresponds to a current cycling condition of the open zone and a time that the open zone has been open for, and wherein the current cycling condition corresponds to a number of write/erase cycles of the open zone;
analyze a block of the ZNS;
determine conditions in which the block operates;
calculate, based on the current cycling condition, a new ZAL value for the ZNS; and
communicate the new ZAL value for the ZNS to the host device.
9. The data storage device of claim 8 , wherein communicating the new ZAL value comprises directing the host device to a zone information log page.
10. The data storage device of claim 9 , wherein the controller is further configured to update parameters of the zone information log page.
11. The data storage device of claim 8 , wherein the controller is further configured to change a zone finish recommendation (ZFR) flag.
12. The data storage device of claim 8 , wherein the controller is further configured to increase a retention level.
13. The data storage device of claim 12 , wherein the controller increases the retention level after communicating the new ZAL value for the ZNS to the host device.
14. The data storage device of claim 8 , wherein the controller is further configured to measure a temperature of the data storage device.
15. A data storage device, comprising:
a memory device;
a controller coupled to the memory device; and
means to dynamically change, based on a current cycling condition, an initial zone active limit (ZAL) value to a new ZAL value while a zoned namespace (ZNS) is open, wherein a ZAL value corresponds to a maximum time that an open zone can be open for, wherein the open zone is closed upon reaching the maximum time, wherein the ZAL value corresponds to the current cycling condition of the open zone and a time that the open zone has been open for, and wherein the current cycling condition corresponds to a number of write/erase cycles of the open zone.
16. The data storage device of claim 15 , further comprising means to update a host device based with the new ZAL value.
17. The data storage device of claim 15 , further comprising means to check for a temperature change of the data storage device.
18. The data storage device of claim 15 , further comprising means to check a flipped or failed bit count (FBC).
19. The data storage device of claim 18 , further comprising means to compare the checked FBC to an expected FBC.
20. The data storage device of claim 19 , further comprising means to choose a maximal RT_Level value that fulfills an FBC requirement at end-of-life of the data storage device.