Read threshold calibration using multiple decoders
A memory controller includes, in one embodiment, a memory interface, a plurality of decoders, and a controller circuit. The memory interface is configured to interface with a memory having a plurality of wordlines. Each decoder of the plurality of decoders is configured to determine a bit error rate (BER). The controller circuit configured to generate a plurality of bit-error-rate estimation scan (BES) hypotheses for one wordline of the plurality of wordlines, divide the plurality of BES hypotheses among the plurality of decoders, receive BER results from the plurality of decoders based on the plurality of BES hypotheses, and adjust one or more read locations of the one wordline based on the BER results from the plurality of decoders.
1. A memory controller, comprising:
a memory interface configured to interface with a memory having a plurality of wordlines;
a plurality of decoders, each decoder of the plurality of decoders is configured to determine a bit error rate (BER), such that the plurality of decoders determine a plurality of BERs; and
a controller circuit configured to:
generate a plurality of bit-error-rate estimation scan (BES) hypotheses for one wordline of the plurality of wordlines,
divide the plurality of BES hypotheses among the plurality of decoders,
receive the plurality of BERs from the plurality of decoders based on the plurality of BES hypotheses, and
adjust one or more read locations of the one wordline based on the plurality of BERs from the plurality of decoders.
2. The memory controller of claim 1 , wherein the controller circuit is further configured to
perform a read operation on the one wordline of the plurality of wordlines at a second one or more read locations, and
detect an ECC failure while performing the read operation on the one wordline of the plurality of wordlines at the second one or more read locations, and
generate the plurality of BES hypotheses for the one wordline of the plurality of wordlines in response to detecting the ECC failure,
wherein the second one or more read locations are different than the one or more read locations.
3. The memory controller of claim 1 , wherein the controller circuit is further configured to perform a read operation on the one wordline at the one or more read locations that are adjusted.
4. The memory controller of claim 1 , wherein, to divide the plurality of BES hypotheses among the plurality of decoders, the controller circuit is further configured to divide the plurality of BES hypotheses to keep the plurality of decoders in respective active states over a common timeframe.
5. The memory controller of claim 4 , wherein, to divide the plurality of BES hypotheses among the plurality of decoders, the controller circuit is further configured to divide the plurality of BES hypotheses to control the plurality of decoders to output respective BER results at a similar point in time.
6. The memory controller of claim 1 , wherein the one wordline includes a plurality of frame memory units (FMUs), and wherein, to generate the plurality of BES hypotheses for the one wordline of the plurality of wordlines, the controller circuit is further configured to generate the plurality of BES hypotheses for each FMU of the plurality of frame memory units (FMUs).
7. The memory controller of claim 1 , wherein, to determine the BER, the each decoder of the plurality of decoders is configured to determine the BER by performing at least one of:
calculating the BER exactly by decoding data that is read from the one wordline and counting bit flips, or
calculating a syndrome weight (SW) of the one wordline that approximates the BER,
wherein the plurality of BERs include at least one of an exact BER or the SW.
8. The memory controller of claim 1 , wherein the controller circuit is further configured to generate an aggregated result by aggregating the plurality of BERs from the plurality of decoders, and wherein, to adjust the one or more read locations based on the plurality of BERs from the plurality of decoders, the controller circuit is further configured adjust the one or more read locations based on the aggregated result.
9. A method, comprising:
generating, with a controller circuit, a plurality of bit-error-rate estimation scan (BES) hypotheses for one wordline of a plurality of wordlines;
dividing, with the controller circuit, the plurality of BES hypotheses among a plurality of decoders;
receiving, with the controller circuit, a plurality of bit error rates (BERs) from the plurality of decoders based on the plurality of BES hypotheses; and
adjusting, with the controller circuit, one or more read locations of the one wordline based on the plurality of BERs from the plurality of decoders.
10. The method of claim 9 , further comprising:
performing, with the controller circuit, a read operation on the one wordline of the plurality of wordlines with at a second one or more read locations;
detecting, with the controller circuit, an ECC failure while performing the read operation on the one wordline of the plurality of wordlines at the second one or more read locations; and
generating, with the controller circuit, the plurality of bit-error-rate estimation scan (BES) hypotheses for the one wordline of the plurality of wordlines in response to detecting the ECC failure,
wherein the second one or more read locations are different than the one or more read locations.
11. The method of claim 9 , further comprising:
performing, with the controller circuit, a second read operation on the one wordline at the one or more read locations that are adjusted.
12. The method of claim 9 , wherein dividing the plurality of BES hypotheses among the plurality of decoders further includes dividing the plurality of BES hypotheses to keep the plurality of decoders in respective active states over a common timeframe.
13. The method of claim 12 , wherein dividing the plurality of BES hypotheses among the plurality of decoders further includes dividing the plurality of BES hypotheses to control the plurality of decoders to output respective ones of the plurality of BERs at a similar point in time.
14. The method of claim 9 , wherein the one wordline includes a plurality of frame memory units (FMUs), and wherein generating the plurality of BES hypotheses for the one wordline of the plurality of wordlines further includes generating the plurality of BES hypotheses for each FMU of the plurality of frame memory units (FMUs).
15. The method of claim 9 , further comprising:
determining, with each decoder of the plurality of decoders, a bit error rate (BER) by performing at least one of:
calculating the BER exactly by decoding data that is read from the one wordline and counting bit flips, or
calculating a syndrome weight (SW) of the one wordline that approximates the BER,
wherein the plurality of BERs include at least one of an exact BER or the SW.
16. The method of claim 9 , further comprising:
generating, with the controller circuit, an aggregated result by aggregating the plurality of BERs from the plurality of decoders, and
wherein adjusting the one or more read locations based on the plurality of BERs from the plurality of decoders further includes adjusting the one or more read locations based on the aggregated result.
17. An apparatus, comprising:
means for generating a plurality of bit-error-rate estimation scan (BES) hypotheses for one wordline of a plurality of wordlines;
means for dividing the plurality of BES hypotheses among a plurality of decoders;
means for receiving a plurality of bit error rates (BERs) from the plurality of decoders based on the plurality of BES hypotheses; and
means for adjusting one or more read locations based on the plurality of BERs from the plurality of decoders.
18. The apparatus of claim 17 , further comprising:
means for performing a read operation on the one wordline of the plurality of wordlines with the one or more read locations; and
means for detecting an ECC failure while performing the read operation on the one wordline of the plurality of wordlines with the one or more read locations,
wherein generating the plurality of bit-error-rate estimation scan (BES) hypotheses for the one wordline of the plurality of wordlines is in response to detecting the ECC failure.
19. The apparatus of claim 17 , further comprising:
means for performing a second read operation on the one wordline at the one or more read locations that are adjusted.
20. The apparatus of claim 17 , wherein the one wordline includes a plurality of frame memory units (FMUs), and wherein the means for generating the plurality of BES hypotheses for the one wordline of the plurality of wordlines further includes means for generating the plurality of BES hypotheses for each FMU of the plurality of frame memory units (FMUs).