Integrated circuit bond pad with multi-material toothed structure
An integrated circuit device may include a multi-material toothed bond pad including (a) an array of vertically-extending teeth formed from a first material, e.g., aluminum, and (b) a fill material, e.g., silver, at least partially filling voids between the array of teeth. The teeth may be formed by depositing and etching aluminum or other suitable material, and the fill material may be deposited over the array of teeth and extending down into the voids between the teeth, and etched to expose top surfaces of the teeth. The array of teeth may collectively define an abrasive structure. The multi-material toothed bond pad may be bonded to another bond pad, e.g., using an ultrasonic or thermosonic bonding process, during which the abrasive teeth may abrade, break, or remove unwanted native oxide layers formed on the respective bond pad surfaces, to thereby create a direct and/or eutectic bonding between the bond pads.
1. An integrated circuit (IC) device, comprising:
metal circuitry; and
a multi-material toothed bond pad connected to the metal circuitry, the multi-material toothed bond pad comprising:
a plurality of vertically-extending teeth formed from a first material, wherein an oxide layer is formed on respective ones of the vertically-extending teeth; and
a conductive fill material located between the plurality of vertically-extending teeth, wherein the conductive fill material is softer than the first material;
wherein the plurality of vertically-extending teeth define an abrasive structure to facilitate a bonding of another structure to the multi-material toothed bond pad.
2. The IC device of claim 1 , wherein the IC device comprises an interposer.
3. The IC device of claim 1 , wherein the IC device comprises an IC die.
4. The IC device of claim 1 , wherein the oxide layer formed on respective vertically-extending teeth defines the abrasive structure.
5. The IC device of claim 1 , wherein the first material comprises aluminum, and the conductive fill material comprises silver.
6. The IC device of claim 1 , wherein the first material comprises silicon.
7. The IC device of claim 1 , wherein respective ones of the plurality of vertically-extending teeth have a height-to-width ratio of at least 2.
8. The IC device of claim 1 , wherein respective ones of the plurality of vertically-extending teeth have a height-to-width ratio in the range of 3 to 5.
9. The IC device of claim 1 , wherein respective ones of the plurality of vertically-extending teeth tooth include silicon nodules at an exposed surface of the vertically-extending tooth.
10. The IC device of claim 1 , wherein the respective ones of the vertically-extending teeth include (a) respective side surfaces covered by the fill metal and (b) respective upper surfaces uncovered by the fill metal and oxidized with the oxide layer formed on the respective upper surfaces.
11. The IC device of claim 1 , wherein the conductive fill material comprises a metal.
12. The IC device of claim 1 , wherein the first material comprises a first metal, and the conductive fill material comprises a second metal softer than the first metal.
13. The IC device of claim 1 , wherein the first material comprises silicon, and the conductive fill material comprises a metal softer than silicon.
14. The IC device of claim 1 , wherein respective top surfaces of the plurality of vertically-extending teeth are uncovered by the conductive fill material.
15. An integrated circuit (IC) device, comprising:
metal circuitry; and
a multi-material toothed bond pad connected to the metal circuitry, the multi-material toothed bond pad comprising:
a plurality of vertically-extending teeth formed from a first material; and
a fill material located between the plurality of vertically-extending teeth formed from a second material different than the first material;
wherein the plurality of vertically-extending teeth define an abrasive structure to facilitate a bonding of another structure to the multi-material toothed bond pad;
wherein respective ones of the plurality of vertically-extending teeth tooth include silicon nodules at an exposed surface of the vertically-extending tooth.
16. The IC device of claim 15 , wherein the fill material comprises a conductive material softer than the first material.