Lithographic apparatus and device manufacturing method involving a heater
A lithographic apparatus is described having a liquid supply system configured to at least partly fill a space between a projection system of the lithographic apparatus and a substrate with liquid, a barrier member arranged to substantially contain the liquid within the space, and a heater.
1. A substrate stage component for a lithographic apparatus configured to project radiation onto a radiation-sensitive substrate, the substrate stage component comprising:
a movable support body configured to support the substrate in the lithographic apparatus, the support body comprising a plurality of protrusions to support the substrate; and
a heater configured to heat at least a portion of the substrate and/or substrate stage component, at least part of the heater located on an external surface of the support body, the at least part comprising a portion of a heat emitting element of the heater.
2. The component of claim 1 , further comprising a fluid-carrying channel configured to flow a fluid through at least part of the support body to enable heat transfer between the fluid and the at least part of the support body and/or the substrate, a first port configured to connect to piping to allow the fluid into the fluid-carrying channel, and a second port separate from the first port and configured to connect to piping to allow the fluid to flow out of the fluid-carrying channel.
3. The component of claim 2 , wherein at least part of the channel forms an essentially circular channel portion along a peripheral edge of the support body.
4. The component of claim 1 , further comprising a control program configured to control the heater based on a position of the support body, or a velocity of the support body, or an acceleration of the support body, or at least part of a predetermined path of the support body, or a local substrate temperature, or a local support body temperature, or any combination selected therefrom.
5. The component of claim 1 , further comprising an array of temperature sensors configured to measure a temperature of at least a portion of the substrate and/or substrate stage component.
6. A lithographic apparatus comprising:
a projection system configured to project a patterned radiation beam onto a substrate;
a liquid supply system configured to at least partly fill a space between the projection system and the substrate with liquid; and
the component of claim 1 .
7. The component of claim 1 , wherein the heater comprises a plurality of heating elements, the heating elements being individually controllable.
8. A substrate stage component for a lithographic apparatus configured to project radiation onto a radiation-sensitive substrate, the substrate stage component comprising:
a movable support body configured to support the substrate in the lithographic apparatus, the support body comprising a plurality of protrusions to support the substrate;
a fluid-carrying channel configured to flow a fluid through at least part of the movable support body to enable heat transfer between the fluid and the at least part of the support body and/or the substrate;
a first port configured to connect to piping to allow the fluid into the fluid-carrying channel, and a second port separate from the first port and configured to connect to piping to allow the fluid to flow out of the fluid-carrying channel; and
an electric heater attached to the movable support body and configured to locally heat at least a portion of the substrate and/or substrate stage component.
9. The component of claim 8 , wherein at least part of the heater is located on an external surface of the support body.
10. The component of claim 8 , wherein at least part of the channel forms an essentially circular channel portion along a peripheral edge of the support body.
11. The component of claim 8 , further comprising a control program configured to control the heater based on a position of the support body, or a velocity of the support body, or an acceleration of the support body, or at least part of a predetermined path of the support body, or a local substrate temperature, or a local support body temperature, or any combination selected therefrom.
12. The component of claim 8 , further comprising an array of temperature sensors configured to measure a temperature of at least a portion of the substrate and/or substrate stage component.
13. A lithographic apparatus comprising:
a projection system configured to project a patterned radiation beam onto a substrate;
a liquid supply system configured to at least partly fill a space between the projection system and the substrate with liquid; and
the component of claim 8 .
14. The component of claim 8 , wherein the heater comprises a plurality of heating elements, the heating elements being individually controllable.
15. A substrate stage component for a lithographic apparatus configured to project radiation onto a radiation-sensitive substrate, the substrate stage component comprising:
a movable support body configured to support the substrate in the lithographic apparatus, the support body comprising a plurality of protrusions to support the substrate; and
a fluid-carrying channel configured to flow a fluid through at least part of the support body to enable heat transfer between the fluid and the at least part of the support body and/or the substrate; and
a heater configured to heat at least a portion of the substrate and/or substrate stage component, at least a portion of a heat emitting element of the heater located lower than a top of the fluid-carrying channel.
16. The component of claim 15 , wherein the heater comprises a plurality of heat emitting elements, the heat emitting elements being individually controllable.
17. The component of claim 15 , wherein at least part of the channel forms an essentially circular channel portion along a peripheral edge of the support body.
18. The component of claim 15 , further comprising a control program configured to control the heater based on a position of the support body, or a velocity of the support body, or an acceleration of the support body, or at least part of a predetermined path of the support body, or a local substrate temperature, or a local support body temperature, or any combination selected therefrom.
19. The component of claim 15 , further comprising an array of temperature sensors configured to measure a temperature of at least a portion of the substrate and/or substrate stage component.
20. A lithographic apparatus comprising:
a projection system configured to project a patterned radiation beam onto a substrate;
a liquid supply system configured to at least partly fill a space between the projection system and the substrate with liquid; and
the component of claim 15 .