Transversely-excited film bulk acoustic resonator and filter with a uniform-thickness dielectric overlayer
Acoustic filters, resonators and methods are disclosed. An acoustic filter device includes a substrate having a surface and a single-crystal piezoelectric plate having front and back surfaces and a thickness ts, the back surface attached to the surface of the substrate except for portions of the piezoelectric plate forming a plurality of diaphragms that span respective cavities in the substrate. A conductor pattern is formed on the front surface of the piezoelectric plate, the conductor pattern comprising a plurality of interdigital transducers (IDTs) of a plurality of acoustic resonators, interleaved fingers of each IDT of the plurality of IDTs disposed on a respective diaphragm of the plurality of diaphragms. Zero or more dielectric layers are deposited over all of the IDTs and the diaphragms, wherein a total thickness of the zero or more dielectric layers is the same for all of the plurality of acoustic resonators.
1. An acoustic filter device comprising:
a substrate having a surface;
a lithium niobate piezoelectric plate having front and back surfaces and a thickness ts, the back surface attached to the surface of the substrate except for portions of the lithium niobate piezoelectric plate forming a plurality of diaphragms that span respective cavities in the substrate;
a conductor pattern formed on the front surface of the lithium niobate piezoelectric plate, the conductor pattern comprising a plurality of interdigital transducers (IDTs) of a plurality of acoustic resonators, interleaved fingers of each IDT of the plurality of IDTs disposed on a respective diaphragm of the plurality of diaphragms; and
one or more dielectric layers deposited over all of the plurality of IDTs and the plurality of diaphragms, wherein a total deposited thickness of the one or more dielectric layers is the same for all of the plurality of acoustic resonators, wherein
the interleaved fingers of all of the plurality of IDTs are aluminum with a common thickness tm, where 0.12 ts<tm<0.32 ts, and
each IDT of the plurality of IDTs has a respective pitch p within one of following ranges: 2.8 ts to 4.0 ts, 5.0 ts to 7.2 ts, and 8.2 ts to 10.6 ts.
2. The device of claim 1 , wherein
the one or more dielectric layers comprises a passivation/tuning layer.
3. The device of claim 1 , wherein
the one or more dielectric layers consists of a passivation/tuning layer.
4. The device of claim 1 , wherein, for each IDT of the plurality of IDTs:
tm/ts and p/ts define a point within one of the unshaded areas defined in FIG. 7 .
5. The device of claim 1 , wherein the lithium niobate piezoelectric plate and the plurality of IDTs are configured such that respective radio frequency signals applied to the plurality of IDTs excite respective shear primary acoustic modes within the respective diaphragms.
6. The device of claim 1 , wherein each diaphragm of the plurality of diaphragms is contiguous with the lithium niobate piezoelectric plate around at least 50% of a perimeter of the respective cavity.
7. A method of fabricating an acoustic filter device, comprising:
bonding a back surface of a lithium niobate piezoelectric plate to a surface of a substrate, portions of the lithium niobate piezoelectric plate forming a plurality of diaphragms that span respective cavities in the substrate;
forming a conductor pattern on a front surface of the lithium niobate piezoelectric plate, the conductor pattern comprising a plurality of interdigital transducers (IDTs) of a plurality of acoustic resonators, interleaved fingers of each IDT of the plurality of IDTs disposed on a respective diaphragm of the plurality of diaphragms; and
depositing one or more dielectric layers over all of the plurality of IDTs and the plurality of diaphragms, wherein a total deposited thickness of the one or more dielectric layers is the same for all of the plurality of acoustic resonators, wherein
the interleaved fingers of all of the plurality of IDTs are aluminum with a common thickness tm, where 0.12 ts<tm<0.32 ts, and
each IDT of the plurality of IDTs has a respective pitch p within one of following ranges: 2.8 ts to 4.0 ts, 5.0 ts to 7.2 ts, and 8.2 ts to 10.6 ts.
8. The method of claim 7 , wherein
depositing the one or more dielectric layers comprises depositing a passivation/tuning layer.
9. The method of claim 7 , wherein
depositing the one or more dielectric layers consists of a depositing a passivation/tuning layer.
10. The method of claim 7 , wherein, for each IDT of the plurality of IDTs:
tm/ts and p/ts define a point within one of the unshaded areas defined in FIG. 7 .
11. The method of claim 7 , wherein the lithium niobate piezoelectric plate and the plurality of IDTs are configured such that respective radio frequency signals applied to the IDTs excite respective shear primary acoustic modes within the respective diaphragms.
12. The method of claim 7 , wherein each diaphragm of the plurality of diaphragms is contiguous with the piezoelectric plate around at least 50% of a perimeter of the respective cavity.
13. An acoustic resonator device comprising:
a substrate having a surface;
a lithium niobate piezoelectric plate having front and back surfaces and a thickness ts, the back surface attached to the surface of the substrate except for a portion of the lithium niobate piezoelectric plate forming a diaphragm that spans a cavity in the substrate; and
an interdigital transducer (IDT) formed on the front surface of the lithium niobate piezoelectric plate with interleaved fingers of the IDT disposed on the diaphragm, wherein
the interleaved fingers are aluminum with a thickness tm, where 0.12 ts≤tm≤0.32 ts, and
a pitch p of the interleaved fingers falls within one of the following ranges: 2.8 ts to 4.0 ts, 5.0 ts to 7.2 ts, and 8.2 ts to 10.6 ts.
14. The device of claim 13 , wherein the single crystal piezoelectric plate and the IDT are configured such that a radio frequency signal applied to the IDT excites a shear primary acoustic mode within the diaphragm.
15. The device of claim 13 , wherein the diaphragm is contiguous with the piezoelectric plate around at least 50% of a perimeter of the cavity.
16. The device of claim 13 , wherein
tm/ts and p/ts define a point within one of the unshaded areas defined in FIG. 7 .
17. The device of claim 13 , further comprising a dielectric passivation/tuning layer deposited over the IDT and the front side of the piezoelectric plate.